| Class 850 | SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, E.G., SCANNING PROBE MICROSCOPY [SPM] |
| Click here for a printable version of this file | |
Expand/Contract Processing Please Wait
![[List of Pre Grant Publications for class 850 subclass 1]](../as.gif) | ![[List of Patents for class 850 subclass 1]](../ps.gif) | 1 | SCANNING OR POSITIONING ARRANGEMENTS, I.E., ARRANGEMENTS FOR ACTIVELY CONTROLLING THE MOVEMENT OR POSITION OF THE PROBE (EPO) |
| | 5 | MONITORING THE MOVEMENT OR POSITION OF THE PROBE RESPONSIVE TO INTERACTION WITH THE SAMPLE (EPO) |
| | 8 | AUXILIARY MEANS SERVING TO ASSIST OR IMPROVE THE SCANNING PROBE TECHNIQUES OR APPARATUS, E.G., DISPLAY OR DATA PROCESSING DEVICES (EPO) |
| | 9 |  Non-SPM analyzing devices, e.g., Scanning Electron Microscope [SEM], spectrometer or optical microscope (EPO) |
| | 10 | Display or data processing devices (EPO) |
| | 12 | Means for establishing or regulating a desired environmental condition within a sample chamber (EPO) |
| | 17 | Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g., vibrations or electromagnetic fields (EPO) |
| | 18 | Sample handling device or method(EPO) |
| | 19 | CALIBRATION ASPECT, E.G., CALIBRATION OF PROBES (EPO) |
| | 21 | PARTICULAR TYPE OF SCANNING PROBE MICROSCOPY [SPM] OR MICROSCOPE; ESSENTIAL COMPONENTS THEREOF (EPO) |
| | 22 | Multiple-type SPM, i.e., involving two or more SPM techniques (EPO) |
| | 23 |  Scanning Tunnelling Microscopy [STM] combined with Atomic Force Microscopy [AFM](EPO) |
| | 24 | Scanning Near-field Optical Microscopy [SNOM] combined with Atomic Force Microscopy [AFM] (EPO) |
| | 25 | Magnetic Force Microscopy [MFM] combined with Atomic Force Microscopy [AFM] (EPO) |
| | 26 | Scanning Tunnelling Microscopy [STM] or apparatus therefor, e.g., STM probes (EPO) |
| | 27 | Scanning Tunnelling Spectroscopy [STS] (EPO) |
| | 28 | Scanning tunnelling potentiometry [STP] (EPO) |
| | 29 | Probes, their manufacture, or their related instrumentation, e.g., holders (EPO) |
| | 30 | Scanning Near-Field Optical Microscopy [SNOM] or apparatus therefor, e.g., SNOM probes (EPO) |
| | 31 | Fluorescence (EPO) |
| | 32 | Probes, their manufacture, or their related instrumentation, e.g., holders (EPO) |
| | 33 | Atomic Force Microscopy [AFM] or apparatus therefor, e.g., AFM probes(EPO) |
| | 34 | Friction force microscopy (EPO) |
| | 35 | Adhesion force microscopy (EPO) |
| | 36 | Scanning potential microscopy (EPO) |
| | 37 | AC mode (EPO) |
| | 39 | DC mode (EPO) |
| | 40 | Probes, their manufacture, or their related instrumentation, e.g., holders (EPO) |
| | 43 | Scanning Ion-Conductance Microscopy [SICM] or apparatus therefor, e.g., SICM probes(EPO) |
| | 44 | Scanning Capacitance Microscopy [SCM] or apparatus therefor, e.g., SCM probes (EPO) |
| | 46 | Magnetic Force Microscopy [MFM] or apparatus therefor, e.g., MFM probes (EPO) |
| | 47 | Resonance (EPO) |
| | 48 | Probes, their manufacture, or their related instrumentation, e.g., holders (EPO) |
| | 50 | Scanning Thermal Microscopy [SThM] or apparatus therefor, e.g., SThM probes (EPO) |
| | 51 | Scanning Electro-Chemical Microscopy [SECM] or apparatus therefor, e.g., SECM probes (EPO) |
| | 52 | GENERAL ASPECTS OF SPM PROBES, THEIR MANUFACTURE, OR THEIR RELATED INSTRUMENTATION, INSOFAR AS THEY ARE NOT SPECIALLY ADAPTED TO A SINGLE SPECIFIC SPM TECHNIQUE (EPO) |
| | 53 | Probe holders (EPO) |
| | 55 | Probe tip arrays (EPO) |
| | 56 | Probe characteristics (EPO) |
| | 60 | Probe manufacture (EPO) |
| | 62 | APPLICATIONS OF SCANNING-PROBE TECHNIQUES OTHER THAN SPM (EPO) |
| | 63 | SCANNING-PROBE TECHNIQUES OR APPARATUS NOT OTHERWISE PROVIDED FOR (EPO) |