| Class 324 | ELECTRICITY: MEASURING AND TESTING |
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![[List of Pre Grant Publications for class 324 subclass 300]](../as.gif) | ![[List of Patents for class 324 subclass 300]](../ps.gif) | 300 | PARTICLE PRECESSION RESONANCE |
| | 301 |  Using a magnetometer |
| | 303 | Using well logging device |
| | 304 | Using optical pumping or sensing device |
| | 306 | Determine fluid flow rate |
| | 307 | Using a nuclear resonance spectrometer system |
| | 308 |  Including a test sample and control sample |
| | 309 | To obtain localized resonance within a sample |
| | 310 | By scanning sample frequency spectrum |
| | 311 | With signal decoupling |
| | 312 | By spectrum storage and analysis |
| | 313 | Including polarizing magnetic field/radio frequency tuning |
| | 314 | With conditioning of transmitter signal |
| | 315 | With sample resonant frequency and temperature interdependence |
| | 316 | Using an electron resonance spectrometer system |
| | 318 | Spectrometer components |
| | 323 | OF GEOPHYSICAL SURFACE OR SUBSURFACE IN SITU |
| | 324 | Including borehole fluid investigation |
| | 326 | For small object detection or location |
| | 330 | By aerial survey |
| | 332 | With radiant energy or nonconductive-type transmitter |
| | 344 | With radiant energy or nonconductive-type receiver |
| | 345 | By magnetic means |
| | 347 | Using electrode arrays, circuits, structure, or supports |
| | 348 | For detecting naturally occurring fields, currents, or potentials |
| | 354 | Coupled to artificial current source |
| | 376 | OF SUBSURFACE CORE SAMPLE |
| | 378 | INTERNAL-COMBUSTION ENGINE IGNITION SYSTEM OR DEVICE |
| | 379 | With analysis of displayed waveform |
| | 380 | Electronic ignition system |
| | 383 | By simulating or substituting for a component under test |
| | 384 | Using plural tests in a conventional ignition system |
| | 385 | Distributor |
| | 388 | Coil |
| | 389 | Magneto |
| | 390 | Low or high tension lead |
| | 391 | Ignition timing |
| | 393 | In situ testing of spark plug |
| | 394 | With cathode-ray tube display |
| | 395 | Using an illuminating device to indicate spark plug condition |
| | 396 | With an air gap in series with spark plug to indicate spark plug condition |
| | 397 | By shorting the plug to ground to indicate spark plug condition |
| | 399 | Wherein a measured electric quantity indicates spark plug condition |
| | 400 | Spark plug removed or tested in a test fixture |
| | 402 | Apparatus for coupling a measuring instrument to an ignition system |
| | 403 | ELECTRIC LAMP OR DISCHARGE DEVICE |
| | 404 | Cathode-ray tube |
| | 405 | Vacuum tube |
| | 406 | Plural tubes in the testing circuit |
| | 407 | Testing circuit for diverse-type tube |
| | 408 | Circuit for making diverse test |
| | 409 | Testing discharge space characteristic (e.g., emission) |
| | 413 | Shock testing |
| | 414 | Electric lamp |
| | 415 | ELECTROMECHANICAL SWITCHING DEVICE |
| | 416 | Voltage regulator |
| | 417 | Thermostat switch |
| | 418 | Relay |
| | 419 | Reed switch |
| | 420 | To evaluate contact chatter |
| | 421 | To evaluate contact resistance |
| | 422 | To evaluate contact sequence of operation |
| | 423 | To evaluate contact response time |
| | 424 | Circuit breaker |
| | 425 | ELECTROLYTE PROPERTIES |
| | 426 | Using a battery testing device |
| | 427 | To determine ampere-hour charge capacity |
| | 429 | To determine load/no-load voltage |
| | 430 | To determine internal battery impedance |
| | 431 | With temperature compensation of measured condition |
| | 432 | To determine battery electrolyte condition |
| | 433 | To compare battery voltage with a reference voltage |
| | 434 | To determine plural cell condition |
| | 435 | Having particular meter scale or indicator |
| | 436 | Including oscillator in measurement circuit |
| | 437 | Including probe structure |
| | 438 | Using a pH determining device |
| | 439 | Using a conductivity determining device |
| | 440 | Which includes a dropping mercury cell |
| | 441 | Which includes a temperature responsive element |
| | 442 | Which includes an oscillator |
| | 443 | Having a bridge circuit |
| | 444 | Which includes current and voltage electrodes |
| | 445 | Having inductance probe structure |
| | 446 | Having conductance probe structure |
| | 447 |  With movable or adjustable electrode |
| | 448 | With concentric electrodes |
| | 449 | With axially arranged electrodes |
| | 450 | Which includes particular cell container structure |
| | 451 | A MATERIAL PROPERTY USING THERMOELECTRIC PHENOMENON |
| | 452 | A MATERIAL PROPERTY USING ELECTROSTATIC PHENOMENON |
| | 457 | ELECTROSTATIC FIELD |
| | 459 | USING IONIZATION EFFECTS |
| | 200 | MAGNETIC |
| | 201 | Susceptibility |
| | 202 | Calibration |
| | 203 | Curie point determination |
| | 204 | Fluid material examination |
| | 205 | Permanent magnet testing |
| | 206 | Movable random length material measurement |
| | 207.11 | Displacement |
| | 207.12 | Compensation for measurement |
| | 207.13 | Having particular sensor means |
| | 207.14 | Diverse sensors |
| | 207.15 | Inductive |
| | 207.2 | Hall effect |
| | 207.21 | Magnetoresistive |
| | 207.22 | Having particular sensed object |
| | 207.23 | Plural measurements (e.g., linear and rotary) |
| | 207.24 | Linear |
| | 207.25 | Rotary |
| | 207.26 | Approach or retreat |
| | 209 | Stress in material measurement |
| | 210 | Magnetic information storage element testing |
| | 213 | Magnetic recording medium on magnetized object records object field |
| | 214 | By paramagnetic particles |
| | 217 | Railroad rail flaw testing |
| | 219 | Magnetic sensor within material |
| | 222 | Hysteresis or eddy current loss testing |
| | 223 | Hysteresis loop curve display or recording |
| | 224 | With temperature control of material or element of test circuit |
| | 225 | With compensation for test variable |
| | 226 | Combined |
| | 227 | Plural tests |
| | 228 | With means to create magnetic field to test material |
| | 229 | Thickness measuring |
| | 232 | Plural magnetic fields in material |
| | 233 | With phase sensitive element |
| | 234 | Electrically energized nonforce type sensor |
| | 239 | Induced voltage-type sensor |
| | 244 | Magnetometers |
| | 244.1 | Optical |
| | 245 | Plural sensor axis misalignment correction |
| | 246 | With means to align field sensor with magnetic field sensed |
| | 247 | Nonparallel plural magnetic sensors |
| | 248 | Superconductive magnetometers |
| | 249 | Thin film magnetometers |
| | 250 | Electronic tube or microwave magnetometers |
| | 251 | Hall plate magnetometers |
| | 252 | Semiconductor type solid-state or magnetoresistive magnetometers |
| | 253 | Saturable core magnetometers |
| | 256 | Energized movable sensing coil magnetometers |
| | 257 | Moving coil magnetometer |
| | 258 | Fixed coil magnetometer |
| | 259 | Movable magnet or magnetic member interacts with magnetic field |
| | 260 | Magnetic field detection devices |
| | 262 | Magnetic test structure elements |
| | 263 | Current through test material forms test magnetic field |
| | 500 | FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS |
| | 501 | Using radiant energy |
| | 502 | In an ignitor or detonator |
| | 503 | In vehicle wiring |
| | 506 | Combined with a flashlight |
| | 508 | With electric power receptacle for line wire testing |
| | 509 | Of ground fault indication |
| | 511 | Of electrically operated apparatus (power tool, appliance, machine, etc.) |
| | 512 | For fault location |
| | 513 | Where component moves while under test |
| | 514 | By exposing component to liquid or gas while under test |
| | 515 | Using a particular sensing electrode |
| | 519 | By capacitance measuring |
| | 520 | By frequency sensitive or responsive detection |
| | 521 | By phase sensitive or responsive detection |
| | 522 | By voltage or current measuring |
| | 525 | By resistance or impedance measuring |
| | 527 | By applying a test signal |
| | 534 | By reflection technique |
| | 535 | By time measuring |
| | 536 | By spark or arc discharge |
| | 537 | Of individual circuit component or element |
| | 750.01 | Measurement or control of test condition |
| | 750.14 | Environmental control |
| | 750.15 | With identification on device under test (DUT) |
| | 750.16 | Relative positioning or alignment of device under test and test structure |
| | 750.17 | By capacitive means |
| | 750.18 | By information on device under test |
| | 750.19 | Adjustable support for device under test |
| | 750.22 | Testing device mounted for multi-directional movement |
| | 750.23 | Using optical means |
| | 750.24 | By electrical contact means |
| | 750.25 | By mechanical means |
| | 750.26 | Shielding or casing of device under test or of test structure |
| | 750.3 | Built-in test circuit |
| | 754.01 | Test probe techniques |
| | 754.02 | Hand-held |
| | 754.03 | Contact probe |
| | 754.04 |  Liquid state |
| | 754.05 | Kelvin probe |
| | 754.06 | Waveguide probe |
| | 754.07 | Probe or probe card with build-in circuit element |
| | 754.08 | In or on support for device under test |
| | 754.1 | Probe contact confirmation |
| | 754.11 | Probe contact enhancement or compensation |
| | 754.12 | Biasing means |
| | 754.18 | With interpose |
| | 754.19 | With recording of test result |
| | 754.2 | Penetrative |
| | 754.21 | Non-contact probe |
| | 755.01 | Probe structure |
| | 755.02 | Coaxial |
| | 755.03 | Rigid |
| | 755.04 | Force absorption |
| | 755.07 | Cantilever |
| | 755.08 | Elastomeric |
| | 755.09 | Membrane |
| | 755.1 | Dendritic structure |
| | 755.11 | Elongated pin or probe |
| | 756.01 | Support for device under test or test structure |
| | 756.02 | DUT socket or carrier |
| | 756.03 | Probe card |
| | 756.04 | Pin fixture |
| | 756.05 | With electrical connectors |
| | 756.06 | With impedance matching |
| | 756.07 | Board or plate |
| | 757.01 | Transporting or conveying the device under test to the testing station |
| | 757.02 | Printed circuit board |
| | 757.03 | Wafer |
| | 757.04 | Packaged IC or unpackaged die or dice |
| | 757.05 | Multiple chip module |
| | 758.01 | Cleaning probe or device under test |
| | 759.01 | After-test activity |
| | 760.01 | Test of liquid crystal device |
| | 761.01 | Test of solar cell |
| | 762.01 | Test of semiconductor device |
| | 762.02 | Packaged integrated circuits |
| | 762.03 | Integrated circuit die |
| | 762.05 | Semiconductor wafer |
| | 762.06 | Multiple chip module |
| | 762.07 | Diode |
| | 762.08 | Bipolar transistor |
| | 762.09 | Field effect transistor |
| | 762.1 | With barrier layer |
| | 763.01 | Printed circuit board |
| | 764.01 | Power supply |
| | 765.01 | Motor or generator fault |
| | 538 | Electrical connectors |
| | 539 | Multiconductor cable |
| | 543 | Single conductor cable |
| | 545 | Armature or rotor |
| | 546 | Winding or coil |
| | 548 | Capacitor |
| | 549 | Resistor |
| | 550 | Fuse |
| | 551 | Insulation |
| | 555 | Instruments and devices for fault testing |
| | 557 | FOR INSULATION FAULT OF NONCIRCUIT ELEMENTS |
| | 558 | Where element moves while under test |
| | 559 | Where a moving sensing electrode scans a stationary element under test |
| | 600 | IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS |
| | 601 | Calibration |
| | 602 | With auxiliary means to condition stimulus/response signals |
| | 603 | For excitation |
| | 605 | For response signal evaluation or processing |
| | 606 | Including a signal comparison circuit |
| | 607 | Including a conversion (e.g., A->D or D-> A) process |
| | 608 | Including a ratiometric function |
| | 609 | For sensing |
| | 612 | Parameter related to the reproduction or fidelity of a signal affected by a circuit under test |
| | 613 | Noise |
| | 615 | Transfer function type characteristics |
| | 616 | Gain or attenuation |
| | 617 | Response time or phase delay |
| | 618 | Transient response or transient recovery time (e.g., damping) |
| | 619 | Selective type characteristics |
| | 620 | Distortion |
| | 621 | Envelope delay |
| | 622 | Phase |
| | 623 | Harmonic |
| | 624 | Intermodulation |
| | 625 | Dissymmetry or asymmetry |
| | 626 | Nonlinearity |
| | 627 | Shielding effectiveness (SE) |
| | 629 | Distributive type parameters |
| | 630 | Plural diverse parameters |
| | 631 | Using wave polarization (e.g., field rotation) |
| | 632 | Using particular field coupling type (e.g., fringing field) |
| | 633 | Using resonant frequency |
| | 634 | To determine water content |
| | 635 | To determine dimension (e.g., distance or thickness) |
| | 636 | With a resonant cavity |
| | 637 | Using transmitted or reflected microwaves |
| | 638 | Scattering type parameters (e.g., complex reflection coefficient) |
| | 639 | Where energy is transmitted through a test substance |
| | 642 | Where energy is reflected (e.g., reflectometry) |
| | 647 | Using a comparison or difference circuit |
| | 649 | Lumped type parameters |
| | 650 | Using phasor or vector analysis |
| | 652 | Of a resonant circuit |
| | 653 | For figure of merit or Q value |
| | 654 | Using inductive type measurement |
| | 658 | Using capacitive type measurement |
| | 659 | With loss characteristic evaluation |
| | 660 | With variable electrode area |
| | 661 | With variable distance between capacitor electrodes |
| | 663 | Where a material or object forms part of the dielectric being measured |
| | 664 | To determine water content |
| | 665 |  By comparison or difference circuit |
| | 667 | By frequency signal response, change or processing circuit |
| | 669 | With compensation means |
| | 671 | To determine dimension (e.g., dielectric thickness) |
| | 672 | By comparison or difference circuit |
| | 674 | By frequency signal response, change or processing circuit |
| | 676 | With pulse signal processing circuit |
| | 679 | With comparison or difference circuit |
| | 681 | With frequency signal response, change or processing circuit |
| | 683 | With phase signal processing circuit |
| | 684 | With compensation means |
| | 686 | With a capacitive sensing means |
| | 691 | Using resistance or conductance measurement |
| | 692 | With living organism condition determination using conductivity effects |
| | 693 | With object or substance characteristic determination using conductivity effects |
| | 694 | To determine water content |
| | 697 | For interface |
| | 698 | To determine oil qualities |
| | 699 | To determine dimension (e.g., distance or thickness) |
| | 701 | Where the object moves while under test |
| | 702 | With radiant energy effects |
| | 704 | With ratio determination |
| | 705 | With comparison or difference circuit |
| | 707 | With frequency response, change or processing circuit |
| | 709 | With phase signal processing circuit |
| | 710 | With pulse signal processing circuit |
| | 713 | With voltage or current signal evaluation |
| | 719 | With semiconductor or IC materials quality determination using conductivity effects |
| | 720 | With compensation means |
| | 722 | Device or apparatus determines conductivity effects |
| | 725 | Using a particular bridge circuit |
| | 726 | Transformer testing (e.g., ratio) |
| | 727 | Piezoelectric crystal testing (e.g., frequency, resistance) |
| | 66 | CONDUCTOR IDENTIFICATION OR LOCATION (E.G., PHASE IDENTIFICATION) |
| | 160 | ELECTRICAL SPEED MEASURING |
| | 161 | Speed comparing means |
| | 162 | With acceleration measuring means |
| | 163 | Including speed analog electrical signal generator |
| | 166 | Including speed-related frequency generator |
| | 167 | Including rotating magnetic field actuated indicator |
| | 168 | Including periodic switch |
| | 172 | Including synchronized recording medium |
| | 173 | Including magnetic detector |
| | 175 | Including radiant energy detector |
| | 176 | Including object displacement varied variable circuit impedance |
| | 177 | Including motor current or voltage sensor |
| | 178 | Including "event" sensing means |
| | 71.1 | DETERMINING NONELECTRIC PROPERTIES BY MEASURING ELECTRIC PROPERTIES |
| | 71.2 | Erosion |
| | 71.3 | Beam of atomic particles |
| | 71.4 | Particle counting |
| | 71.5 | Semiconductors for nonelectrical property |
| | 71.6 | Superconductors |
| | 72 | TESTING POTENTIAL IN SPECIFIC ENVIRONMENT (E.G., LIGHTNING STROKE) |
| | 73.1 | PLURAL, AUTOMATICALLY SEQUENTIAL TESTS |
| | 74 | TESTING AND CALIBRATING ELECTRIC METERS (E.G., WATT-HOUR METERS) |
| | 76.11 | MEASURING, TESTING, OR SENSING ELECTRICITY, PER SE |
| | 76.12 | Analysis of complex waves |
| | 76.13 | Amplitude distribution |
| | 76.14 | Radiometer (e.g., microwave, etc.) |
| | 76.15 | With sampler |
| | 76.16 | With counter |
| | 76.17 | With integrator |
| | 76.18 | With slope detector |
| | 76.19 | Frequency spectrum analyzer |
| | 76.21 | By Fourier analysis |
| | 76.22 | Real-time spectrum analyzer |
| | 76.23 | With mixer |
| | 76.24 | With sampler |
| | 76.25 | With slope detector |
| | 76.26 | Scanning-panoramic receiver |
| | 77.11 | Nonscanning |
| | 76.38 | With sampler |
| | 76.39 | Frequency of cyclic current or voltage (e.g., cyclic counting etc.) |
| | 76.41 | Frequency comparison, (e.g., heterodyne, etc.) |
| | 76.49 | Tuned mechanical resonator (e.g., reed, piezocrystal, etc.) |
| | 76.51 | By tuning (e.g., to resonance,etc.) |
| | 76.52 | By phase comparison |
| | 76.53 | With phase lock |
| | 76.54 | With delay line |
| | 76.55 | Digital output |
| | 76.56 | With microwave frequency detection |
| | 76.57 | With tone detection |
| | 76.58 | With sampler |
| | 76.59 | With multiplexing |
| | 76.61 | With memory |
| | 76.62 | With counter |
| | 76.65 | With space discharge device |
| | 76.66 | With capacitive energy storage |
| | 76.68 | With filtering |
| | 76.69 | Current output proportional to frequency |
| | 76.71 | Nulling circuit |
| | 76.72 | Qualitative output |
| | 76.73 | With saturable device |
| | 76.74 | Deviation measurement |
| | 76.75 | Having inductive sensing |
| | 76.76 | With space discharge device |
| | 76.77 | Phase comparison (e.g., between cyclic pulse voltage and sinusoidal current, etc.) |
| | 76.78 | Quadrature sensing |
| | 76.79 | Feedback control, electrical |
| | 76.81 | Feedback control, mechanical |
| | 76.82 | Digital output |
| | 76.83 | Analog output |
| | 84 | With waveguide (e.g., coaxial cable) |
| | 85 | With frequency conversion |
| | 86 | Polyphase (e.g., phase angle, phase rotation or sequence) |
| | 87 | With nonlinear device (e.g., saturable reactor, rectifier), discharge device (e.g., gas tube) or lamp |
| | 90 | Electrodynamometer instrument |
| | 91 | Synchroscope type |
| | 92 | Fluid (e.g., thermal expansion) |
| | 95 | With waveguide or long line |
| | 96 | Using radiant energy |
| | 98 | Balancing (e.g., known/unknown voltage comparison, bridge, rebalancing) |
| | 101 | Non-rebalancing bridge |
| | 102 | Transient or portion of cyclic |
| | 103R | Demand, excess, maximum or minimum (e.g., separate meters for positive and negative power, peak voltmeter) |
| | 105 | Thermal (e.g., compensation) |
| | 107 | Polyphase |
| | 109 | Electrostatic attraction or piezoelectric |
| | 110 | Meter protection or fraud combatting |
| | 111 | With storage means for voltage or current (e.g., condenser banks) |
| | 113 | Recording |
| | 114 | Plural meters (e.g., plural movements in one case) |
| | 115 | Plural ranges, scales or registration rates |
| | 117R | Magnetic saturation (e.g., in field or in amplifier) |
| | 118 | Modulator/demodulator |
| | 119 | With rectifier (e.g., A.C. to D.C.) |
| | 120 | With voltage or current conversion (e.g., D.C. to A.C., 60 to 1000) |
| | 121R | Cathode ray (e.g., magic eye) |
| | 122 | Gaseous discharge (e.g., spark gap voltmeter) |
| | 123R | With amplifier or space discharge device |
| | 125 | Inertia control, instrument damping and vibration damping |
| | 126 | With coupling means (e.g., attenuator, shunt) |
| | 129 | Polepiece (e.g., split) admits nonunitary input conductor |
| | 130 | Self-calibration |
| | 131 | Suppressed zero |
| | 132 | Nonlinear (e.g., Thyrite) |
| | 133 | Nonquantitative (e.g., hot-line indicator, polarity tester) |
| | 134 | With commutator or reversing or pulsating switch (e.g., D.C. watt-hour meter) |
| | 136 | With rolling wheel or ball (e.g., transmission, integrating) |
| | 137 | Eddy current rotor (e.g., A.C. integrating wattmeter) |
| | 139 | Motor-driven, time-controlled or oscillating (e.g., ratchet) |
| | 140R | Plural inputs (e.g., summation, ratio) |
| | 143 | Plural active motor elements (e.g., for two crossed pointers) |
| | 144 | With electromagnetic field (e.g., dynamometer) |
| | 149 | With probe, prod or terminals |
| | 150 | Eccentrically pivoted coil |
| | 151R | With permanent magnet |
| | 153 | With register |
| | 154R | With rotor (e.g., filar suspension, zero set, balancing) |
| | 156 | Casings |
| | 157 | Combined |
| CROSS-REFERENCE ART COLLECTIONS | ||
| | 800 | DIVINING RODS |
| FOREIGN ART COLLECTIONS | ||
| FOR000 | CLASS-RELATED FOREIGN DOCUMENTS |
| Any foreign patents or non-patent literature from subclasses that have been reclassified have been transferred directly to FOR Collections listed below. These Collections contain ONLY foreign patents or non-patent literature. The parenthetical references in the Collection titles refer to the abolished subclasses from which these Collections were derived. | ||
| FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS(324/500) |
| OF GEOPHYSICAL SURFACE OR SUBSURFACE IN SITU (324/323) |
| Using electrode arrays, circuits, structure, or supports (324/347) |
| FOR104 | With probe elements (324/754) |
| FOR105 | Internal of or on support for device under test (DUT): (324/755) |
| FOR106 | Contact confirmation (324/756) |
| FOR107 | Probe contact enhancement (324/757) |
| FOR108 | Probe alignment or positioning (324/758) |
| FOR109 | With recording of test results on DUT (324/759) |
| FOR110 | With temperature control (324/760) |
| FOR111 | Pin (324/761) |
| FOR112 | Cantilever (324/762) |
| FOR113 | DUT including test circuit (324/763) |
| FOR114 | With identification of DUT (324/764) |
| FOR115 | Test of semiconductor device (324/765) |
| FOR120 | Liquid crystal device test (324/770) |
| FOR121 | Power supply test (324/771) |
| FOR122 | Motor or generator fault tests (324/772) |
| FOR123 | MISCELLANEOUS (324/158.1) |