CLASS 324, | ELECTRICITY: MEASURING AND TESTING |
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SECTION I - CLASS DEFINITION
This is the residual home for all subject matter, not elsewhere classified, relating to the measuring, testing (or sensing) of electric properties, (e.g., determining ground resistivity, determining frequency of an alternating current, determining kilowatt hour demand), or the measuring, testing or sensing of nonelectric properties by electric means (e.g., determining moisture, a nonelectric property, by measuring conductance with a resistance bridge; determining speed, a nonelectric property by use of an electric tachometer).
(1) Note. Measuring and testing have been distinguished as being quantitative and qualitative, respectively, but in these definitions the terms are used synonymously. |
(2) Note. This class was produced in 1953 by making official the unofficial digests which had been established by the Examiners of Class 175 (Division 48) during the period from about 1905 to 1952, and, in the case of subclasses 76+, by cursorily revising the unofficial digests which had been established by the Examiners of Classes 171 and 172 (Division 69) during the period from about 1902 to 1952. A caveat is given: While it is believed that the titles and definitions are reasonably correct, no assurance can be given that all of the patents, issued prior to the date of reclassification, are in the proper subclass, since only some of the individual patents were read during the reclassification project. Consequently, in making a thorough search in this class, it is advisable to investigate every subclass which may possibly be pertinent and not, in order to shorten the search, to rely upon the principle of superiority of subclass subject matter because of position in schedule, since the principle is applicable only in classes where each patent has been analyzed and placed in the schedule in accordance with that portion of the disclosed subject matter which is claimed. |
(3) Note. Measuring and testing requires sensing and signaling or indicating to exhibit the result of the sensing. Sensing is synonymous with condition responsive. Sensing merely detects the presence and/or magnitude of the condition. |
(4) Note. Since many other classes include condition responsive subclasses, often entitled automatically responsive or automatic, the search for sensing, in order to be complete, must extend to the class which relates to the environment in which the sensing occurs. Some of these classes are listed below under SEARCH CLASS. |
(5) Note. Since Class 324 takes, under the class definition, only measuring and testing not elsewhere classified, the search, in order to be complete, must in appropriate instances extend to the other classes listed below under SEARCH CLASS. |
(6) Note. The combination of the subject matter of this class (324) and an art environment is generally classified with the art environment where that environment is significant, either by virtue of a significant disclosed relationship or by virtue of a claimed relationship, as where a test is made of the condition of a portion of a telephone system without making said portion of the telephone system unavailable for use. Where the art environment is recited by name only the combination may be classified, in some instances, with the art environment, and in others, in this class (324). For a list of some of the other classes which contain pertinent subject matter, see the classes referred to under SEARCH CLASS. |
SECTION II - LINES WITH OTHER CLASSES AND WITHIN THIS CLASS
Class 324, subclasses 870.01+ take telemetric-signaling means useful in transmitting a measured quantity, not limited to any particular measuring instrument provided for in other classes, while Class 324 takes such telemetric-signaling means in combination with a particular measuring means of the type provided for in Class 324.
LINE BETWEEN CLASS 340 AND CLASS 324
See Class 340, Communications: Electrical, appropriate subclasses, for subject matter sometimes similar to that in Class 324. Often, but not invariably, the line between these two classes is as follows: If the testing system is permanently associated with the environment being tested, as in a machine monitoring device or in a burglar alarm, classification is in Class 340, while if it is temporarily associated, as in a portable test set, such as used by linemen, classification is in Class 324. Note particularly subclasses 870.01+ for telemetering and subclasses 500+ for signaling, automatically responsive to a condition.
LINE BETWEEN CLASS 429 AND CLASS 324
See Class 429, Chemistry: Electrical Current Producing Apparatus, Product and Process, subclasses 61+ for automatic battery control means combined with the battery, and subclasses 90+ for battery having measuring, testing, and indicating means. See Class 324, subclasses 20+ and Class 340, subclasses 636.1-636.21 for this subject matter.
SECTION III - REFERENCES TO OTHER CLASSES
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29, | Metal Working, subclass 25.35 for the electrical measuring, testing or sensing of piezoelectric crystals combined with the manufacture thereof, and subclass 25.41 for the electrical measuring, testing or sensing of condensers combined with the manufacture thereof. |
33, | Geometrical Instruments, subclasses 125+ , for the determination of distance, and subclasses 300+, for magnetic field direction sensing and indicating. |
73, | Measuring and Testing, appropriate subclasses for nonelectrical measuring and testing and for electrical measuring and testing of the following types: subclasses 26+ for gas analysis by electrical thermal determination,. subclass 75 for moisture determination by electrical thermal conductivity; subclass 760 for stress and strain gages, subclasses 104+ for surface and cutting edge determination by sliding pick-up, subclasses 112.01 - 112.06 for turbine engine testing, 114.01 - 114.81 for internal combustion engine measuring and testing, and especially 114.58 - 114.67 for electrical system testing of an internal combustion engine. Subclass 304 for liquid level gages; immersible electrode type; subclasses 305+ for float type, subclass 755 for fluid pressure (e.g., Pirani type), subclasses 488+ for speed. |
100, | Presses, subclass 99 for presses having electrical measuring, testing or sensing means. |
156, | Adhesive Bonding and Miscellaneous Chemical Manufacture, subclasses 47+ for methods of making or joining conductors of indefinite length. |
178, | Telegraphy, appropriate subclasses particularly subclass 69 , for telegraphy combined with electrical measuring, testing or sensing. |
181, | Acoustics, subclasses 101+ , for geophysical or subsurface exploration involving mechanically transmitting or receiving sound waves, subclasses 123+ for mechanical sound echo systems in general, and subclass 125 for mechanical sound location means. |
204, | Chemistry: Electrical and Wave Energy, subclass 400 , for the analytical and testing apparatus related to the subject matter of that class, and subclass 242 for electrolytic cells, per se, (e.g., Beckmann cell). |
205, | Electrolysis: Processes, Compositions Used Therein, and Methods of Preparing the Compositions, appropriate subclasses for electrolysis utilized for electrochemistry and especially subclasses 775+ as the residual home for a process of electrolytic analysis or testing, per se. |
209, | Classifying, Separating, and Assorting Solids, for the subject matter of that class even if the basis of the separation is an electrical determination. Note subclasses 127.1+ for electrostatic separation and subclasses 212 and 213+ for magnetic separators, subclasses 511, 524+, 536, and 576 for photoelectric assorting. |
250, | Radiant Energy, subclasses 200+ for miscellaneous photoelectric cell circuits, subclass 250 for wave meters for measuring the wavelength or frequency of radio and microwaves, subclass 281 for methods and apparatus for ionic separation or analysis, subclasses 302+ for fluorescent and radioactive tracer methods, subclasses 336.1+ for the detection of invisible radiation or the examination of material by invisible radiation using radiant energy responsive electric signalling means, subclasses 428+ for fluent material containing, support or transfer means with or without an irradiating source or radiating fluent material, subclasses 453.11+ for supports for objects of irradiation, subclasses 458.1+ for luminophor irradiation, subclasses 472.1+ for nonelectric invisible radiation detectors, subclasses 493.1+ for radiant energy generation and sources, subclasses 505.1+ for radiation controlling means and subclasses 522.1+ for source supports. |
273, | Amusement Devices: Games, appropriate subclasses for games (e.g., pin-ball machines, target range) having electrical indicators. |
307, | Electrical Transmission or Interconnection Systems, subclass 111 for systems which are nonresponsive to frequency change and subclass 152 for systems which are responsive to rate of change. |
313, | Electric Lamp and Discharge Devices, subclass 10 for the subject matter of that class with integral temperature indicators. |
314, | Electric Lamp and Discharge Devices: Consumable Electrodes, appropriate subclasses (note particularly subclass 9 ) for the subject matter of that class combined with measuring, testing or sensing. |
315, | Electric Lamp and Discharge Devices: Systems, appropriate subclasses (note particularly subclasses 129+ ) for the subject matter of that class combined with measuring, testing or sensing. |
318, | Electricity: Motive Power Systems, appropriate subclasses for automatically responsive motor systems and subclass 490 for motor systems having signals, meters, recorders or testing devices. |
320, | Electricity: Battery and Condenser Charging and Discharging, subclass 48 for battery charging and discharging systems having indicating, signaling and/or testing means. |
322, | Electricity: Single Generator Systems, subclasses 17+ for the subject matter of that class automatically responsive to a condition. |
323, | Electricity: Power Supply or Regulation Systems, subclasses 234 through 303for the subject matter of that class automatically responsive to a condition. |
329, | Demodulators, for amplitude frequency, phase or pulse demodulators which may include an indicator. |
330, | Amplifiers, appropriate subclasses, for amplifiers, generally, which may be used in electrical measuring and testing circuits, particularly subclass 2 for amplifier condition testing or measuring. Where the amplifier is used merely as a part of an arrangement to measure or test a condition other than that of the amplifier, itself, classification is not in Class 330 but in the appropriate subclass of Class 324. |
331, | Oscillators, subclass 44 for oscillator systems provided with frequency calibrating or testing means, and subclass 64 for oscillator systems provided with indicator, signal or alarm. |
332, | Modulators, appropriate subclasses particularly subclasses 118 and 150 for the modulators having indicating, observing and/or signaling means. |
333, | Wave Transmission Lines and Networks, appropriate subclasses, particularly subclasses 2+ , 14 and 17.1+ for the subject matter of that class automatically responsive to a condition. |
336, | Inductor Devices, subclasses 30+ for the subject matter of that class automatically responsive to a condition. |
340, | Communications: Electrical, appropriate subclasses, for subject matter sometimes similar to that in Class 324. (See Lines With Other Classes and Within This Class for a further discussion of the line). |
343, | Communications: Radio Wave Antennas, subclasses 5+ for reflected and/or otherwise returned radio wave energy wave measuring, testing and sensing systems, such as RADAR and ponder systems, and subclasses 350+ for direction finding radio systems. |
346, | Recorders, for recorders which record the operation of machines or workmen. Many of these recorders, especially in subclasses 33+ record the result of a measurement, test or sensing operation. Generally, but not invariably, a Class 324 disclosure, when combined with a recorder, is classified in Class 324. |
348, | Television, subclasses 180+ for monitoring, testing, or measuring television signals or apparatus. |
356, | Optics: Measuring and Testing, for measuring and testing light, materials and articles by means of visible light particularly subclasses 23+ for optical stroboscopes, subclasses 27+ for velocity or velocity and height measurements, subclasses 213+ for photometers, subclasses 237.1+ for apparatus for flaw detection subclasses 300+ for spectroscopic examination, subclasses 432+ for light transmission tests and subclasses 445+ for light reflection tests. |
361, | Electricity: Electrical Systems and Devices, subclasses 1+ for safety systems responsive to an unsafe condition, such as circuit breaker systems, and subclasses 236+ for speed responsive electrical systems. |
363, | Electric Power Conversion Systems, subclasses 74 , 164 and 165 for the subject matter of that class automatically responsive to a condition. |
365, | Static Information Storage and Retrieval, subclass 200 wherein a defective memory device is used to store information, subclass 201 for specifics of a memory device which is tested for defects or erroneous information. |
368, | Horology: Time Measuring Systems or Devices, subclasses 155+ for time measuring by clocks having electrical features. |
374, | Thermal Measuring and Testing, appropriate subclasses for a measurement or test of a thermal quantity, whether performed electrically or nonelectrically, except for a measurement or test involving a particle spin determination. |
376, | Induced Nuclear Reactions: Processes, Systems, and Elements, subclasses 245+ for processes or device for testing, measuring, etc., of a condition of a nuclear reactor during its operation. |
378, | X-Ray or Gamma Ray Systems or Devices, appropriate subclasses, particularly subclasses 44+ , 51+ and 70+ for X-ray systems used in testing. |
379, | Telephonic Communications, appropriate subclasses, particularly subclasses 1.01 through 35,for telephony combined with electrical measuring, testing or sensing. |
422, | Chemical Apparatus and Process Disinfecting, Deodorizing, Preserving, or Sterilizing, subclasses 50+ and 105+ for apparatus for electrical measuring, testing, or sensing combined with significant chemical reaction or control. |
429, | Chemistry: Electrical Current Producing Apparatus, Product and Process, subclasses 61+ for automatic battery control means combined with the battery, and subclasses 90+ for battery having measuring, testing, and indicating means. (See Lines With Other Classes and Within This Class for further discussion of the line between Class 429 and Class 324.) |
434, | Education, and Demonstration appropriate subclasses, for electrical measuring, testing or sensing in combination with education. |
436, | Chemistry: Analytical and Immunological Testing, subclasses 1+ for processes of electrical measuring, testing, or sensing combined with significant chemical reaction or control. |
439, | Electrical Connectors, subclasses 488+ for a connector having indicating means or identifying means. |
455, | Telecommunications, appropriate subclasses for radio systems having electrical measuring testing or sensing means for indicating the operative condition of the radio system. |
473, | Games Using Tangible Projectile, and its incorporated class (273, Amusement Devices: Games), for a game device or apparatus (e.g., a pin-ball machine, target range, aerial projectile target device, bowling alley apparatus, golfing apparatus, simulated game apparatus, chance device, etc.) which may have an electrical indicator. |
505, | Superconductor Technology: Apparatus, Material, Process, subclasses 150+ for high temperature (Tc greater than 30 K) superconducting device, and particularly subclasses 160+ for measuring or testing system or device; and subclass 310 for a process of measuring or testing a superconductive property. |
702, | Data Processing: Measuring, Calibrating, or Testing, appropriate subclasses for data processing systems or calculating computers which are utilized for testing, measuring, or monitoring the operation of an external device or quantity where the external device or quantity must be only nominally claimed, particularly subclasses 6 through 13for well-logging, subclasses 14-18 for seismology, subclasses 57-80 for electrical signal parameter measurement, subclasses 85-107 for calibration, subclasses 108-126 for a testing system, subclass 141 for acceleration, subclasses 142-149 for speed or velocity, subclasses 176-178 for time duration or rate, and subclasses 191-195 for noise reduction in measured signal processing. |
703, | Data Processing: Structural Design, Modeling, Simulation, and Emulation, subclass 4 for analog simulation of electrical device or system. |
714, | Error Detection/Correction and Fault Detection/Recovery, appropriate subclasses for error detection, correction, recovery or prevention in pulse code data or computers. |
SUBCLASSES
66 | |||||
This subclass is indented under the class definition. Subject matter for determining the location of a particular
conductor or for identifying a particular conductor out of many.
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67 | |||||
This subclass is indented under subclass 66. Subject matter for determining the location of a conductor
at a point which is inaccessible.
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71.1 | DETERMINING NONELECTRIC PROPERTIES BY MEASURING ELECTRIC PROPERTIES: | ||||
This subclass is indented under the class definition. Subject matter for determining a nonelectric property by
measuring an electric property.
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71.2 | Erosion: |
This subclass is indented under subclass 71.1. Subject matter where the nonelectric property measured relates to the amount of material removed from an object. | |
71.3 | Beam of atomic particles: |
This subclass is indented under subclass 71.1. Subject matter where the property being measured is some characteristic of a beam of atomic particles. | |
71.4 | Particle counting: | ||||
This subclass is indented under subclass 71.1. Subject matter where the measurement means includes means
for counting particles.
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71.5 | Semiconductors for nonelectrical property: | ||
This subclass is indented under subclass 71.1. Subject matter including semiconductive means for sensing
variations in the nonelectrical property being measured.
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71.6 | Superconductors: |
This subclass is indented under subclass 71.1. Subject matter where the nonelectric properties being determined are those of superconductors. | |
72 | |||||
This subclass is indented under the class definition. Subject matter for determining voltage, phase, current,
power, frequency or a related quantity in a specific environment.
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72.5 | |||||||
This subclass is indented under subclass 72. Subject matter having a voltage probe.
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73.1 | PLURAL, AUTOMATICALLY SEQUENTIAL TESTS: | ||||||||||||||||||||||||||||||||||||||||||
This subclass is indented under the class definition. Subject matter for measuring or determining two or more
electrical characteristics of an electrical circuit or circuit element, or
for measuring or determining a single electrical characteristic
of two or more electrical circuits or circuit elements, wherein
the measurements or determinations are made one after another without
human intervention.
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74 | |||||||||
This subclass is indented under the class definition. Subject matter for testing and calibrating electric meters.
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75 | |||||
This subclass is indented under subclass 74. Subject matter in which the testing or calibrating is done
by stroboscopic means.
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76.11 | MEASURING, TESTING, OR SENSING ELECTRICITY, PER SE: | ||||||||||||||||||||||||||||||
This subclass is indented under the class definition. Subject matter relating to the measurement of electric voltages
or currents, or combinations thereof, when said electric voltages
and currents do not occur in a significantly recited external environment.
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76.12 | Analysis of complex waves: | ||||||||||||
This subclass is indented under subclass 76.11. Subject matter whereby one or more components of a periodic
wave made up of a combination of several frequencies or several
sine waves superimposed on one another has components which are
examined.
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76.13 | Amplitude distribution: | ||
This subclass is indented under subclass 76.12. Subject matter comprising means to measure an extent of
dispersion of magnitude variation in the component of the complex
wave.
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76.14 | Radiometer (e.g., microwave, etc.): | ||||||
This subclass is indented under subclass 76.13. Subject matter having means that detect and measure radiant
energy either at separate wave lengths or integrated over a broad
wavelength band in the complex wave.
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76.15 | With sampler: | ||||||||
This subclass is indented under subclass 76.13. Subject matter including a device whose output is a series
of discrete values representative of the values of an input at a
series of points in time.
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76.16 | With counter: | ||||||
This subclass is indented under subclass 76.13. Subject matter including a device capable of changing stages
in a specified sequence upon receiving appropriate signals.
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76.17 | With integrator: | ||||
This subclass is indented under subclass 76.13. Subject matter whereby summing of a signal is derived.
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76.18 | With slope detector: | ||||
This subclass is indented under subclass 76.13. Subject matter comprising means to monitor the rise over
the run in a wave.
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76.19 | Frequency spectrum analyzer: | ||
This subclass is indented under subclass 76.12. Subject matter including means that show an energy distribution
as a function of frequency for a given signal.
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76.21 | By Fourier analysis: | ||||
This subclass is indented under subclass 76.19. Subject matter wherein the energy distribution is taken
at discrete harmonic components, i.e., harmonics, of the given signal.
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76.22 | Real-time spectrum analyzer: |
This subclass is indented under subclass 76.19. Subject matter including a device which operates with sufficient speed that the energy distribution is determined within set timing limits. | |
76.23 | With mixer: | ||||
This subclass is indented under subclass 76.19. Subject matter including a circuit that generates output
frequencies equal to the sum or difference of two input frequencies.
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76.24 | With sampler: | ||||||||
This subclass is indented under subclass 76.19. Subject matter including a device whose output is a series
of discrete values representative of the values of an input at a
series of points in time.
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76.25 | With slope detector: | ||||
This subclass is indented under subclass 76.19. Subject matter comprising means to monitor the rise over
the run in a wave.
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76.26 | Scanning-panoramic receiver: | ||||
This subclass is indented under subclass 76.19. Subject matter including a radio receiver that displays,
on the screen of a cathode-ray tube, the presence and relative strength
of all signals within a wide frequency range.
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76.27 | With particular sweep circuit: |
This subclass is indented under subclass 76.26. Subject matter including a specific circuit which produces at regular intervals, an approximately linear, circular, or other movement of a beam in a cathode-ray tube. | |
76.28 | Digital filter: | ||||||||||||
This subclass is indented under subclass 77.11. Subject matter wherein an input signal is operated on by
means of digital circuitry to alter the frequency spectrum of the
input signal.
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76.29 | With filtering: | ||||||||
This subclass is indented under subclass 77.11. Subject matter including a network of resistors, inductors,
or capacitors which offers comparatively little opposition to certain
frequencies, while blocking or attenuating other frequencies.
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76.31 | Parallel filters: | ||||||||||
This subclass is indented under subclass 76.29. Subject matter including parallel connected network of
resistors, inductors, or capacitors which offers comparatively little
opposition to certain frequencies, while blocking or attenuating
other frequencies.
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76.32 | With space discharge device: | ||||
This subclass is indented under subclass 76.31. Subject matter comprising any device which is intended to
have an electrical current flow between two spaced electrodes, at
least part of the path followed by the discharge being constituted
by a gas, vapor, or vacuum.
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76.33 | Correlation: | ||
This subclass is indented under subclass 77.11. Subject matter including means to measure the similarity
of two or more signals.
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76.34 | With space discharge device: | ||||
This subclass is indented under subclass 76.33. Subject matter comprising any device which is intended to
have an electrical current flow between two spaced electrodes, at
least part of the path followed by the discharge being constituted
by a gas, vapor, or vacuum.
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76.35 | With delay line: | ||||
This subclass is indented under subclass 77.11. Subject matter comprising a real or artificial transmission
line or equivalent component that slows a signal for a predetermined
length of time.
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76.36 | With optics: | ||||
This subclass is indented under subclass 77.11. Subject matter comprising lenses, prisms, or mirrors to
be used in the frequency spectrum analyzer.
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76.37 | Bragg cell: |
This subclass is indented under subclass 76.36. Subject matter comprising acousto-optic means to redirect light by the method of Bragg diffraction. | |
76.38 | With sampler: | ||||||||
This subclass is indented under subclass 76.12. Subject matter including a device whose output is a series
of discrete values representative of the values of an input at a
series of points in time.
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76.39 | Frequency of cyclic current or voltage (e.g., cyclic counting etc.): | ||||||||||||||||||||||||||||||
This subclass is indented under subclass 76.11. Subject matter relating to the measuring of the frequency
of an electric voltage or current which fluctuates in a periodic
manner.
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76.41 | Frequency comparison (e. g., heterodyne, etc.): | ||||||||||||||
This subclass is indented under subclass 76.39. Subject matter having means to compare two frequencies with
each other.
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76.42 | With sampler: | ||||||||
This subclass is indented under subclass 76.41. Subject matter including a device whose output is a series
of discrete values representative of the values of an input at a
series of points in time.
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76.43 | With plural mixers: | ||||
This subclass is indented under subclass 76.41. Subject matter including more than one circuit that generates
output frequencies equal to the sum and the difference of two input
frequencies.
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76.44 | With filtering: | ||||||||
This subclass is indented under subclass 76.41. Subject matter including a selective network of resistors,
inductors, or capacitors which offers comparatively little opposition
to certain frequencies,while blocking or attenuating other frequencies.
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76.45 | Bandpass: |
This subclass is indented under subclass 76.44. Subject matter that limits the range of frequencies that will be passed through a device. | |
76.46 | Plural: |
This subclass is indented under subclass 76.44. Subject matter including more than one filter. | |
76.47 | Digital output: | ||||
This subclass is indented under subclass 76.41. Subject matter comprising an output signal which represents
the size of a stimulus or input signal in the form of a series of
discrete quantities which are coded to represent digits in a system
of numerical notation.
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76.48 | With counter: | ||||||
This subclass is indented under subclass 76.47. Subject matter including a device capable of changing stages
in a specified sequence upon receiving appropriate signals.
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76.49 | Tuned mechanical resonator (e.g., reed, piezocrystal, etc.): | ||||
This subclass is indented under subclass 76.39. Subject matter having a mechanical resonating system and
an electromechanical transducer to drive the mechanical resonating
system in accordance with the electric voltage or current.
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76.51 | By tuning (e.g., to resonance, etc.): | ||||||||||
This subclass is indented under subclass 76.39. Subject matter having circuit which may be adjusted for
resonance at a particular frequency or other predetermined condition.
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76.52 | By phase comparison: | ||
This subclass is indented under subclass 76.39. Subject matter having angle relationship means as a part
thereof, in order to perform the frequency measurement.
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76.53 | With phase lock: |
This subclass is indented under subclass 76.52. Subject matter comprising means of making the phase of an oscillator signal follow exactly the phase of a reference signal. | |
76.54 | With delay line: | ||||
This subclass is indented under subclass 76.52. Subject matter comprising a real or artificial transmission
line or equivalent component that slows a signal for a predetermined
length of time.
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76.55 | Digital output: | ||||
This subclass is indented under subclass 76.52. Subject matter comprising an output signal which represents
the size of a stimulus or input signal in the form of a series of
discrete quantities which are coded to represent digits in a system
of numerical notation.
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76.56 | With microwave frequency detection: | ||||||
This subclass is indented under subclass 76.55. Subject matter comprising means to detect frequencies of
1000mhz plus.
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76.57 | With tone detection: |
This subclass is indented under subclass 76.55. Subject matter comprising means to detect a sound sensation having pitch. | |
76.58 | With sampler: | ||||||||
This subclass is indented under subclass 76.55. Subject matter including a device whose output is a series
of discrete values representative of the values of an input at a
series of points in time.
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76.59 | With multiplexing: | ||
This subclass is indented under subclass 76.55. Subject matter including a device for simultaneous transmission
of two or more signals in either or both directions over the same
transmission path.
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76.61 | With memory: | ||
This subclass is indented under subclass 76.55. Subject matter comprising means to collect and hold information
until it is needed.
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76.62 | With counter: | ||||||
This subclass is indented under subclass 76.55. Subject matter including devices capable of changing stages
in a specified sequence upon receiving appropriate signals.
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76.63 | Using register: | ||||
This subclass is indented under subclass 76.62. Subject matter including a device in which information is
stored in and serially transferred through a storage medium.
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76.64 | Plural: |
This subclass is indented under subclass 76.62. Subject matter comprising more than one counter. | |
76.65 | With space discharge device: | ||||
This subclass is indented under subclass 76.55. Subject matter comprising any device which is intended to
have an electrical current flow between two spaced electrodes, at
least part of the path followed by the discharge being constituted
by a gas, vapor, or vacuum.
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76.66 | With capacitive energy storage: |
This subclass is indented under subclass 76.52. Subject matter comprising conductors and dielectrics that store electrical energy. | |
76.67 | With space discharge device: | ||||
This subclass is indented under subclass 76.66. Subject matter comprising any device which is intended to
have an electrical current flow between two spaced electrodes, at
least part of the path followed by the discharge being constituted
by a gas, vapor, or vacuum.
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76.68 | With filtering: | ||||||||||||
This subclass is indented under subclass 76.52. Subject matter including a network of resistors, inductors,
or capacitors which offers comparatively little opposition to certain
frequencies, while blocking or attenuating other frequencies.
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76.69 | Current output proportional to frequency: |
This subclass is indented under subclass 76.52. Subject matter whereby the current is related to the frequency by a constant. | |
76.71 | Nulling circuit: |
This subclass is indented under subclass 76.52. Subject matter comprising a circuit that indicates when current, voltage, or power is zero. | |
76.72 | Qualitative output: | ||
This subclass is indented under subclass 76.52. Subject matter whereby an output indicates conformance to
specifications of a device.
| |||
76.73 | With saturable device: | ||||
This subclass is indented under subclass 76.52. Subject matter comprising a magnetic-core reactor, the reactance
of which is controlled by changing the saturation of the core by
varying a superimposed unidirectional flux.
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76.74 | Deviation measurement: |
This subclass is indented under subclass 76.52. Subject matter comprising a device that measures the difference between the actual and specified values of a quantity. | |
76.75 | Having inductive sensing: | ||||
This subclass is indented under subclass 76.39. Subject matter comprising detecting means which senses an
inductance or detects the inducing of a voltage through mutual or
electrostatic induction.
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| |||||
76.76 | With space discharge device: | ||||
This subclass is indented under subclass 76.39. Subject matter comprising any device which is intended to
have an electrical current flow between two spaced electrodes, at
least part of the path followed by the discharge being constituted
by a gas, vapor, or vacuum.
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76.77 | Phase comparison (e.g., between cyclic pulse voltage and sinusoidal current, etc.): | ||||||||||||||||||||
This subclass is indented under subclass 76.11. Subject matter relating to the measuring of a phase relationship
between an electric voltage or current which fluctuates in a periodic
manner and another electric voltage or current which fluctuates
in the same manner.
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76.78 | Quadrature sensing: |
This subclass is indented under subclass 76.77. Subject matter comprising means to detect the state or condition of two related periodic functions or two related points separated by a quarter of a cycle, or 90 electrical degrees. | |
76.79 | Feedback control, electrical: | ||
This subclass is indented under subclass 76.77. Subject matter having electrical means to control a return
path from an output terminal to an input terminal of at least one
functional circuit device or circuit.
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| |||
76.81 | Feedback control, mechanical: | ||
This subclass is indented under subclass 76.77. Subject matter having mechanical means to control a return
path from an output terminal to an input terminal of at least one
functional circuit device or circuit.
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| |||
76.82 | Digital output: | ||||
This subclass is indented under subclass 76.77. Subject matter comprising an output signal which represents
the size of a stimulus or input signal in the form of a series of
discrete quantities which are coded to represent digits in a system
of numerical notation.
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| |||||
76.83 | Analog output: |
This subclass is indented under subclass 76.77. Subject matter having an output quantity which varies smoothly over a continuous range of values rather than in discrete steps. | |
77.11 | Nonscanning: |
This subclass is indented under subclass 76.19. Subject matter wherein the frequency components of the spectrum are acquired simultaneously. | |
84 | |||
This subclass is indented under subclass 83. Subject matter having a wave guide.
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85 | |||||
This subclass is indented under subclass 83. Subject matter having means to change the frequency of a
voltage or current into another frequency which varies in correspondence therewith.
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86 | |||||
This subclass is indented under subclass 83. Subject matter in which one of the electric voltages or
currents is obtained from a polyphase source.
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87 | |||||
This subclass is indented under subclass 83. Subject matter having a lamp or space discharge device or
nonlinear device.
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88 | |||||||
This subclass is indented under subclass 87. Subject matter having a cathode ray tube.
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89 | |||
This subclass is indented under subclass 87. Subject matter having a space discharge device of the discharge
control type.
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90 | |||||
This subclass is indented under subclass 83. Subject matter having an indicating instrument of the type
which has a stator element which produces a magnetic field by means
of a supplied current.
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91 | |||||
This subclass is indented under subclass 83. Subject matter for indicating if two voltages or currents
are in phase.
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92 | |||||||||
This subclass is indented under subclass 76. Subject matter having fluid means as a part thereof.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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93 | |||
This subclass is indented under subclass 92. Subject matter in which the fluid is electrically conductive
and having means to cause electricity to flow through the fluid.
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94 | |||||
This subclass is indented under subclass 93. Subject matter in which the fluid is electrolytic and having
means to cause an electrolytic action to take place.
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95 | |||||||
This subclass is indented under subclass 76. Subject matter having a wave guide or electrically long
line.
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96 | |||||||||
This subclass is indented under subclass 76. Subject matter utilizing radiant energy means as a part
thereof.
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97 | |||||
This subclass is indented under subclass 96. Subject matter having means to direct the radiant energy
in beams.
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98 | |||||
This subclass is indented under subclass 76. Subject matter having means for actively bringing a state
of balance between mechanical or electrical forces into existence.
| |||||
99 | |||||
This subclass is indented under subclass 98. Subject matter having automatic means for bringing about
the state of balance.
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100 | |||||
This subclass is indented under subclass 99. Subject matter in which the result of the balancing operation
is recorded.
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101 | |||||||||
This subclass is indented under subclass 76. Subject matter having a Wheatstone bridge and having means
to indicate the current which results because of the unbalance.
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102 | |||||||||
This subclass is indented under subclass 76. Subject matter which is responsive to a transient or which
is used to determine some characteristic of a transient or some
characteristic of a portion of a wave form of a cyclic wave.
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| |||||||||
103 | |||||||||
This subclass is indented under subclass 76. Subject matter having means for indicating the demand for
electricity, averaged over a set period of time, or having means
for indicating the consumption of electricity exceeding a set minimum
or having means for indicating the maximum or minimum value of the
electricity.
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| |||||||||
104 | |||
This subclass is indented under subclass 103. Subject matter having means whose temperature is varied
in accordance with the electricity being measured and having means,
responsive to said temperature variation for indicating the demand,
excess consumption, maximum, or minimum.
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| |||
105 | |||
This subclass is indented under subclass 76. Subject matter having means which are significant because
of some thermal relationship.
| |||
106 | |||||||||
This subclass is indented under subclass 105. Subject matter having means whose temperature is varied
in accordance with the electricity being measured and having means,
responsive to said temperature variation, for indicating the result
of the measurement.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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| |||||||||
107 | |||||
This subclass is indented under subclass 76. Subject matter responsive to the voltages or currents in
a polyphase system.
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108 | |
This subclass is indented under subclass 107. Subject matter for measuring the positive, negative or zero sequence of current of voltage in the polyphase system or responsive to one of these factors. | |
109 | |||||||
This subclass is indented under subclass 76. Subject matter having means for utilizing electrostatic
attraction or repulsion or piezo-electric action in order to respond
to the electricity.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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110 | |||||||
This subclass is indented under subclass 76. Subject matter for protecting the electric measuring apparatus
or for combating attempts to cause the meter to read inaccurately.
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111 | |||||||||
This subclass is indented under subclass 76. Subject matter having means to store the electricity which
is being measured.
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112 | |||||||||
This subclass is indented under subclass 111. Subject matter in which the electricity is stored in an
extended tape or wire or in a sheet medium.
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113 | |||||||
This subclass is indented under subclass 76. Subject matter for recording the result of the measurement
of the electricity.
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114 | |||||||||
This subclass is indented under subclass 76. Subject matter having plural meters.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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115 | |||
This subclass is indented under subclass 76. Subject matter having plural ranges, plural scales, or plural
registration rates.
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116 | |||||||
This subclass is indented under subclass 115. Subject matter having a register.
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117 | |||||||
This subclass is indented under subclass 76. Subject matter having magnetic means in which a significant
amount of saturation occurs during the operation thereof.
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118 | |||||||||
This subclass is indented under subclass 76. Subject matter having means to modulate the voltage or current
being measured onto a carrier wave and having further means to demodulate
the resulting modulating carrier wave into a replica of the original
voltage or current.
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119 | |||||
This subclass is indented under subclass 76. Subject matter having a rectifier.
SEE OR SEARCH CLASS:
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120 | |||||||||
This subclass is indented under subclass 76. Subject matter having means to transform the voltage or
current to be measured into a different current or voltage and having
means to measure said different voltage or current.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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121 | |||||||||
This subclass is indented under subclass 76. Subject matter having a cathode-ray tube.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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122 | |||||||||
This subclass is indented under subclass 76. Subject matter having a gaseous discharge device.
SEE OR SEARCH CLASS:
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123 | |||||||||
This subclass is indented under subclass 76. Subject matter having an amplifier or having a space discharge
device.
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124 | |||||
This subclass is indented under subclass 123. Subject matter having an inverted amplifier.
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125 | |||||||||
This subclass is indented under subclass 76. Subject matter having means to control the mechanical vibrations
which result because of inertia, elasticity, and damping or having means
to control vibrations which arise outside or inside the measuring
means.
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| |||||||||
126 | |||||||||||
This subclass is indented under subclass 76. Subject matter having means for coupling the measuring device
to the source of current or voltage being measured.
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127 | |||||||
This subclass is indented under subclass 126. Subject matter in which the coupling means is a transformer.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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128 | |||||
This subclass is indented under subclass 126. Subject matter in which the coupling means is a selective
filter.
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129 | |||||
This subclass is indented under subclass 76. Subject matter having pole piece means so constructed that
they will admit an input conductor without cutting or disconnecting
said conductor.
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130 | |||
This subclass is indented under subclass 76. Subject matter having means for self-calibrating the instrument.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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131 | |||
This subclass is indented under subclass 76. Subject matter in which the measuring instrument indications
are of the suppressed zero type.
| |||
132 | |||
This subclass is indented under subclass 76. Subject matter in which the measuring instrument indications
are of the nonlinear type.
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133 | |||||||||
This subclass is indented under subclass 76. Subject matter for giving a nonquantitative indication.
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134 | |||||||||
This subclass is indented under subclass 76. Subject matter having a commutator or having a reversing
switch or having a pulsating switch.
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135 | |||||
This subclass is indented under subclass 134. Subject matter having a rotor which oscillates between two
positions.
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136 | |||||||
This subclass is indented under subclass 76. Subject matter having a rolling ball or a rolling wheel.
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137 | |||||||||||
This subclass is indented under subclass 76. Subject matter having a rotor upon which torque is exerted
by means of an electo-magnetic field which produces eddy current
in the rotor.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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138 | |||||||||
This subclass is indented under subclass 137. Subject matter having means to vary the time-phase relationship
between two alternating magnetic fields.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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139 | |||||||||||||||||
This subclass is indented under subclass 76. Subject matter having rotary motor driving means which rotate
constantly, independently of the electricity being measured, or
having time control means or having means which oscillate.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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140 | |||||||||
This subclass is indented under subclass 76. Subject matter having plural inputs to the measuring means.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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141 | |||||
This subclass is indented under subclass 140. Subject matter for measuring volt amperes.
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142 | |||||||
This subclass is indented under subclass 140. Subject matter for measuring watts.
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| |||||||
143 | |||||||
This subclass is indented under subclass 76. Subject matter having plural active motor elements.
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| |||||||
144 | |||||||||||
This subclass is indented under subclass 76. Subject matter having a stationary means to produce a magnetic
field by the flow of electricity through a winding.
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145 | |||
This subclass is indented under subclass 144. Subject matter having a core armature which is attracted
by the magnetic field and which moves, under said attraction, along
its own axis.
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146 | |||||||
This subclass is indented under subclass 144. Subject matter having a permanent magnet.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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147 | |||
This subclass is indented under subclass 144. Subject matter having an iron rotor.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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149 | |||||||||
This subclass is indented under subclass 76. Subject matter having a probe, a prod or a specific terminal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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150 | |||||
This subclass is indented under subclass 76. Subject matter having a rotor which has a coil which is
eccentrically mounted with respect to the axis of the rotor.
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151 | |||||||||||
This subclass is indented under subclass 76. Subject matter having a permanent magnet.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
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152 | |||||||||||
This subclass is indented under subclass 151. Subject matter in which the permanent magnet is associated
with an eddy current means and the permanent magnet acts as a drag
for the eddy current means.
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153 | |||
This subclass is indented under subclass 76. Subject matter having a register.
| |||
154 | |||
This subclass is indented under subclass 76. Subject matter having a rotor.
| |||
155 | |||||||||
This subclass is indented under subclass 154. Subject matter having significant bearing or pivot structure.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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156 | |||||||
This subclass is indented under subclass 76. Subject matter having a casing for the instrument.
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157 | |||||||||||
This subclass is indented under subclass 76. Subject matter combined with some other type of subject
matter.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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160 | |||||||||||||||||
This subclass is indented under the class definition. Subject matter wherein are provided processes or means to
produce an electrical signal representative of the time rate of
change of position (speed) of a physical element
and to indicate, in response to said signal, said
time rate.
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| |||||||||||||||||
161 | |||||||||
This subclass is indented under subclass 160. Subject matter in which means are provided for comparing
one speed signal with another speed signal or a reference signal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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162 | |||||||||||||||
This subclass is indented under subclass 160. Subject matter including means producing an electrical signal
representative of the time rate of change of speed or a physical
object.
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163 | |||||||
This subclass is indented under subclass 160. Subject matter in which means for producing a signal representative
of speed includes means to convert mechanical motion into an electrical signal
whose output amplitude is a function of the speed being measured, and
in which the indicating means measures said amplitude.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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| |||||||
164 | |||||
This subclass is indented under subclass 163. Subject matter in which the electrical generator includes
a conductive, nonferromagnetic armature whose movement
is representative of the speed being measured, means to
induce an electric current in said armature and means responsive
to the current to indicate the speed of the armature.
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165 | |||||||||
This subclass is indented under subclass 163. Subject matter combined with means to indicate the sense
of motion (e.g., forward or
backward, clockwise or counter clockwise) within
a given path, of the object whose speed is being measured.
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166 | |||||
This subclass is indented under subclass 160. Subject matter in which the signal producing means produces
a periodic electrical signal whose frequency is a function of the
speed being measured.
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167 | |||
This subclass is indented under subclass 166. Subject matter including electro-magnetic, indicator
driving means energized by the speed signal to produce a rotating
magnetic field whose rotation is synchronized with the frequency
of the speed signal.
| |||
168 | |||
This subclass is indented under subclass 166. Subject matter in which the means for producing a signal
includes an electrical circuit breaker actuated at a frequency representative of
the speed being measured.
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169 | |
This subclass is indented under subclass 168. Subject matter in which the switch is also a component of an internal combustion engine ignition system. | |
170 | |
This subclass is indented under subclass 169. Subject matter wherein the speed measuring means is connected to the secondary circuit of the ignition system; the voltage fluctuations of the secondary circuit thereby producing the speed signal. | |
171 | |||||
This subclass is indented under subclass 168. Subject matter combined with means to indicate the distance
the object whose speed is being measured has traveled during the
speed measuring interval.
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172 | |
This subclass is indented under subclass 166. Subject matter in which means for producing a speed signal includes a recording medium and means to move it at a speed proportional to speed being measured. | |
173 | |||||||||
This subclass is indented under subclass 166. Subject matter in which the means for producing a speed
signal included means producing a magnetic field and further means
sensitive to changes in the field to produce an electrical signal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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174 | |||||
This subclass is indented under subclass 173. Subject matter in which the means for producing a magnetic
field includes a permanent magnet.
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175 | |
This subclass is indented under subclass 166. Subject matter in which means for producing a speed signal includes means responsive to radiant energy (i.e., electromagnetic or atomic radiation) to produce or alter an electric current. | |
176 | |||||||
This subclass is indented under subclass 160. Subject matter in which the means for producing the electric
speed signal includes a variable circuit element whose impedance
varies as a function of the position of the object in the path along
which its speed is being measured.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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| |||||||
177 | |||||
This subclass is indented under subclass 160. Subject matter in which the means producing an electric
speed signal is responsive to the supply voltage or current of an
electric motor.
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178 | |||||||||
This subclass is indented under subclass 160. Subject matter wherein the means for producing a speed signal
includes means responsive to the passage (event) of
an object past a plurality spaced locations.
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| |||||||||
179 | |
This subclass is indented under subclass 178. Subject matter in which the means responsive to the passage of an object is sensitive to magnetic field variations caused by passage of the object through magnetic field. | |
180 | |||||
This subclass is indented under subclass 178. Subject matter in which the means responsive to the passage
of an object includes an electrical switch actuated directly by
the object.
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| |||||
200 | MAGNETIC: | ||||||||||||||||||||||||||||||||
This subclass is indented under the class definition. Subject matter which includes apparatus to sense and indicate
the sensing of a magnetic field and elements or subcombinations
of apparatus to sense and indicate the sensing of the magnetic field
where not elsewhere provided.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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201 | Susceptibility: | ||||||
This subclass is indented under subclass 200. Subject matter wherein the apparatus to sense and indicate
the sensing of a magnetic field is responsive to a magnetic field
modified by material which has magnetic properties, the indication
of the sensing being directly or indirectly representative of the
ease with which the material can be magnetized.
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| |||||||
202 | Calibration: | ||||||||||||||
This subclass is indented under subclass 200. Subject matter which includes means to present a known magnetic
field to the apparatus to sense and indicate the sensing of the
magnetic field so that the sensing and indication can be noted to
see if the apparatus to sense and indicate gives the correct response
to the sensed known magnetic field.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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203 | Curie point determination: | ||||||||||||||||||
This subclass is indented under subclass 200. Subject matter which includes means to create a magnetic
field in which is placed a heated ferromagnetic material, the
apparatus to sense and indicate being responsive to the magnetic field
modified by the heated material to determine whether the heated
material is at least at or below the critical temperature at which
the heated material loses its ferromagnetism.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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204 | Fluid material examination: | ||||||||||||||||||||
This subclass is indented under subclass 200. Subject matter which includes a magnetic field in which
a gas or liquid material is placed for examination by the magnetic
field, the apparatus to sense and indicate being responsive
to the field modified by the gas or liquid material to give an indication
of some property of the material examined.
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205 | Permanent magnet testing: | ||||||||||
This subclass is indented under subclass 200. Subject matter which involves the testing of permanent magnets
which have their own static magnetic field, the apparatus
to sense and indicate the sensing of the field including a field sensing
member placed in the field and an indicator responsive to the member.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
206 | Movable random length material measurement: | ||||||||||
This subclass is indented under subclass 200. Subject matter which includes a movable magnetizable member
and a magnetic marking means to form magnetic field marks on the member
in the direction of its movement, and wherein the apparatus
to sense and indicate the sensing of the magnetic field is responsive
to the marks and indicates the sum of the marks as an indication
of its length or compares the sensed marks to indicate a deviation
of its length between markings.
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| |||||||||||
207.11 | Displacement: | ||||
This subclass is indented under subclass 200. Subject matter which includes a device to note the change
in position of one member with respect to another member, the
device having means to create a magnetic field and having either (1) the
means supported by one of the members, or (2) the
members included in a magnetic circuit in the magnetic field, the apparatus
to sense and indicate the sensing of the magnetic field being responsive
to the change in the magnetic field to note the movement of one
of the members with respect to the other member.
SEE OR SEARCH CLASS:
| |||||
207.12 | Compensation for measurement: |
This subclass is indented under subclass 207.11. Subject matter which includes a device, circuit or circuit component that corrects an undesirable condition which affects the displacement measurement. | |
207.13 | Having particular sensor means: |
This subclass is indented under subclass 207.11. Subject matter which includes a device having a specific function or structure that detects the presence of, or a change in the level of a magnetic field. | |
207.14 | Diverse sensors: | ||||
This subclass is indented under subclass 207.13. Subject matter in which two or more different types of sensors
are used simultaneously or alternatively.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
207.15 | Inductive: | ||
This subclass is indented under subclass 207.13. Subject matter wherein sensing device is an inductor.
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207.16 | Electrically energized: |
This subclass is indented under subclass 207.15. Subject matter containing one or more sources of electrical energy for energizing sensor means to produce a magnetic field. | |
207.17 | Separate pick-up: |
This subclass is indented under subclass 207.16. Subject matter in which a magnetic sensor is a receiver means that generates a signal in response to an electrically energized transmitter. | |
207.18 | Differential type (e.g., LVDT): | ||
This subclass is indented under subclass 207.16. Subject matter wherein (1) a sensor measures
two separate stimuli and provides an output proportionate to the
difference between them or (2) a transformer uses
two or more primary sensor signals, or (3) a
transformer uses two or more secondary sensor signals to provide
a differential output.
| |||
207.19 | Differential bridge circuit: |
This subclass is indented under subclass 207.16. Subject matter wherein an imbalance in a bridge circuit is based upon the difference between at least two inductive sensors forming at least two legs of the bridge circuit. | |
207.2 | Hall effect: | ||||||||
This subclass is indented under subclass 207.13. Subject matter wherein the sensor uses the Hall effect to
give an output voltage proportional to magnetic field strength.
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207.21 | Magnetoresistive: | ||||
This subclass is indented under subclass 207.13. Subject matter wherein a sensor is a semiconductor material
in which the electrical resistance is a function of the applied
magnetic field.
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207.22 | Having particular sensed object: | ||
This subclass is indented under subclass 207.11. Subject matter in which a specific configuration or structure
of an object is such that its motion may be detected by measuring
a change of a magnetic property associated with the object.
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207.23 | Plural measurements (e.g., linear and rotary): | ||
This subclass is indented under subclass 207.11. Subject matter wherein there are two or more different types
of position measurement.
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207.24 | Linear: |
This subclass is indented under subclass 207.11. Subject matter in which motion in a straight line is determined. | |
207.25 | Rotary: |
This subclass is indented under subclass 207.11. Subject matter in which (1) angular displacement is determined or (2) deviation from an angular path is measured. | |
207.26 | Approach or retreat: |
This subclass is indented under subclass 207.11. Subject matter in which the (1) the sensing device gives an indication when approaching or being approached by a magnetic field, or (2) the sensing device gives an indication when retreating or being retreated by a magnetic field, or (3) an object approaches or retreats from the sensor"s magnetic field. | |
209 | Stress in material measurement: | ||||||||||||||
This subclass is indented under subclass 200. Subject matter which includes apparatus to note the strain
within material having means to form a magnetic field in which the
material is placed, or means to form a magnetic field in the
material, the apparatus to sense a magnetic field and indicate
the sensing of the magnetic field senses the magnetic field modified
by the material or the field produced in the material and indicates
the result of the test, the indication being a measure
of the strain in the material as a result of some type of force
imparted to or within the material.
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210 | Magnetic information storage element testing: | ||||||||||||||
This subclass is indented under subclass 200. Subject matter which includes a magnetic recorder element
to be tested magnetically, means to create a magnetic test
signal to be either sensed by the tested element or recorded on
the tested element, the said apparatus to sense the magnetic
field either (1) being or including the tested
element itself, or (2) sensing the recorded
test signal on the tested element, the said apparatus to
indicate the sensing of the test magnetic signal being responsive
to the apparatus to sense the signal or to the recorder element
tested.
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211 | Memory core storage element testing: | ||||
This subclass is indented under subclass 210. Subject matter wherein the element tested is a nonmoving
toroid magnetic memory element.
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212 | Dynamic information element testing: | ||||
This subclass is indented under subclass 210. Subject matter wherein the element tested is a movable magnetic
storage element.
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213 | Magnetic recording medium on magnetized object records object field: | ||||||||||||
This subclass is indented under subclass 200. Subject matter wherein the apparatus to sense and indicate
the sensing of a magnetic field includes a magnetic recording medium
applied to magnetized material so that any stray or leakage field
from the magnetized material induces a magnetic field in the recording medium
which is indicative of flaws in the material tested.
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214 | By paramagnetic particles: | ||||||||
This subclass is indented under subclass 200. Subject matter which includes a magnetic field detector
composed of particles including ferromagnetic material which, when
placed in the magnetic field, align themselves in the direction
of the tested magnetic field to form a visual representation of
the tested magnetic field.
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215 | With pattern enhancing additive: | ||||||
This subclass is indented under subclass 214. Subject matter wherein some chemical, composition, material, or
mixture of materials is added to the paramagnetic particles to enhance the
viewing of the particles with respect to the object tested after
the particles are magnetized and attracted to the magnetized object
tested.
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216 | Flaw testing: | ||||||||||||||||||||||
This subclass is indented under subclass 214. Subject matter wherein the paramagnetic particles are used
to test an object made of magnetic material and which includes means
to magnetize the object to be tested to cause the parmagnetic particles, when
upon the magnetized object, to become magnetized and adhere
to the magnetized object or at a location where a discontinuity
occurs when present in the object, the adhering magnetized
particles arranging themselves in the pattern of the flux exiting from
the object or in the pattern of a discontinuity when present in
the object.
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217 | Railroad rail flaw testing: | ||||||||||
This subclass is indented under subclass 200. Subject matter which includes means to magnetize a railroad
rail to create a test magnetic field in the rail, the apparatus
to sense and indicate the sensing of the magnetic field being responsive
to the field of the rail to note any change in the indication from
the normal known magnetic pattern of the magnetized rail.
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218 | Rail joint cutout: |
This subclass is indented under subclass 217. Subject matter wherein the tested rail has ends and is joined to other rails by connectors forming joints between the rails, and includes means to prevent the sensing and indicating of the magnetic field of the joints by the apparatus to sense and indicate the sensing of the magnetic field of the rail. | |
219 | Magnetic sensor within material: |
This subclass is indented under subclass 200. Subject matter wherein the apparatus to sense a magnetic field includes a sensor placed within tested material which has magnetic field associated with it, the apparatus to indicate the sensing of a magnetic field being responsive to the magnetic field of the material sensed by the sensor. | |
220 | Sensor supported, positioned, or moved within pipe: | ||||||||||||||
This subclass is indented under subclass 219. Subject matter wherein the material tested is a tube and
the sensor has (1) means to transport the sensor
through the tube, or (2) a support to position
or hold the sensor within the tube.
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221 | Borehole pipe testing: | ||||||||||||||||||
This subclass is indented under subclass 220. Subject matter wherein the tested pipe is a casing or a
borehole in the earth.
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222 | Hysteresis or eddy current loss testing: | ||||||||||
This subclass is indented under subclass 200. Subject matter wherein the apparatus to sense and indicate
the sensing of a magnetic field includes apparatus to measure the
loss of energy of a cyclically varying magnetic field resulting
from it passage through a magnetic material or through a material
in which eddy currents are induced by the varying magnetic field.
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223 | Hysteresis loop curve display or recording: | ||||||
This subclass is indented under subclass 200. Subject matter wherein the apparatus to sense and indicate
the sensing of a magnetic field is responsive to a material magnetized
by a changing magnetic field going from a minimum to a maximum in
one direction and than going from a minimum to a maximum in the opposite
direction and produces a signal applied to a visual display or recorder
which is the magnetization curve of the material.
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224 | With temperature control of material or element of test circuit: | ||||||||||||||||||
This subclass is indented under subclass 200. Subject matter wherein the apparatus to sense and indicate
the sensing of a magnetic field is also responsive to magnetic fields
modified by tested materials placed in a magnetic field and includes
means to control the temperature of the material tested or some
element of the apparatus to sense and indicate the sensing of the
magnetic field.
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225 | With compensation for test variable: | ||||||||
This subclass is indented under subclass 200. Subject matter wherein the apparatus to sense and indicate
the sensing of the magnetic field includes structure to correct
for some condition which affects the test.
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226 | Combined: | ||||||||||||
This subclass is indented under subclass 200. Subject matter wherein the apparatus to sense and indicate
the sensing of a magnetic field is combined with the subject matter
of another class when not provided for elsewhere.
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227 | Plural tests: | ||||||
This subclass is indented under subclass 200. Subject matter wherein (1) two or more
variable magnetic parameters are separately sensed and indicated, at
least one of which is sensed and indicated by apparatus to sense
and indicate the sensing of a magnetic field, or (2) at least
one of two or more separate tests is a magnetic test.
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228 | With means to create magnetic field to test material: |
This subclass is indented under subclass 200. Subject matter which includes structure to form a magnetic field for testing material, the apparatus to sense and indicate the sensing of the magnetic field being responsive to the field as modified by the material tested. | |
229 | Thickness measuring: | ||||||||||||||
This subclass is indented under subclass 228. Subject matter wherein the material tested has two different
surfaces, and the distance between the surfaces is measured
by placing the two surfaces in the magnetic field and the apparatus
to sense and indicate the sensing of the field is responsive to
the field as modified by the material between the two surfaces to thus
sense and indicate the distance between the surfaces.
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230 | Layer of layered material: |
This subclass is indented under subclass 229. Subject matter wherein the material tested is composed of dissimilar layered material and the thickness of one layer is found by placing the layered material in the magnetic field and the apparatus to sense and indicate the sensing of the magnetic field is responsive to the magnetic field modified by the layer to thus sense and indicate the depth of the layer. | |
231 | With backing member: | ||
This subclass is indented under subclass 229. Subject matter which includes a part next to one surface
of the material and the apparatus to sense and indicate the sensing
of the magnetic field next to the other surface opposite to the part; the
part and the apparatus cooperating with each other to place tested
material in the same relation each time with respect to the magnetic
field and the apparatus to sense and indicate the sensing of the
field.
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232 | Plural magnetic fields in material: | ||
This subclass is indented under subclass 228. Subject matter which includes means to create two or more
magnetic fields in the tested material, the apparatus to
sense and indicate the sensing of the magnetic field being responsive to
the fields modified by the material to indicate some characteristic
of the material.
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233 | With phase sensitive element: | ||
This subclass is indented under subclass 228. Subject matter wherein the apparatus to sense and indicate
the sensing of the magnetic field modified by the material tested
includes an element which compares the electrical phase of the signal
as received by the apparatus with the phase of the magnetic field
used in the test, the difference in phase being used by
the apparatus to show some characteristic of the tested material.
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234 | Electrically energized nonforce type sensor: | ||||||||||||||
This subclass is indented under subclass 228. Subject matter wherein the apparatus to sense and indicate
the sensing of the magnetic field modified by the material includes
a sensor which requires an electrical current to pass therethrough, and
which senses and indicates the magnetic field other than by a force
measurement.
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235 | Noncoil type: | ||||||||
This subclass is indented under subclass 234. Subject matter wherein the energized sensor does not rely
solely on inductive effects.
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236 | Oscillator type: | ||||
This subclass is indented under subclass 234. Subject matter wherein the sensor is part of a frequency
generator whereby the material-modified magnetic field
is sensed by the sensor to control the frequency or the amplitude
of the electrical wave generated by the frequency generator.
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237 | Material flaw testing: |
This subclass is indented under subclass 236. Subject matter wherein the material is magnetically tested for defects in the material. | |
238 | Material flaw testing: | ||||||||||||
This subclass is indented under subclass 234. Subject matter wherein the material is magnetically tested
for defects in the material.
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239 | Induced voltage-type sensor: | ||||||||||||||
This subclass is indented under subclass 228. Subject matter wherein a voltage is induced in an electrical
coil as a result of the change in the magnetic test field caused
by the material tested.
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240 | Material flaw testing: | ||||||
This subclass is indented under subclass 239. Subject matter wherein the material is magnetically tested
for defects in the material.
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241 | Opposed induced voltage sensors: |
This subclass is indented under subclass 240. Subject matter wherein there are two or more magnetic coil sensors of the magnetic field modified by the test material, the apparatus to indicate the sensing of the field modified by the test material being connected to two or more of the sensors to indicate the difference in the voltages induced in the sensors. | |
242 | Plural sensors: |
This subclass is indented under subclass 240. Subject matter wherein there are two or more magnetic coil sensors of the magnetic field modified by the test material, the apparatus to indicate the sensing of the field modified by the test material being connected to two or more of the sensors to indicate the combined sensing of the material-modified field. | |
243 | Plural sensors: |
This subclass is indented under subclass 239. Subject matter wherein there are two or more coil sensors of the induced voltage type, the apparatus to indicate the sensing of the magnetic field being connected to two or more of the sensors to note the combined sensing of material-modified magnetic field. | |
244 | Magnetometers: | ||||||||||||||
This subclass is indented under subclass 200. Subject matter wherein the apparatus to sense and indicate
the sensing of a magnetic field is responsive to the intensity of
the sensed magnetic field or the direction of the sensed magnetic
field.
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244.1 | Optical: | ||||||||||||
This subclass is indented under subclass 244. Subject matter wherein the apparatus or method for sensing
and indicating a magnetic field includes a medium which responds
to the magnetic field by altering the propagation (e.g., path, passage, etc.) or
a property (e.g., polarization) of
radiant light energy therethrough, where the output of
the medium is representative of the magnetic field measured.
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245 | Plural sensor axis misalignment correction: |
This subclass is indented under subclass 244. Subject matter wherein the apparatus to sense and indicate the sensing of the magnetic field includes plural magnetic field sensors aligned with each other, the sensors when not aligned with each other producing errors in the magnetic field measurement, and means responsive to the sensing of the magnetic field by both sensors to adjust for the misalignment of the sensors, the apparatus to indicate being connected to the sensors. | |
246 | With means to align field sensor with magnetic field sensed: | ||
This subclass is indented under subclass 244. Subject matter wherein the apparatus to sense and indicate
the sensing of the magnetic field includes a movable magnetic field
sensor of the tested magnetic field and apparatus responsive to
the magnetic field connected to the magnetic sensor responsive to
the magnetic field to physically move the sensor to a predetermined
position with respect to the sensed magnetic field.
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247 | Nonparallel plural magnetic sensors: | ||||||||||||
This subclass is indented under subclass 244. Subject matter wherein the apparatus to sense the magnetic
field includes several magnetic sensors positioned angularly with
respect to each other so that an axis of another sensor will intersect
the other axis and the apparatus to indicate is connected to the
several sensors to note the combined sensing of the tested magnetic
field.
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248 | Superconductive magnetometers: | ||||||||||||||||||||
This subclass is indented under subclass 244. Subject matter wherein the apparatus to sense and indicate
the sensing of a magnetic field includes a sensor of the magnetic
field or a magnetic shield for the apparatus to sense a magnetic
field made of a material which has nearly zero resistance in one
state and appreciable resistance in a second state.
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249 | Thin film magnetometers: | ||||||||||||||||
This subclass is indented under subclass 244. Subject matter wherein the apparatus to sense a magnetic
field includes a thin single domain ferromagnetic film magnetized
in a predetermined direction known as the easy axis of the film, the
magnetization of the film upon placement in an external magnetic
field to be tested assumes a different direction which is the resultant
field vector of the film"s easy axis and the tested field axis, means
to cyclically change the resultant magnetic field axis of the film, sensing
means to note the cyclical changes in the magnetic field of the
film caused by the shift of the resultant magnetic field due to
the means to cyclically change the resultant magnetic field axis, and
the apparatus to indicate being connected to the sensing means to
note the result of the cyclical changes in the film.
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250 | Electronic tube or microwave magnetometers: | ||||||||||||||
This subclass is indented under subclass 244. Subject matter wherein the apparatus to sense and indicate
the sensing of a magnetic field includes (1) an
ionizable gas tube magnetic field sensor having electrodes connected
to appropriate voltages wherein the tested magnetic field causes
the gas to ionize at different electrode voltages dependent upon
the strength of the magnetic field, (2) an
energized vacuum tube magnetic field sensor having a cathode ray beam
and one or more electrodes or a fluorescent screen connected to
appropriate voltages to attract the beam wherein the tested magnetic field
acts to deflect the beam an amount dependent upon the strength of
the tested field, or (3) an electrically
conductive enclosure magnetic field sensor to which a signal is
applied having a ferromagnetic material in the enclosure wherein
the tested field affects the material to change the signal passed
through the enclosure dependent upon the strength of the field.
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251 | Hall plate magnetometers: | ||||||||||||||||||||||||||
This subclass is indented under subclass 244. Subject matter wherein the apparatus to sense a magnetic
field includes a thin sheet of conductive material whose thickness
is small compared to a dimension of the sides of the sheet, electrical
means connected at first diametrical points on the edge of the sheet
to pass an electrical current through the sheet, electrical
output means connected to second diametrical points on the edge
of the sheet at right angles to the first diametrical points and
the apparatus to indicate being connected to the electrical output
means whereby the solid-state sheet when placed in a magnetic
field to be measured normal to the first diametrical points will
cause a voltage, consistent with the intensity of the tested
magnetic field, at the second diametrical points, which
voltage is sensed by the apparatus to indicate.
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252 | Semiconductor type solid-state or magneto-resistive magnetometers: | ||||||||||||||||||||||
This subclass is indented under subclass 244. Subject matter wherein the apparatus to sense and indicate
the sensing of a magnetic field includes (1) a
resistance of magnetic material having a current flow there-through
and an indicator connected to the resistance whereby the magnetic
field tested passing through the material changes the current noted
on the indicator, or (2) a sensor of
semiconductor material having a current flow therethrough and an
indicator connected to the sensor to note the change in current
caused by the tested magnetic field acting on the sensor.
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253 | Saturable core magnetometers: | ||||||||||||||||
This subclass is indented under subclass 244. Subject matter wherein the apparatus to sense a magnetic
field includes a ferromagnetic core having an alternating magnetic
flux passing through the core, the magnetic field tested being
concurrently passed through the core with the alternating flux and
an electrical coil to sense the change in the magnetic flux caused by
the magnetic field in the core, the apparatus to indicate
being responsive to the electrical coil sensing the magnetic field
change in the core.
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254 | Second harmonic type: |
This subclass is indented under subclass 253. Subject matter wherein the electrical coil sensing the change in the magnetic field in the core is connected to the apparatus to indicate by means of a circuit which passes only a harmonic signal of the alternating magnetic flux impressed upon the core so that the apparatus to indicate the result of the sensing is responsive only to the harmonic signal passed by the circuit. | |
255 | Peak voltage type: |
This subclass is indented under subclass 253. Subject matter wherein the composite alternating flux and the magnetic field tested produce a cyclically alternating magnetic flux in the core which will produce peak flux values each half cyclic of the alternating flux although the peaks are not symmetrical half waves of flux, and wherein electrical circuitry connected between the electrical sensing coil and the apparatus to indicate the sensing of the field determines the (1) peak value, (2) the difference in the peak value, or (3) the average value of the voltage induced in the sensing coil caused by the alternate half cycles of the flux in the core. | |
256 | Energized movable sensing coil magnetometers: | ||||||||
This subclass is indented under subclass 244. Subject matter wherein the apparatus to sense a magnetic
field is a movable electrically energized magnetic field sensing
coil, the magnetic field created by the coil interacts
with the magnetic field tested to produce a force which moves the
sensing coil, and the apparatus to indicate the sensing
of the field is connected to the coil to note the movement of the
coil.
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257 | Moving coil magnetometer: | ||||||||||||
This subclass is indented under subclass 244. Subject matter wherein the apparatus to sense a magnetic
field is a movable magnetic field sensing coil placed within the
field to be tested and has means to move the movable coil, and the
apparatus to indicate the sensing of the magnetic field is connected
to the sensing coil whereby the coil moving in the tested field
has induced therein a voltage proportional to the number of turns
of the coil and the time it takes for the moving coil to complete
a cycle of movement.
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258 | Fixed coil-magnetometer: | ||||
This subclass is indented under subclass 244. Subject matter wherein the apparatus to sense a magnetic
field is a stationary electrical coil placed in a changing magnetic
field to be tested, and the apparatus to indicate the sensing of
the field is connected to the coil whereby the changing magnetic
field induces in the coil a voltage proportional to the number of
turns of the coil and the time it takes the changing field to make
a complete change.
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259 | Movable magnet or magnetic member interacts with magnetic field: | ||||||||||||||
This subclass is indented under subclass 244. Subject matter with a movable permanent magnet acting as
a magnetic field detector or a movable member of low magnetic reluctance acting
as a magnetic field detector which includes material that can be
temporarily magnetized by the tested field, the movable
magnet"s magnetic field or the magnetic field of the temporarily
magnetized material reacting to the tested magnetic field by moving
until the force between the tested magnetic field and the movable
magnet or the movable temporarily magnetized material is zero.
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260 | Magnetic field detection devices: | ||||||||||||||||||||||||||||
This subclass is indented under subclass 200. Subject matter which includes magnetic field sensing devices, per
se, which are not classified elsewhere.
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261 | With support for article: | ||||||||||
This subclass is indented under subclass 260. Subject matter wherein material is to be examined magnetically
by a magnetic field sensing device and structure is provided to
hold the material with respect to the sensor so that the sensing
can be performed.
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262 | Magnetic test structure elements: | ||||||
This subclass is indented under subclass 200. Subject matter which includes supports for tested material
and sensing devices, and other elements not provided for
elsewhere.
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263 | Current through test material forms test magnetic field: | ||||||||||||
This subclass is indented under subclass 200. Subject matter which includes an electric circuit including
terminals to contact a material to be magnetically tested so that
current through the material and the terminals create a magnetic
field in the material for test purposes.
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300 | PARTICLE PRECESSION RESONANCE: | ||||||
This subclass is indented under the class definition. Subject matter relating to the measurement of the energy
interchange between precessing atomic particles in a surrounding electromagnetic
field.
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301 | Using magnetometer: | ||||
This subclass is indented under subclass 300. Subject matter utilizing means to measure the effects of
external magnetic fields upon the resonance of a host material in
a controlled electromagnetic field.
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302 | To determine direction: | ||
This subclass is indented under subclass 301. Subject matter wherein the magnetometer is used to determine
the direction of an external magnetic field relative to the location
of the magnetometer.
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303 | Using well logging device: | ||||
This subclass is indented under subclass 300. Subject matter in which earth subsurface materials are subjected
to magnetic resonance measurement by using a well logging device
to transport the components of the testing system to the location
to be tested.
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304 | Using optical pumping or sensing device: | ||
This subclass is indented under subclass 300. Subject matter in which a source of optical energy is applied
to the sample and a resultant amount of optical energy is reradiated
and sensed as a measure of a controlled interaction between the
metastable state of an atomic system and a steady magnetic field.
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305 | Having particular optical cell structure: |
This subclass is indented under subclass 304. Subject matter wherein the optical cell is designed to aid the sensing of reradiated optical energy. | |
306 | Determine fluid flow rate: | ||||||||
This subclass is indented under subclass 300. Subject matter in which a fluid is magnetically tagged as
a net magnetization in a predetermined direction at a tagging station
for detection at a known distance downstream at a detection station
within a measured time interval.
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307 | Using a nuclear resonance spectrometer system: | ||||||
This subclass is indented under subclass 300. Subject matter in which a spectrometer is used to induce
and measure resonance in the nucleus of an atom or group of atoms.
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308 | Including a test sample and control sample: |
This subclass is indented under subclass 307. Subject matter in which the nuclear resonance measurement of an unknown material is made by comparison with the resonance of a known material. | |
309 | To obtain localized resonance within a sample: |
This subclass is indented under subclass 307. Subject matter in which a measurement of nuclear magnetic resonance at controlled locations within a sample volume is obtained. | |
310 | By scanning sample frequency spectrum: | ||
This subclass is indented under subclass 307. Subject matter wherein the application of pulsed energy
to an atom nucleus over a controlled range of frequencies results
in relative energy absorption by the atom or atoms of a sample material
at resonance.
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311 | With signal decoupling: | ||
This subclass is indented under subclass 307. Subject matter in which feedback from the signal receiver
to the transmitter is suppressed or eliminated.
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312 | By spectrum storage and analysis: | ||
This subclass is indented under subclass 307. Subject matter wherein the nuclear resonant frequencies
of the sample material are transformed to memory and recalled for
computation.
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313 | Including polarizing magnetic field/radio frequency tuning: |
This subclass is indented under subclass 307. Subject matter wherein the degree of resolution at resonance is a result of adjustment between magnetic field strength and the frequency at which magnetic resonance occurs. | |
314 | With conditioning of transmitter signal: | ||
This subclass is indented under subclass 307. Subject matter in which the signal information applied to
the sample to induce resonance is made to conform with the predetermined
frequency or phase conditions of a transmitter.
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315 | With sample resonant frequency and temperature interdependence: |
This subclass is indented under subclass 307. Subject matter in which the nuclear resonance of the sample material is measured as a function of temperature, or the temperature of the sample material is measured as a function of nuclear resonance. | |
316 | Using an electron resonance spectrometer system: | ||||
This subclass is indented under subclass 300. Subject matter in which a spectrometer is used to induce
and measure electron resonance of a sample material.
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317 | Including a test sample and control sample: |
This subclass is indented under subclass 316. Subject matter wherein the electron resonance of an unknown material is made by comparison with the resonance of known material. | |
318 | Spectrometer components: | ||
This subclass is indented under subclass 300. Subject matter comprising structural components of a spectrometer.
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319 | Polarizing field magnet: |
This subclass is indented under subclass 318. Subject matter comprising the details of polarizing field magnet structure designed specifically for use with a spectrometer. | |
320 | With homogeneity control: |
This subclass is indented under subclass 319. Subject matter where magnetic circuit component design permits a uniform magnetic field gradient to be obtained. | |
321 | Sample holder structure: |
This subclass is indented under subclass 318. Subject matter comprising sample holders to be used specifically with a spectrometer. | |
322 | Electronic circuit elements: |
This subclass is indented under subclass 318. Subject matter comprising basic circuit elements which include active and passive devices designed specifically for use in a spectrometer system. | |
323 | OF GEOPHYSICAL SURFACE OR SUBSURFACE IN SITU: | ||||||||||||||||||||||||
This subclass is indented under the class definition. Subject matter relating to the determination of an electrical
characteristic of the subsurface of the earth in situ.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||||||||||
324 | Including borehole fluid investigation: | ||||||||||||
This subclass is indented under subclass 323. Subject matter relating to the determination of an electrical
property of the fluid in a well, borehole, or
other opening in the earth.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
325 | To determine fluid entry: | ||
This subclass is indented under subclass 324. Subject matter relating to the determination of the subsurface
location of the point or region of entry of a fluid into or out
of a well, borehole, or other opening in the earth.
SEE OR SEARCH CLASS:
| |||
326 | For small object detection or location: | ||||
This subclass is indented under subclass 323. Subject matter relating to the detection or location in
the earth of items which are relatively small compared to the size
of the geoligic formation in which they are found.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
327 | Using oscillator coupled search head: | ||||
This subclass is indented under subclass 326. Subject matter wherein one or more parameters of an oscillator, coupled
to or formed in conjunction with a coil or antenna moved over the region
of exploration, are monitored.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
328 | Of the beat frequency type: | ||
This subclass is indented under subclass 327. Subject matter having means for mixing the search head signal
with another signal to produce a difference frequency output.
SEE OR SEARCH CLASS:
| |||
329 | Using movable transmitter and receiver: | ||||||
This subclass is indented under subclass 326. Subject matter wherein an antenna or coil means for generating
an electromagnetic field and a separate pickup coil or antenna means responsive
to the electromagnetic field as modified by the object to be detected
are transported simultaneously over the area of investigation.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
330 | By aerial survey: | ||
This subclass is indented under subclass 323. Subject matter in which the determination of the electrical
property is made by means which are situated by a substantial distance
above the earth"s surface.
| |||
331 | For magnetic field detection: | ||
This subclass is indented under subclass 330. Subject matter having means for detecting a component of
the earth"s magnetic field.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
332 | With radiant energy or nonconductive-type transmitter: | ||||
This subclass is indented under subclass 323. Subject matter having means for radiating electrostatic
or electromagnetic energy into the earth and for measuring a circuit
parameter of the radiating means.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
333 | Within a borehole: | ||||||
This subclass is indented under subclass 332. Subject matter in which the transmitter is adapted for use
within a drill hole in the earth.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
334 | With separate pickup: | ||||||||
This subclass is indented under subclass 332. Subject matter having means distinct from the radiating
means, for detecting the energy which has been radiated.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
335 | Employing multiple frequencies: | ||
This subclass is indented under subclass 334. Subject matter in which more than one frequency is employed
for investigating the subsurface formation between the transmitter
and pickup.
| |||
336 | To detect transient signals: | ||
This subclass is indented under subclass 334. Subject matter wherein the transmitter signal is such as
to cause decaying secondary signals to emanate from subsurface ore
bodies and mineral deposits and the pickup means detects such decaying
secondary signals.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
337 | To detect return wave signals: | ||
This subclass is indented under subclass 334. Subject matter having the pickup means positioned at the
same location as the transmitter for receiving reflections or reradiations
of the transmitted signal.
SEE OR SEARCH CLASS:
| |||
338 | Within a borehole: | ||||||
This subclass is indented under subclass 334. Subject matter adapted for use within a drill hole in the
earth.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
339 | By induction logging: | ||
This subclass is indented under subclass 338. Subject matter in which eddy currents are induced in the
formations surrounding the borehole by an alternating electromagnetic field
from a transmitter coil and a secondary electromagnetic field set
up by the eddy currents induces an electromotive force in the pickup
or receiver coil.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
340 | To measure susceptibility: |
This subclass is indented under subclass 339. Subject matter relating to the measurement of magnetic properties of the formation. | |
341 | To measure dielectric constant: |
This subclass is indented under subclass 339. Subject matter relating to the measurement of permittivity properties of the formation. | |
342 | Using a toroidal coil: |
This subclass is indented under subclass 339. Subject matter in which one or both of the transmitter and pickup coils are in the configuration of a toroid. | |
343 | Using angularly spaced coils: |
This subclass is indented under subclass 339. Subject matter in which the axis of one or more of the transmitter coils is nonparallel to the axis of one or more of the receiver coils. | |
344 | With radiant energy or nonconductive-type receiver: | ||||||||
This subclass is indented under subclass 323. Subject matter having means for receiving electrostatic
or electromagnetic energy from above or below the surface of the
earth.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
345 | By magnetic means: | ||||
This subclass is indented under subclass 323. Subject matter having magnetic means to determine the electrical
characteristics of the subsurface.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
346 | Within a borehole: | ||||||||
This subclass is indented under subclass 345. Subject matter adapted for use within a drill hole in the
earth.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
347 | Using electrode arrays, circuits, structure, or supports: | ||||||
This subclass is indented under subclass 323. Subject matter relating to means for introducing electric
currents into the subsurface or for collecting electric currents
from the subsurface by conduction.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
348 | For detecting naturally occurring fields, currents, or potentials: | ||||
This subclass is indented under subclass 347. Subject matter for measuring a field, current, or potential
which exists as a result of the inherent nature of the subsurface
formations and not arising by virtue of an artificial current source.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
349 | Of the telluric type: |
This subclass is indented under subclass 348. Subject matter wherein the potentials or fields are associated with naturally occurring variable current which permanently circulate in vast sheets within the outermost layer of the earth"s crust. | |
350 | Including magneto-telluric type: |
This subclass is indented under subclass 349. Subject matter for carrying out the telluric measurements in conjunction with measurements of the earth"s magnetic field. | |
351 | Within a borehole: | ||||||||||
This subclass is indented under subclass 348. Subject matter adapted for use within a hole which has been
drilled or is being drilled within the earth.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||
352 | Combined with artificial source measurement: | ||
This subclass is indented under subclass 351. Subject matter including one or more additional types of
electrode measurements employing a source of electrical energy other than
a natural source.
| |||
353 | With fluid movement or pressure variation: |
This subclass is indented under subclass 351. Subject matter including means for causing the movement of the fluid or variations in the pressure of the fluid existing within the borehole or the formations surrounding the borehole. | |
354 | Coupled to artificial current source: |
This subclass is indented under subclass 347. Subject matter in which a parameter of the current introduced into the subsurface is measured. | |
355 | Within a borehole: | ||||||||||||
This subclass is indented under subclass 354. Subject matter adapted for use within a drill hole in the
earth.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
356 | While drilling: | ||||
This subclass is indented under subclass 355. Subject matter associated with a drill string so that measurements
can be carried out during drilling of the borehole.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
357 | Including separate pickup of generated fields or potentials: | ||
This subclass is indented under subclass 354. Subject matter having means distinct from the current introduction
means, for detecting the fields or potentials resulting
from the current which has been caused to flow into the subsurface.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
358 | With three electrodes: |
This subclass is indented under subclass 357. Subject matter having three potential pickup electrodes. | |
359 | With nonelectrode pickup means: | ||
This subclass is indented under subclass 357. Subject matter having means for detecting radiant energy
produced by the artificial current flow, including magnetic, electromagnetic, and electrostatic
fields.
| |||
360 | Using a pulse-type current source: | ||
This subclass is indented under subclass 357. Subject matter wherein the current introduced into the subsurface
has an abruptly changing waveform such as a pulse, step
impulse, square wave, etc.
| |||
361 | With mechanical current reversing means: |
This subclass is indented under subclass 360. Subject matter in which the current is caused to reverse direction by mechanical switching apparatus. | |
362 | To measure induced polarization: |
This subclass is indented under subclass 360. Subject matter adapted to determine the polarization effects produced at the interface between a mineral body and a surrounding electrolyte in response to current flow. | |
363 | By varying the path of current flow: |
This subclass is indented under subclass 357. Subject matter in which the current introduced is caused to travel through the subsurface formations over different paths. | |
364 | Using frequency variation: |
This subclass is indented under subclass 363. Subject matter in which the current flow paths are varied by changing the frequency of the current. | |
365 | Offshore: |
This subclass is indented under subclass 357. Subject matter adapted for use on or below the surface of a body of water. | |
366 | For well logging: | ||||||||||||
This subclass is indented under subclass 357. Subject matter adapted for use within a drill hole in the
earth.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
367 | Using a pad member: | ||
This subclass is indented under subclass 366. Subject matter in which the electrodes are mounted on the
face of a support structure (pad member) adapted
to extend into engagement with the borehole wall.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
368 | Cased borehole: |
This subclass is indented under subclass 366. Subject matter in which the drill hole to be investigated contains a metal sheath or casing. | |
369 | While drilling: | ||||
This subclass is indented under subclass 366. Subject matter associated with a drill string so that measurements
can be carried out during drilling of the borehole.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
370 | Using surface current electrodes: |
This subclass is indented under subclass 366. Subject matter in which potentials detected along the borehole are created by current flowing between electrodes located at the earth"s surface on opposite sides of the borehole. | |
371 | Using plural fields: | ||
This subclass is indented under subclass 366. Subject matter having means for creating more than one field
in the formations surrounding the borehole and pickup electrode
means responsive to each of the fields.
| |||
372 | Between spaced boreholes: |
This subclass is indented under subclass 366. Subject matter in which electrode means are lowered within two or more drill holes in the earth for investigating the formations between the boreholes. | |
373 | Using current focussing means: |
This subclass is indented under subclass 366. Subject matter in which main survey current and auxiliary guard current electrodes are provided so as to confine or "focus" the survey current to a thin horizontal path into the formations. | |
374 | Including pad member: | ||
This subclass is indented under subclass 373. Subject matter in which the electrodes are mounted on the
face of a support structure (pad member) adapted
to extend into engagement with the borehole wall.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
375 | Including plural current focussing arrays: | ||
This subclass is indented under subclass 373. Subject matter having more than one focussing electrode
configuration on a single borehole tool.
| |||
376 | OF SUBSURFACE CORE SAMPLE: | ||||||||
This subclass is indented under the class definition. Subject matter relating to the analysis by electrical means
of core samples which have been removed from the subsurface of the
earth.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
377 | For magnetic properties: | ||
This subclass is indented under subclass 376. Subject matter wherein a magnetic property of the sample
is analyzed.
| |||
378 | INTERNAL-COMBUSTION ENGINE IGNITION SYSTEM OR DEVICE: | ||||||
This subclass is indented under the class definition. Subject matter relating to the testing of electrical systems
and devices which cause the rapid combustion of a fuel in an internal-combustion
engine.
SEE OR SEARCH CLASS:
| |||||||
379 | With analysis of displayed waveform: | ||
This subclass is indented under subclass 378. Subject matter having a cathode-ray tube (CRT) display
or a drive circuit for a CRT responsive to an electrical ignition
system to display the waveform generated by the ignition system.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
380 | Electronic ignition system: | ||
This subclass is indented under subclass 378. Subject matter wherein the ignition system utilizes solid-state
switching devices and electronic components.
| |||
381 | With magnetically controlled circuit: |
This subclass is indented under subclass 380. Subject matter wherein a magnetically controlled circuit has no conventional distributor contact points but uses a magnetic impulse generator in lieu thereof to trigger the transistor through an amplifier unit. | |
382 | With capacitor discharge circuit: |
This subclass is indented under subclass 380. Subject matter wherein conventional distributor breaker points, or a magnetic impulse generator in the distributor, charges a capacitor that generally discharges to the primary coil circuit. | |
383 | By simulating or substituting for a component under test: |
This subclass is indented under subclass 378. Subject matter wherein the test is made by providing the test instrument with a standard, or ideal, component, or components, arranged to be connected into the ignition system under test for similar components therein and thereby indicate faulty components by eliminating the components which are not operating properly. | |
384 | Using plural tests in a conventional ignition system: |
This subclass is indented under subclass 378. Subject matter wherein two or more diverse electrical components in an ignition system are tested. | |
385 | Distributor: | ||
This subclass is indented under subclass 378. Subject matter including means for testing components in
the primary and secondary circuits of the distributor.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
386 | Dwell (i.e., cam angle): | ||||
This subclass is indented under subclass 385. Subject matter wherein the number of degrees the distributor
cam rotates from the time the breaker points close until they open
again is measured.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
387 | Condenser: | ||
This subclass is indented under subclass 385. Subject matter for testing the operation of the energy storing
component in the primary circuit of the ignition system.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
388 | Coil: | ||
This subclass is indented under subclass 378. Subject matter including means for testing the operation
of the voltage transformer of the ignition circuit.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
389 | Magneto: |
This subclass is indented under subclass 378. Subject matter including means for testing the operation of the magnetic pulse generator of the ignition circuit. | |
390 | Low or high tension lead: | ||||||
This subclass is indented under subclass 378. Subject matter including means for testing the electrical
condition of the wires in the primary or secondary circuit of the
ignition system.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
391 | Ignition timing: | ||
This subclass is indented under subclass 378. Subject matter including means for measuring the time when
a high voltage surge is provided to fire a spark plug for a particular
cylinder relative to the position of the piston in the cylinder.
SEE OR SEARCH CLASS:
| |||
392 | Using a pulse signal technique: |
This subclass is indented under subclass 391. Subject matter wherein the timing measurement is achieved by using pulse signal processing (e.g., digital processing). | |
393 | In situ testing of spark plug: | ||
This subclass is indented under subclass 378. Subject matter wherein the spark plug is tested while in
the engine.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
394 | With cathode-ray tube display: | ||
This subclass is indented under subclass 393. Subject matter having a cathode-ray tube (CRT) display
or a drive circuit for a CRT responsive to an electrical ignition
system to display the waveform generated by the ignition system.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
395 | Using an illuminating device to indicate spark plug condition: |
This subclass is indented under subclass 393. Subject matter wherein a glow device (e.g., lamp bulb, neon tube, etc.) indicates whether or not a spark plug is operating properly. | |
396 | With an air gap in series with spark plug to indicate spark plug condition: |
This subclass is indented under subclass 393. Subject matter having the air gap connected in series with the spark plug secondary circuit to give an indication of the condition of the spark plug. | |
397 | By shorting the plug to ground to indicate spark plug condition: |
This subclass is indented under subclass 393. Subject matter wherein the test to indicate the condition of a spark plug consists of shorting the plug to ground and observing the change in the speed of the engine. | |
398 | With air gap in ground circuit: |
This subclass is indented under subclass 397. Subject matter having the air gap connected in parallel with the spark plug circuit. | |
399 | Wherein a measured electric quantity indicates spark plug condition: |
This subclass is indented under subclass 393. Subject matter wherein an electric characteristic (e.g., current, voltage, resistance, etc.) is evaluated or measured to indicate whether or not a spark plug is operating properly. | |
400 | Spark plug removed or tested in a test fixture: |
This subclass is indented under subclass 378. Subject matter wherein the spark plug is removed from the engine or placed in a test fixture to determine the condition of the plug. | |
401 | Using a pressure chamber: |
This subclass is indented under subclass 400. Subject matter wherein the test fixture has a means for testing the plug under pressure. | |
402 | Apparatus for coupling a measuring instrument to an ignition system: |
This subclass is indented under subclass 378. Subject matter relating to devices which pick up signals from the ignition system and apply them to an analyzer. | |
403 | ELECTRIC LAMP OR DISCHARGE DEVICE: | ||||||||||||||||
This subclass is indented under the class definition. Subject matter comprising systems, apparatus, and
methods for testing the operativeness or characteristics of electric
lamps or electric discharge devices.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||
404 | Cathode-ray tube: |
This subclass is indented under subclass 403. Subject matter for testing a discharge device which has means for forming the electric discharge into a restricted beam or ray. | |
405 | Vacuum tube: |
This subclass is indented under subclass 403. Subject matter for testing a device which is intended to have an electrical current flow between two spaced electrodes, at least part of the path followed by the discharge being constituted by a gas, vapor, or vacuum. | |
406 | Plural tubes in the testing circuit: | ||
This subclass is indented under subclass 405. Subject matter having a plurality of vacuum tubes connected
in the testing circuit during the testing operation.
SEE OR SEARCH CLASS:
| |||
407 | Testing circuit for diverse-type tube: | ||
This subclass is indented under subclass 405. Subject matter wherein the testing system or apparatus is
provided with means so that two or more types of vacuum tubes may
be tested by the same apparatus or system.
SEE OR SEARCH CLASS:
| |||
408 | Circuit for making diverse test: | ||||
This subclass is indented under subclass 405. Subject matter wherein the testing circuit or apparatus
is designed to test a plurality of different characteristics of
conditions of vacuum tubes under examination.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
409 | Testing discharge space characteristic (e.g., emission): | ||||
This subclass is indented under subclass 405. Subject matter wherein the testing circuit or apparatus
is designed to test the condition between two or more of the discharge
electrodes of an electric discharge device, or is designed
to test the characteristics of the interelectrode discharge space
of a discharge device.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
410 | With application of current or potential to the discharge control means: |
This subclass is indented under subclass 409. Subject matter wherein the circuit used in making the test includes means to impress current or potential upon the discharge control means of a vacuum tube. | |
411 | Pulsating or alternating current or potential for the discharge control means: |
This subclass is indented under subclass 410. Subject matter wherein the current or potential impressed upon the discharge control means is pulsating or alternating current or potential. | |
412 | Pulsating or alternating current for the anode: |
This subclass is indented under subclass 411. Subject matter wherein the circuit used in making the test includes means to impress pulsating or alternating current or potential upon the anode of the vacuum tube. | |
413 | Shock testing: |
This subclass is indented under subclass 405. Subject matter in which the internal components of the vacuum tube are tested for mechanical vibration by striking the tube envelope with a hammer element. | |
414 | Electric lamp: |
This subclass is indented under subclass 403. Subject matter for testing a device which converts electrical energy into visible light or ultraviolet light. | |
415 | ELECTROMECHANICAL SWITCHING DEVICE: | ||
This subclass is indented under the class definition. Subject matter relating to the testing of operational characteristics
of electromechanical devices which open and close or change the connection
of a circuit.
SEE OR SEARCH CLASS:
| |||
416 | Voltage regulator: |
This subclass is indented under subclass 415. Subject matter which includes determining the electrical properties of an electromechanical device which maintains a load voltage nearly constant over a range of variations of input voltage and load current. | |
417 | Thermostat switch: |
This subclass is indented under subclass 415. Subject matter wherein the device under test consists of a temperature responsive circuit element which transforms temperature change to a change in the open or closed state of mating electrical contact surfaces. | |
418 | Relay: |
This subclass is indented under subclass 415. Subject matter wherein the device under test consists of a switch contact member actuated by an electromagnet acting against a spring biased member to open or close switch contact surfaces. | |
419 | Reed switch: |
This subclass is indented under subclass 418. Subject matter in which the relay to be tested is of the reed switch type. | |
420 | To evaluate contact chatter: |
This subclass is indented under subclass 418. Subject matter wherein the resonant frequency at which the relay contact surfaces make and break a circuit is determined. | |
421 | To evaluate contact resistance: |
This subclass is indented under subclass 418. Subject matter in which the magnitude of resistance to current flow across mating contact surfaces is determined. | |
422 | To evaluate contact sequence of operation: |
This subclass is indented under subclass 418. Subject matter in which the order of make and break operation of plural contacts is determined. | |
423 | To evaluate contact response time: |
This subclass is indented under subclass 418. Subject matter in which the rate of time resulting from contact separation as well as closure is determined. | |
424 | Circuit breaker: |
This subclass is indented under subclass 415. Subject matter in which the electrical properties inherent to contacts separating in a high voltage-high current circuit are determined. | |
425 | ELECTROLYTE PROPERTIES: | ||||
This subclass is indented under the class definition. Subject matter for testing the electrolyte of electrolytic
devices, or having electrolytic means for performing the
testing to determine specific electrical properties of the electrolyte.
SEE OR SEARCH CLASS:
| |||||
426 | Using a battery testing device: | ||||||||||
This subclass is indented under subclass 425. Subject matter in which the testing device used is specifically
designed to test the condition of or properties of a battery.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
427 | To determine ampere-hour charge capacity: |
This subclass is indented under subclass 426. Subject matter in which the charge capacity of a battery is determined by external electrical measurement. | |
428 | Including an integrating device: |
This subclass is indented under subclass 427. Subject matter in which a charge accumulating or counting device is connected to the battery terminals in order to show the amount of remaining battery charge. | |
429 | To determine load/no-load voltage: |
This subclass is indented under subclass 426. Subject matter in which battery condition is determined by terminal voltage measurement with and without a connected load. | |
430 | To determine internal battery impedance: |
This subclass is indented under subclass 426. Subject matter with circuitry connected to the battery for the purpose of measuring internal battery impedance. | |
431 | With temperature compensation of measured condition: |
This subclass is indented under subclass 426. Subject matter in which a measurement of battery capacity is made under varied temperature conditions. | |
432 | To determine battery electrolyte condition: |
This subclass is indented under subclass 426. Subject matter involving an electrical conductivity measurement of a battery electrolyte directly to determine a battery state of charge. | |
433 | To compare battery voltage with a reference voltage: |
This subclass is indented under subclass 426. Subject matter for comparing a test battery terminal voltage with a reference voltage in an electrical circuit and determining battery condition as a result of the comparison. | |
434 | To determine plural cell condition: |
This subclass is indented under subclass 426. Subject matter including electrical connection to the individual cells of a battery for status determination of each cell and resultant subsequent determination of the battery condition. | |
435 | Having particular meter scale or indicator: |
This subclass is indented under subclass 426. Subject matter having an electrical measuring instrument face, scale, or indicator of particular interest. | |
436 | Including oscillator in measurement circuit: |
This subclass is indented under subclass 426. Subject matter in which an oscillator connected to a battery to be measured provides an output signal corresponding to battery condition. | |
437 | Including probe structure: |
This subclass is indented under subclass 426. Subject matter including the structural connector which makes contact with a battery to be tested. | |
438 | Using a pH determining device: | ||||
This subclass is indented under subclass 425. Subject matter using a device designed to determine the
hydrogen ion concentration of an electrolyte.
SEE OR SEARCH CLASS:
| |||||
439 | Using a conductivity determining device: |
This subclass is indented under subclass 425. Subject matter using a device designed to determine the conductivity of an electrolyte. | |
440 | Which includes a dropping mercury cell: | ||
This subclass is indented under subclass 439. Subject matter wherein voltage is applied to a reference
electrode and a mercury drop electrode immersed in an electrolyte, whereby
the oxidation or reduction at the mercury drop electrode alters
the passage of current through the electrode thereby providing an
indication of the conductivity of the electrolyte at that voltage.
SEE OR SEARCH CLASS:
| |||
441 | Which includes a temperature responsive element: |
This subclass is indented under subclass 439. Subject matter in which conductivity measurement is made under temperature compensated conditions. | |
442 | Which includes an oscillator: |
This subclass is indented under subclass 439. Subject matter including the passage of alternating current generated by an oscillator through the electrolyte in which resultant current flow is a measure of electrolyte conductivity. | |
443 | Having a bridge circuit: |
This subclass is indented under subclass 439. Subject matter including a conductivity cell under test as the arm of a bridge circuit. | |
444 | Which includes current and voltage electrodes: |
This subclass is indented under subclass 439. Subject matter including separate pairs of electrodes in which one pair supplies current to an electrolyte and another pair provides a voltage to be measured thereacross. | |
445 | Having inductance probe structure: |
This subclass is indented under subclass 439. Subject matter in which an electrolyte provides a mutual inductance medium path between the transmitter and receiver coils of a probe element. | |
446 | Having conductance probe structure: |
This subclass is indented under subclass 439. Subject matter in which conductance probe element is of particular interest. | |
447 | With movable or adjustable electrode: |
This subclass is indented under subclass 446. Subject matter including movement or adjustment of probe electrodes with respect to one another. | |
448 | With concentric electrodes: |
This subclass is indented under subclass 446. Subject matter having probe electrodes positioned concentrically with respect to one another. | |
449 | With axially arranged electrodes: |
This subclass is indented under subclass 446. Subject matter having probe electrodes positioned axially with respect to one another. | |
450 | Which includes particular cell container structure: |
This subclass is indented under subclass 439. Subject matter in which the cell container structure is of particular interest. | |
451 | A MATERIAL PROPERTY USING THERMOELECTRIC PHENOMENON: | ||||||||
This subclass is indented under the class definition. Subject matter wherein an electromotive force is generated
by a temperature difference between the junctions in a circuit composed
of two homogeneous electrical conductors of dissimilar compositions; or
in a nonhomogeneous conductor, an electromotive force is
produced by a temperature gradient in a nonhomogeneous region and
used to identify the different types of materials forming the junctions
or to measure properties of these materials.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
452 | A MATERIAL PROPERTY USING ELECTROSTATIC PHENOMENON: | ||
This subclass is indented under the class definition. Subject matter wherein electrostatic charges are placed
upon the material under test and monitored to determine some property
of the material.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
453 | In a liquid: | ||
This subclass is indented under subclass 452. Subject matter wherein the charged material is either a
liquid or a material being carried along by a liquid.
| |||
454 | Frictionally induced: |
This subclass is indented under subclass 452. Subject matter wherein an electrostatic charge is placed upon the material by the mechanical separation of electrical charges of opposite sign by processes such as sliding or rubbing dissimilar objects, and the charge is then monitored as a measure of the material property. | |
455 | Corona induced: |
This subclass is indented under subclass 452. Subject matter wherein the electrostatic charge is placed upon the material by corona discharge. | |
456 | For flaw detection: | ||||
This subclass is indented under subclass 452. Subject matter wherein electrostatically charged particles
are placed upon the test material and collect at flaw locations
to indicate the position of the flaw.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
457 | ELECTROSTATIC FIELD: | ||||||
This subclass is indented under the class definition. Subject matter for measuring the strength of the vector
force field set up in the vicinity of nonmoving electrical charges.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
458 | Using modulation-type electrometer: | ||
This subclass is indented under subclass 457. Subject matter wherein the electrostatic phenomenon being
monitored is modulated by movement of one of the elements of the
electometer to thereby generate an alternating current signal proportional
to the phenomenon being measured.
| |||
459 | USING IONIZATION EFFECTS: | ||||||||||
This subclass is indented under the class definition. Subject matter wherein a medium is ionized and the ionized
medium is used to measure or monitor a property or condition distinct from
the cause of the ionization.
SEE OR SEARCH CLASS:
| |||||||||||
460 | For monitoring pressure: | ||||||
This subclass is indented under subclass 459. Subject matter wherein the pressure within an area is monitored
by ionizing the gas or vapor therein and then analyzing the ionization.
SEE OR SEARCH CLASS:
| |||||||
461 | Using a radioactive substance: | ||
This subclass is indented under subclass 460. Subject matter wherein a radioactive material is used to
ionize the gas or vapor in the environment wherein the pressure
is being measured.
SEE OR SEARCH CLASS:
| |||
462 | Using thermionic emissions: | ||
This subclass is indented under subclass 460. Subject matter wherein a heated element emits electrons
which collide with and ionize the gas or vapor in the environment
wherein the pressure is being monitored.
| |||
463 | Using a magnetic field: | ||||
This subclass is indented under subclass 460. Subject matter wherein a magnetic field is used with an
ionizing electron source to cause the electrons to flow in a longer
path.
| |||||
464 | For analysis of gas, vapor, or particles of matter: | ||||||||||
This subclass is indented under subclass 459. Subject matter wherein a gas, vapor, or
particles of matter to be monitored are ionized and the ionized
material is then monitored to determine properties of the material
itself.
SEE OR SEARCH CLASS:
| |||||||||||
465 | Using electronegative gas sensor: | ||||||
This subclass is indented under subclass 464. Subject matter wherein a gas whose molecules exhibit electron
affinity or an ability to pick up free electrons and form negative
ions, is sensed.
| |||||||
466 | Using a filter: |
This subclass is indented under subclass 464. Subject matter wherein a filter or membrane is used, which passes only the gas, vapor, etc., which is to be tested, to the ionization chamber where it is ionized and analyzed. | |
467 | Using test material desorption: |
This subclass is indented under subclass 464. Subject matter wherein the material to be monitored is placed upon a filament which is heated until the material evaporates (desorbs) forming ions which are then analyzed. | |
468 | Using thermal ionization: | ||
This subclass is indented under subclass 464. Subject matter wherein the gas, vapor, etc., to be
monitored contacts a heated positive electrode causing positive
ion emission, which ions are then collected for analysis
by a negative electrode spaced from the heated positive electrode.
| |||
469 | Using a radioactive substance: |
This subclass is indented under subclass 464. Subject matter wherein a radioactive material is used to ionize the gas, vapor, etc., to be analyzed. | |
470 | Using thermionic emission: |
This subclass is indented under subclass 464. Subject matter wherein a heated element emits electrons which ionize the gas, vapor, etc., to be analyzed. | |
500 | FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS: | ||||||||||||||||||
This subclass is indented under the class definition. Subject matter including means for testing for the existence, or
location, of an electrical defect by providing a quantitative
or nonquantitative output.
SEE OR SEARCH CLASS:
| |||||||||||||||||||
501 | Using radiant energy: | ||||
This subclass is indented under subclass 500. Subject matter wherein some form of radiant energy, e.g., electron
beam, light, etc., is used to
test the continuity of a conductor line.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
502 | In an ignitor or detonator: | ||
This subclass is indented under subclass 500. Subject matter wherein a test is made to check the ability
of a circuit, or component thereof to fire an explosive
device.
| |||
503 | In vehicle wiring: | ||||||||
This subclass is indented under subclass 500. Subject matter to determine the presence of faults located
in vehicle circuits.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
504 | With trailer: |
This subclass is indented under subclass 503. Subject matter for testing the operability of various lighting and signal circuits located on trailers. | |
505 | Combined with window glass: | ||
This subclass is indented under subclass 503. Subject matter for testing the continuity of electrical
conductors embedded in a glass sheet, deposited on a glass
sheet, or laminated between a pair of glass sheets.
| |||
506 | Combined with a flashlight: |
This subclass is indented under subclass 500. Subject matter where a flashlight is modified to include an electric tester. | |
507 | With fuse testing attachment: |
This subclass is indented under subclass 506. Subject matter where a flashlight is modified to include an adapter for testing continuity in fuses. | |
508 | With electric power receptacle for line wire testing: | ||||||||||
This subclass is indented under subclass 500. Subject matter where a tester is adapted to be inserted
into an electric outlet socket or receptacle for testing the electrical
circuits connected to the electrical receptacle.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||
509 | Of ground fault indication: | ||||||||||
This subclass is indented under subclass 500. Subject matter for detecting an unintentional electrical
path where defective insulation causes an electrical conductor to
leak current to ground.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
510 | Of electrically operated apparatus (power tool, appliance, machine, etc.): | ||||
This subclass is indented under subclass 509. Subject matter for detecting an undesirable current leakage
between an ungrounded and grounded part of equipment normally caused by
defective insulation.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
511 | Of electrically operated apparatus (power tool, appliance, machine, etc.): | ||
This subclass is indented under subclass 500. Subject matter for testing the condition of electric power
tools, appliances, machines, equipment, etc., for
safe use with respect to proper grounding, shorts or continuity.
| |||
512 | For fault location: | ||||||
This subclass is indented under subclass 500. Subject matter where a signal produced indicates either
direction or distance to a fault.
SEE OR SEARCH CLASS:
| |||||||
513 | Where components moves while under test: | ||
This subclass is indented under subclass 512. Subject matter where component under test is moved linearly, or
by stressing, bending, rotating, jarring, vibrating, flexing, etc., while
under test.
| |||
514 | By exposing component to liquid or gas while under test: | ||||||
This subclass is indented under subclass 513. Subject matter where the component under test is immersed, passes
through, or contacts a liquid or gas while a test is being
made.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
515 | Using a particular sensing electrode: | ||||
This subclass is indented under subclass 513. Subject matter where details of the sensing electrode are
significant.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
516 | Metal chain: |
This subclass is indented under subclass 515. Subject matter where the sensing electrode comprises flexible linked elements which contact the moving component under test. | |
517 | Wire bristles: |
This subclass is indented under subclass 515. Subject matter where the sensing electrode comprises stiff flexible spring wire elements which contact the moving component under test. | |
518 | Metal pellets or beads: |
This subclass is indented under subclass 515. Subject matter where the sensing electrode comprises metal spheres which contact the moving component under test. | |
519 | By capacitance measuring: |
This subclass is indented under subclass 512. Subject matter where a capacitance related signal is used to locate a break, ground or short in a conductor. | |
520 | By frequency sensitive or responsive detection: |
This subclass is indented under subclass 512. Subject matter where a frequency related signal is used to locate a break, ground, or short in a conductor. | |
521 | By phase sensitive or responsive detection: |
This subclass is indented under subclass 512. Subject matter where a phase related signal is used to locate a break, ground, or short in a conductor. | |
522 | By voltage or current measuring: | ||
This subclass is indented under subclass 512. Subject matter where a fault causes a change or abnormality
of a normal condition to produce a voltage drop or a current surge
etc., which is detected to locate the fault.
SEE OR SEARCH CLASS:
| |||
523 | Of an applied test signal: | ||
This subclass is indented under subclass 522. Subject matter where a measured fault signal is derived
from the voltage or current of a applied test signal to indicate
the location of the fault.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
524 | Polarity responsive: |
This subclass is indented under subclass 522. Subject matter where direction or distance to a fault is determined by a positive or negative signal. | |
525 | By resistance or impedance measuring: | ||||
This subclass is indented under subclass 512. Subject matter where measured resistance or impedance value
indicate the location of a fault.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
526 | Using a bridge circuit: | ||
This subclass is indented under subclass 525. Subject matter where resistance values are evaluated by
a circuit which compares the resistance values to locate a fault.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
527 | By applying a test signal: | ||
This subclass is indented under subclass 512. Subject matter where a test signal is applied to the conductor
under test to locate the fault.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
528 | Tracing test signal of fault location: |
This subclass is indented under subclass 527. Subject matter where an applied test signal undergoes a change at the location of the fault. | |
529 | Using a magnetic field sensor: | ||||
This subclass is indented under subclass 528. Subject matter where a search or exploring coil responds
to a magnetic field produced by the applied test signal to determine
fault location.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
530 | Using an electric field sensor: | ||||
This subclass is indented under subclass 528. Subject matter where a capacitive pickup device for probe
responds to an electric field produced by the applied test signal
to determine fault location.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
531 | At fault site: |
This subclass is indented under subclass 527. Subject matter where the applied test signal causes, creates, or produces a fault signal at or near the fault site. | |
532 | Using time measuring: | ||
This subclass is indented under subclass 527. Subject matter where the applied test signal is evaluated
as to time to indicate the location of a fault.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
533 | Of reflected test signal: | ||
This subclass is indented under subclass 532. Subject matter where the defect causes the applied test
signal to be reflected and the reflected signal is evaluated as
to time to determine the location of the fault.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
534 | By reflection technique: | ||
This subclass is indented under subclass 512. Subject matter where the defect causes, creates, or
produces a fault signal which is reflected and evaluated to indicate
the location of the fault.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
535 | By time measuring: | ||
This subclass is indented under subclass 512. Subject matter where a defect produces a fault signal which
is evaluated as to time to indicate the location of the fault.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
536 | By spark or arc discharge: | ||||
This subclass is indented under subclass 512. Subject matter where a defect causes a voltage breakdown
at a void or discontinuity to indicate the location of a fault.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
537 | Of individual circuit component or element: | ||||||||||||||
This subclass is indented under subclass 500. Subject matter relating to the detection of the presence
or absence of a defect in an electric component, or element, by
giving a nonquantitative indication thereof.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||
538 | Electrical connectors: | ||||||
This subclass is indented under subclass 537. Subject matter for detecting open and closed circuit conditions
in an electrical apparatus and the correctness of inner circuit
connections in multi-connection devices.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
539 | Multiconductor cable: | ||||
This subclass is indented under subclass 537. Subject matter wherein an assembly of more than one conductor
is tested to determine if the conductors are continuous, grounded
or shorted by giving a nonquantitative indication.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
540 | With sequencer: | ||
This subclass is indented under subclass 539. Subject matter where a mechanical or electrical device is
included which tests one cable after another for a defect.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
541 | For insulation fault: | ||||||||||
This subclass is indented under subclass 539. Subject matter for checking a defect in a nonconductive
material which separate one conductor from another and causes an unintentional
electrical path between two conductors.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
542 | Having a light or sound indicator: | ||||||||
This subclass is indented under subclass 539. Subject matter where a visual or audible device makes information
available to a human concerning the existence of a defect in a multiconductor
cable.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
543 | Single conductor cable: | ||
This subclass is indented under subclass 537. Subject matter which includes a solid conductor, or
stranded group of solid cylindrical conductors, having
a low resistance to flow, together with any insulation.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
544 | For insulation fault: | ||||||||||
This subclass is indented under subclass 543. Subject matter for checking a defect in a nonconductive
material which separates the conductor from an unintentional electrical
path to ground.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
545 | Armature or rotor: | ||||||
This subclass is indented under subclass 537. Subject matter for testing the rotating part of a generator
or motor.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
546 | Winding or coil: | ||||||
This subclass is indented under subclass 537. Subject matter for testing a number of turns of wire wound
around an iron core or onto a form made of insulating material, or
one which is self supporting.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
547 | Transformer: | ||||||||
This subclass is indented under subclass 546. Subject matter for checking a defect in a component of an
electrical device, which transfers electric energy from
one winding to another by electromagnetic induction, and
gives a "go-no-go" type of indication.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
548 | Capacitor: | ||||||||||||
This subclass is indented under subclass 537. Subject matter for checking the condition of a circuit element, consisting
of at least two conducting surfaces separated by an insulator, and giving
a "go-no-go" type of indication
or checking the condition of any part thereof.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||||
549 | Resistor: | ||
This subclass is indented under subclass 537. Subject matter for checking the condition of a circuit element, which
is designed to offer a predetermined opposition to current flow, by giving
a "go-no-go" type of indication.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
550 | Fuse: | ||||
This subclass is indented under subclass 537. Subject matter for checking the condition of a circuit protective
element designed to open the circuit when current exceeds a rated
value, by giving a "go-no-go" indication.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
551 | Insulation: | ||||||||||||
This subclass is indented under subclass 537. Subject matter for checking a defect in a nonconductive
material which separates the conductor from an unintentional electrical
path between another conductor or ground.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
552 | Bushing: | ||
This subclass is indented under subclass 551. Subject matter where the insulation qualities of an insulating
element which electrically isolates, and is generally used
to support, a conductor.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
553 | Oil: | ||||
This subclass is indented under subclass 551. Subject matter wherein the insulating qualities of an oil
used in electrical equipment is tested.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
554 | Sheet material: | ||||
This subclass is indented under subclass 551. Subject matter where sheets of insulating material used
for electric circuits and in electric components are tested for
insulation qualities.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
555 | Instruments and devices for fault testing: | ||
This subclass is indented under subclass 500. Subject matter relating to apparatus and circuits for detecting
defects in electric circuits or electric components.
| |||
556 | Having a lamp or light indicator: | ||||||||
This subclass is indented under subclass 555. Subject matter where the apparatus includes a visual indicator.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
557 | FOR INSULATION FAULT OF NONCIRCUIT ELEMENT: | ||||||||
This subclass is indented under the class definition. Subject matter where a defect in the insulation of a noncircuit
element is determined.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
558 | Where element moves while under test: | ||
This subclass is indented under subclass 557. Subject matter where the noncircuit element under test moves
while under test.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
559 | Where a moving sensing electrode scans a stationary element under test: |
This subclass is indented under subclass 557. Subject matter where a moving sensing electrode scans a stationary noncircuit element under test. | |
600 | IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS: | ||||||||||||||||
This subclass is indented under the class definition. Subject matter wherein the measurement or test means determines
a property (parameter) defined by (1) the
flow, storage or change of current value in a circuit or
substance; or (2) the relationship between
two or more electrical values in a circuit or substance.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||
601 | Calibration: | ||||||||||
This subclass is indented under subclass 600. Subject matter wherein the measurement or test device is
compared with a standard to determine its accuracy or to establish
a corrected scale.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||
602 | With auxiliary means to condition stimulus/response signals: | ||
This subclass is indented under subclass 600. Subject matter including other than measuring or testing
means to prepare or process the stimulus/response signal
to influence or improve the quality of the measuring or testing.
| |||
603 | For excitation: |
This subclass is indented under subclass 602. Subject matter wherein the auxiliary means generates a stimulus signal component. | |
604 | Including marker signal generator circuit: |
This subclass is indented under subclass 603. Subject matter wherein the auxiliary means includes a circuit which injects one or more pips of specific frequency onto the response curve from the circuit or substance being measured or tested. | |
605 | For response signal evaluation or processing: |
This subclass is indented under subclass 602. Subject matter wherein the auxiliary means is used to analyze the parameter being measured or tested. | |
606 | Including a signal comparison circuit: | ||||||||||
This subclass is indented under subclass 605. Subject matter wherein the several quantities are matched
for the purpose of determining their relative values to evaluate
signal correlation, difference or compensation.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||
607 | Including a conversion (e.g., A->D or D->A) process: | ||||
This subclass is indented under subclass 605. Subject matter wherein an evaluation or process involving
the measure and takes place as part of a conversion scheme.
SEE OR SEARCH CLASS:
| |||||
608 | Including a ratiometric function: | ||||||||
This subclass is indented under subclass 605. Subject matter wherein the evaluation or process includes
a value which represents the ratio of a first signal to a second
signal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
609 | For sensing: | ||
This subclass is indented under subclass 602. Subject matter including an auxiliary adaptation of the
sensing portion of the circuit to improve or influence the quality
of the measuring or testing.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
610 | Including a bridge circuit: | ||||||||||||||||
This subclass is indented under subclass 609. Subject matter wherein the additional means for sensing
includes a bridge circuit.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||||||||
611 | Including a remote type circuit: | ||||||
This subclass is indented under subclass 609. Subject matter wherein the additional means for sensing
operates at a distance from the circuit or substance being measured
or tested.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
612 | Parameter related to the reproduction or fidelity of a signal affected by a circuit under test: | ||||||
This subclass is indented under subclass 600. Subject matter wherein the parameter relates to the accuracy
with which a circuit reproduces at its output the essential characteristics
of a signal impressed on its input.
SEE OR SEARCH CLASS:
| |||||||
613 | Noise: | ||
This subclass is indented under subclass 612. Subject matter wherein the evaluated parameter is representative
of an unwanted electrical disturbance or a spurious signal in the
circuit or substance being measured or tested.
SEE OR SEARCH CLASS:
| |||
614 | Signal to noise ratio or noise figure: | ||||
This subclass is indented under subclass 613. Subject matter including means to measure the ratio between
a signal reference level and the level of unwanted noise.
| |||||
615 | Transfer function type characteristics: | ||||||||
This subclass is indented under subclass 612. Subject matter wherein the parameter tested is based on
determining how a circuit responds to input energy at different
frequencies.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
616 | Gain or attenuation: |
This subclass is indented under subclass 615. Subject matter wherein the measured or tested parameter is based on the increase or decrease in voltage, current or power when a signal is transmitted from one point to another. | |
617 | Response time or phase delay: |
This subclass is indented under subclass 615. Subject matter wherein the transmission characteristic of the signal being evaluated relates to transit time or phase changes. | |
618 | Transient response or transient recovery time (e.g., damping): |
This subclass is indented under subclass 615. Subject matter wherein the response of a circuit to an impulse or other instantaneous excitation is measured or tested. | |
619 | Selective type characteristics: | ||
This subclass is indented under subclass 615. Subject matter including measuring or testing characteristics
which determine the extent to which the desired signal can be distinguished from
disturbances or other signals, e.g., tuning.
SEE OR SEARCH CLASS:
| |||
620 | Distortion: | ||||||
This subclass is indented under subclass 612. Subject matter including measuring or testing for undesired
changes in the waveform of a signal being evaluated.
SEE OR SEARCH CLASS:
| |||||||
621 | Envelope delay: | ||
This subclass is indented under subclass 620. Subject matter including measuring or testing the rate of
change of phase shift with respect to frequency.
| |||
622 | Phase: | ||||
This subclass is indented under subclass 620. Subject matter including measuring or testing the lack of
phase linearity with respect to other signal variables.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
623 | Harmonic: |
This subclass is indented under subclass 620. Subject matter wherein the input signal is sinusoidal and the output signal which is a multiple of the input signal is measured or tested. | |
624 | Intermodulation: |
This subclass is indented under subclass 620. Subject matter including measuring or testing nonlinearity, characterized by the appearance of frequencies in the output equal to the sum and differences of integral multiples of the component frequencies present in the input signal. | |
625 | Dissymmetry or asymmetry: | ||||
This subclass is indented under subclass 620. Subject matter including measuring or testing a lack of
signal fidelity due to imperfect matching of parameter values.
| |||||
626 | Nonlinearity: | ||
This subclass is indented under subclass 620. Subject matter including the measuring or testing of distortion
that occurs when the output does not rise and fall in direct in
proportion to the input.
SEE OR SEARCH CLASS:
| |||
627 | Shielding effectiveness (SE): |
This subclass is indented under subclass 612. Subject matter including measuring or testing the relative reduction of radiated electromagnetic energy levels caused by the use of an enclosure either to contain or exclude the energy. | |
628 | Circuit interference (e.g., crosstalk) measurement: | ||||
This subclass is indented under subclass 627. Subject matter for determining the amount of undesired coupling
between two conductors in proximate relationship.
SEE OR SEARCH CLASS:
| |||||
629 | Distributive type parameters: |
This subclass is indented under subclass 600. Subject matter wherein the measured or tested parameter cannot be taken as being concentrated at any one point in the circuit or substance. | |
630 | Plural diverse parameters: |
This subclass is indented under subclass 629. Subject matter wherein more than one type of parameter is measured. | |
631 | Using wave polarization (e.g., field rotation): | ||||
This subclass is indented under subclass 629. Subject matter wherein the test substance has properties
with directional preferences (i.e., anisotropy).
SEE OR SEARCH CLASS:
| |||||
632 | Using particular field coupling type (e.g., fringing field): | ||||||
This subclass is indented under subclass 629. Subject matter wherein a sensor located in close proximity
to a substance under test, produces an electric field which
links or couples the substance under test to the sensor.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
633 | Using resonant frequency: | ||||||||||
This subclass is indented under subclass 629. Subject matter including a circuit for measuring the frequency
at which a measured substance will respond with maximum amplitude when
subject to an external sinusoidal wave of a particular frequency.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||
634 | To determine water content: | ||||||||||||||||||||
This subclass is indented under subclass 633. Subject matter wherein the analyzed parameter of a substance
under resonant test is moisture content.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||||||
635 | To determine dimension (e.g., distance or thickness): | ||||||||
This subclass is indented under subclass 633. Subject matter wherein the size or distance of a substance
from a reference point is measured using resonance effects.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
636 | With a resonant cavity: |
This subclass is indented under subclass 633. Subject matter including a resonant circuit type wherein current is distributed on an inner surface of a closed chamber. | |
637 | Using transmitted or reflected microwaves: | ||||
This subclass is indented under subclass 629. Subject matter wherein distributive type parameters associated
with an object or substance are measured or tested using transmitted or
returned microwaves.
SEE OR SEARCH CLASS:
| |||||
638 | Scattering type parameters (e.g., complex reflection coefficient): | ||||
This subclass is indented under subclass 637. Subject matter including the measurement of characteristics
at network ports which are complex ratios representing the amplitude
and phase of incident and reflected power in traveling waves.
| |||||
639 | Where energy is transmitted through a test substance: |
This subclass is indented under subclass 637. Subject matter including measurement of a microwave that passes through an object or substance. | |
640 | To determine water content: | ||||||||||||||||||||||
This subclass is indented under subclass 639. Subject matter for determining the water content of the
test substance.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||||||||
641 | To determine insertion loss: |
This subclass is indented under subclass 639. Subject matter wherein measurement of the change provides information regarding the loss of power between two points on an object under test. | |
642 | Where energy is reflected (e.g., reflectometry): |
This subclass is indented under subclass 637. Subject matter including measurement of the returned signal energy from a high frequency wave that strikes the surface of a test object, the junction of two media or a discontinuity in the medium it is traveling in. | |
643 | To determine water content: | ||||||||||||||||||||
This subclass is indented under subclass 642. Subject matter including measurement of the test substance
water content.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||||||
644 | To determine dimension (e.g., distance or thickness): | ||||||
This subclass is indented under subclass 642. Subject matter including measurement of the physical characteristics
of the test substance pertaining to its size or its distance from
a reference point.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
645 | Having standing wave pattern: | ||||||||
This subclass is indented under subclass 642. Subject matter including measurement of the spatial distribution
of transmitted or reflected energy on a transmission line formed
by two sets of waves traveling in opposite direction and characterized
by the presence of a number of points of successive maxima and minima
in the distribution curves.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
646 | To determine reflection coefficient: |
This subclass is indented under subclass 642. Subject matter including measurement of the complex (vector or phasor) ratio between the fields associated with the reflected and incident waves. | |
647 | Using a comparison or difference circuit: | ||||||||||||
This subclass is indented under subclass 629. Subject matter wherein distributive type parameters are
measured by correlating two or more electrical quantities.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
648 | With a bridge circuit: | ||||
This subclass is indented under subclass 647. Subject matter including a multi-terminal network
arranged so that when an electromotive force is present in one branch, the
response of a suitable detecting device may be zeroed by suitable
adjustment of the electrical constants of still other branches.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
649 | Lumped type parameters: | ||
This subclass is indented under subclass 600. Subject matter including the measuring or testing of any
circuit parameter, which for the purposes of analysis, can
be considered to represent combined or single inductance, capacitance, resistance, etc., throughout
the frequency range of interest.
| |||
650 | Using phasor or vector analysis: | ||||||||
This subclass is indented under subclass 649. Subject matter including utilization of a quantity that
has both magnitude and direction.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
651 | With a bridge circuit: | ||||||||
This subclass is indented under subclass 650. Subject matter including a multi-terminal network
used in a comparison or balancing configuration.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
652 | Of a resonant circuit: | ||||||||
This subclass is indented under subclass 649. Subject matter including measuring or testing a circuit
which contains both inductance and capacitance and is tuned to resonate
at a certain frequency.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
653 | For figure of merit or Q value: |
This subclass is indented under subclass 649. Subject matter including the determination of the ratio of the maximum energy stored in a cycle to the energy dissipated per cycle. | |
654 | Using inductive type measurement: | ||
This subclass is indented under subclass 649. Subject matter including measuring a property of a device, element
or circuit which opposes any change in the rate of current flow
associated with a magnetic field.
SEE OR SEARCH CLASS:
| |||
655 | Including a tuned or resonant circuit: | ||||||||
This subclass is indented under subclass 654. Subject matter including measuring or testing a circuit
which contains both inductance and capacitance and is tuned to resonate
at a certain frequency.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
656 | Including a comparison or difference circuit: | ||||||||||
This subclass is indented under subclass 654. Subject matter wherein lumped type inductive values are
measured by correlating two or more electrical quantities.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||
657 | Using a bridge circuit: | ||
This subclass is indented under subclass 656. Subject matter including a multi-terminal network
using comparison or balance.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
658 | Using capacitive type measurement: | ||||||
This subclass is indented under subclass 649. Subject matter including the measuring of a property of
an element, device or circuit which relates to its capacity
to store electrical energy by means of an electric field.
SEE OR SEARCH CLASS:
| |||||||
659 | With loss characteristic evaluation: | ||
This subclass is indented under subclass 658. Subject matter where the parasitic energy dissipation associated
with the capacitance is measured as part of the test.
| |||
660 | With variable electrode area: |
This subclass is indented under subclass 658. Subject matter wherein the area of a capacitor"s plate (i.e., electrode) is changed in effecting the measurement. | |
661 | With variable distance between capacitor electrodes: |
This subclass is indented under subclass 658. Subject matter wherein the space between a capacitor"s parallel plates is changed in effecting the measurement. | |
662 | To determine dimension (e.g., thickness or distance): | ||||||||||
This subclass is indented under subclass 661. Subject matter wherein the physical characteristics of an
object pertaining to its size or distance from a reference point
are measured.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
663 | Where a material or object forms part of the dielectric being measured: | ||
This subclass is indented under subclass 658. Subject matter including measurement of the insulating material
between the two plates of a capacitor.
SEE OR SEARCH CLASS:
| |||
664 | To determine water content: | ||||||||||||||||||||
This subclass is indented under subclass 663. Subject matter including measurement of the material or
object water content.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||||||
665 | By comparison or difference circuit: | ||||||||||
This subclass is indented under subclass 664. Subject matter including means to match two or more electrical
quantities for the purpose of determining their relative values
in evaluating the water content of a material or object.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||
666 | Including a bridge circuit: | ||||||||
This subclass is indented under subclass 665. Subject matter including a multi-terminal network
capable of balance or comparison.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
667 | By frequency signal response, change or processing circuit: | ||||||
This subclass is indented under subclass 664. Subject matter including circuit means to measure using
a function of frequency signal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
668 | Including a tuned or resonant circuit: | ||||||||
This subclass is indented under subclass 667. Subject matter including a circuit which typically contains
both inductance and capacitance and is tuned to resonate at a certain
frequency.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
669 | With compensation means: | ||||
This subclass is indented under subclass 664. Subject matter including means to offset errors or undesirable
characteristics in the measurement or test apparatus or process.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
670 | For temperature variations: | ||||
This subclass is indented under subclass 669. Subject matter including the errors or undesirable characteristics
caused by an increase or decrease in ambient temperature.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
671 | To determine dimension (e.g., dielectric thickness): | ||||||||
This subclass is indented under subclass 663. Subject matter wherein the physical characteristics of a
dielectric object under test pertaining to its size or distance
from a reference point are measured.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
672 | By comparison or difference circuit: | ||||||||||||
This subclass is indented under subclass 663. Subject matter including means to match two or more electrical
quantities for the purpose of determining their relative values
in evaluating the dielectric characteristic of a material or object.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||||
673 | Including a bridge circuit: | ||||||||
This subclass is indented under subclass 672. Subject matter including a multi-terminal network
capable of comparison or balance.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
674 | By frequency signal response, change or processing circuit: | ||||||||
This subclass is indented under subclass 663. Subject matter including circuit means to determine or alter
a signal as a function of frequency.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
675 | Including a tuned or resonant circuit: | ||||||||
This subclass is indented under subclass 674. Subject matter including a circuit which typically contains
both inductance and capacitance and is tuned to resonate at a certain
frequency.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
676 | With pulse signal processing circuit: | ||
This subclass is indented under subclass 658. Subject matter including circuit means utilizing a pulse
signal time domain response or shaping.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
677 | Including R/C time constant circuit: | ||
This subclass is indented under subclass 676. Subject matter including a time-determining network
of resistors and capacitors in which the time constant is defined
as resistance times capacitance.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
678 | Including charge or discharge cycle circuit: | ||
This subclass is indented under subclass 676. Subject matter including circuit means to store or release
electrical energy periodically.
SEE OR SEARCH CLASS:
| |||
679 | With comparison or difference circuit: | ||||||||||||
This subclass is indented under subclass 658. Subject matter including means to match two or more electrical
quantities for the purpose of determining their relative values.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||||
680 | Including a bridge circuit: | ||||||||
This subclass is indented under subclass 679. Subject matter wherein the comparison or difference circuit
means includes a multi-terminal network capable of balance.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
681 | With frequency signal response, change or processing circuit: | ||||||
This subclass is indented under subclass 658. Subject matter including circuit means to determine or alter
a signal as a function of frequency.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
682 | Including a tuned or resonant circuit: | ||||||||
This subclass is indented under subclass 681. Subject matter including a circuit which typically contains
both inductance and capacitance and is tuned to resonate at a certain
frequency.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||
683 | With phase signal processing circuit: | ||||
This subclass is indented under subclass 658. Subject matter including circuit means responsive to the
phase of an electrical signal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
684 | With compensation means: | ||||
This subclass is indented under subclass 658. Subject matter including means to offset errors or undesirable
characteristics in the measurement or test apparatus or process.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
685 | For temperature variation: | ||||
This subclass is indented under subclass 684. Subject matter including means to offset effects caused
by changes in the ambient temperature.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
686 | With capacitive sensing means: | ||
This subclass is indented under subclass 658. Subject matter including probing or transducing means which
utilizes a capacitor.
SEE OR SEARCH CLASS:
| |||
687 | Having fringing field coupling: | ||
This subclass is indented under subclass 686. Subject matter wherein the sensing means is located in close
proximity to a test object and produces an electric field which
links or couples the test object to itself, with a change
in the electric field caused by the object being utilized to determine
a characteristic of the test object.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
688 | Including a guard or ground electrode: | ||
This subclass is indented under subclass 686. Subject matter including a conducting element of offset
or eliminate undesirable electrical effects.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
689 | To determine water content: | ||||||||||||||||
This subclass is indented under subclass 686. Subject matter including measurement of the water content
of a material of object.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||
690 | Including a probe type structure: | ||
This subclass is indented under subclass 686. Subject matter wherein the capacitive sensing means has
a particular shape or configuration to improve its transducing or
pickup function.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
691 | Using resistance or conductance measurement: | ||||
This subclass is indented under subclass 649. Subject matter including measuring that property of an object
which impedes current and results in the dissipation of power in
the form of heat, or the property that is the factor by which
the square of an instantaneous voltage must be multiplied to give
the corresponding energy lost by dissipation as heat or other permanent
radiation.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
692 | With living organism condition determination using conductivity effects: |
This subclass is indented under subclass 691. Subject matter including means to evaluate properties of a living organism by measuring or testing its ability to conduct electrical current. | |
693 | With object or substance characteristic determination using conductivity effects: | ||
This subclass is indented under subclass 691. Subject matter including means to evaluate the properties
of an object by measuring or testing its ability to conduct current.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
694 | To determine water content: | ||||||||||||||||||||
This subclass is indented under subclass 693. Subject matter including measurement of the water content
of the object or substance being tested.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||||||
695 | Where the object moves while under test: | ||||
This subclass is indented under subclass 694. Subject matter wherein the test substance is in motion during
the water content determination.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
696 | With a probe structure: | ||||||
This subclass is indented under subclass 694. Subject matter with a particular sensing configuration.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
697 | For interface: |
This subclass is indented under subclass 693. Subject matter including means to evaluate the point or points of contact between different substances. | |
698 | To determine oil qualities: | ||
This subclass is indented under subclass 693. Subject matter including means to evaluate the properties
of a fluid containing petroleum or its derivatives (i.e., lubricants).
SEE OR SEARCH CLASS:
| |||
699 | To determine dimension (e.g., distance or thickness): | ||||||||||
This subclass is indented under subclass 693. Subject matter including means to evaluate alterations in
the physical shape of an object.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||
700 | Including corrosion or erosion: | ||||||||||
This subclass is indented under subclass 699. Subject matter including means to evaluate the addition
or loss of material, to or from a substance, due
to environmental conditions.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
701 | Where the object moves while under test: | ||||
This subclass is indented under subclass 693. Subject matter wherein the test object is in motion during
the evaluation of the characteristics of the object.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
702 | With radiant energy effects: | ||||||||||
This subclass is indented under subclass 691. Subject matter including means to evaluate the properties
of an object, utilizing a source of radiant energy as a
preparation to the test.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
703 | Including heating: |
This subclass is indented under subclass 702. Subject matter wherein the radiant energy increases the temperature of the object being evaluated. | |
704 | With ratio determination: | ||||||
This subclass is indented under subclass 691. Subject matter including evaluating means which utilize
a value which represents the ratio of a first signal to a second
signal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
705 | With comparison or difference circuit: | ||||||||||||
This subclass is indented under subclass 691. Subject matter including means to match two or more electrical
quantities for the purpose of determining their relative values.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||||
706 | Including a bridge circuit: | ||||||||||||||||
This subclass is indented under subclass 705. Subject matter wherein the comparison or difference circuit
means includes a multi-terminal network capable of balance.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||||||||
707 | With frequency response, change or processing circuit: | ||||||
This subclass is indented under subclass 691. Subject matter including circuit means to determine or alter
a signal as a function of frequency.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
708 | Including a tuned or resonant circuit: | ||||||
This subclass is indented under subclass 707. Subject matter including a circuit which typically contains
both inductance and capacitance and is tuned to resonate at a certain
frequency.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
709 | With phase signal processing circuit: | ||
This subclass is indented under subclass 691. Subject matter including circuit means responsive to the
phase of an electrical signal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
710 | With pulse signal processing circuit: | ||
This subclass is indented under subclass 691. Subject matter including circuit means to utilize electrical
signal pulses and their time domain response or shaping.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
711 | Including R/C time constant circuit: | ||||
This subclass is indented under subclass 710. Subject matter including a time-determining network
of resistors and capacitors.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
712 | Including a digital or logic circuit: | ||||||
This subclass is indented under subclass 710. Subject matter including a circuit wherein nonarithmetical
operations are performed using digital electrical signal information.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
713 | With voltage or current signal evaluation: | ||
This subclass is indented under subclass 691. Subject matter including means to measure or test the characteristics
of an electrical signal as to its voltage or current.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
714 | Including a potentiometer: | ||
This subclass is indented under subclass 713. Subject matter including a variable voltage divider used
for measuring an unknown electromotive force or potential difference.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
715 | Including a particular probing technique (e.g., four point probe): | ||
This subclass is indented under subclass 713. Subject matter wherein electrical contact is made at a specified
point, in particular fashion in order to effect a measurement
or test.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
716 | To determine dimension (e.g., distance or thickness): | ||||||||||
This subclass is indented under subclass 715. Subject matter including means to evaluate alterations in
the physical shape of an object.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||
717 | To determine material composition: | ||||
This subclass is indented under subclass 715. Subject matter wherein the voltage or current signal evaluation
or processing is used to determine the quantity, quality
or percentage of substances that make up the test object.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
718 | To detect a flaw defect: | ||
This subclass is indented under subclass 715. Subject matter including means to detect any discontinuity
in a substance that would be harmful to the proper functioning of
the substance.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
719 | With semiconductor or IC materials quality determination using conductivity effects: | ||||||||||
This subclass is indented under subclass 691. Subject matter including means to evaluate the properties
of semiconductor or integrated circuit material.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
720 | With compensation means: | ||||||
This subclass is indented under subclass 691. Subject matter including means to offset errors or undesirable
characteristics in the measurement or test apparatus or process.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
721 | For temperature variation: | ||||
This subclass is indented under subclass 720. Subject matter including means to offset effects caused
by changes in the ambient temperature.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
722 | Device or apparatus determines conductivity effects: | ||||||
This subclass is indented under subclass 691. Subject matter including means to evaluate the ability of
a substance to conduct electrical current.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
723 | Potentiometer: | ||
This subclass is indented under subclass 722. Subject matter where the object being evaluated has the
structure of a voltage divider.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
724 | Using a probe type structure: | ||||||||
This subclass is indented under subclass 722. Subject matter wherein the apparatus has a particular shape
or configuration to improve its transducing or pickup function.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
725 | Using a particular bridge circuit: | ||
This subclass is indented under subclass 600. Subject matter including a multiterminal network capable
of balance or comparison and not elsewhere classified.
| |||
726 | Transformer testing (e.g., ratio): | ||||
This subclass is indented under subclass 600. Subject matter including means for determining properties
of transformers.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
727 | Piezoelectric crystal testing (e.g., frequency, resistance): | ||||||
This subclass is indented under subclass 600. Subject matter including means for determining the properties
of piezoelectric crystals.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
750.01 | Measurement or control of test condition: |
This subclass is indented under subclass 537. Subject matter wherein a condition (e.g., temperature, applied voltage, pressure) of the device under test, or of the testing equipment, is set up prior to or maintained during the test. | |
750.02 | Calibration of test equipment: |
This subclass is indented under subclass 750.01. Subject matter wherein a precondition of the test equipment is measured or adjusted to meet a certain standard. | |
750.03 | Thermal preconditioning or temperature control: |
This subclass is indented under subclass 750.01. Subject matter including means to set or maintain the temperature of the device under test, or the temperature of the testing equipment, at a desired level before or during the test. | |
750.04 | Thermal matching of guidance member: |
This subclass is indented under subclass 750.03. Subject matter wherein means to guide or align contacts on the testing device with respect to contacts on the device under test is heated or cooled to match the thermal impedance of the device under test. | |
750.05 | Burn-in: |
This subclass is indented under subclass 750.03. Subject matter including means for raising the temperature of the device under test for a specified period of time under an electrical power stress. | |
750.06 | With temperature sensing: |
This subclass is indented under subclass 750.05. Subject matter for measuring the temperature of the device under test during burn-in. | |
750.07 | With feedback control: |
This subclass is indented under subclass 750.06. Subject matter for automatically varying or regulating the temperature of the device under test by sensing deviations of its temperature from a desired value. | |
750.08 | By fluid: |
This subclass is indented under subclass 750.03. Subject matter wherein the temperature of the device under test or of the testing equipment is varied or maintained by the circulation of a heating or cooling liquid or gas. | |
750.09 | By heat sink: |
This subclass is indented under subclass 750.03. Subject matter wherein the temperature of the device under test is varied or maintained by the conduction of heat from the DUT to a heat absorbing means. | |
750.1 | With biasing means: |
This subclass is indented under subclass 750.09. Subject matter comprising means to urge the device under test into contact with the heat conducting or absorbing means. | |
750.11 | Thermoelectric: |
This subclass is indented under subclass 750.03. Subject matter wherein the temperature preconditioning or control means includes means that directly converts electric energy to heat. | |
750.12 | Electromagnetic: |
This subclass is indented under subclass 750.03. Subject matter wherein the temperature preconditioning or control means includes means for raising or maintaining the temperature of the device under test or the testing equipment by electromagnetic radiation. | |
750.13 | Of test device transporting means: |
This subclass is indented under subclass 750.03. Subject matter wherein a means for moving the test device to a testing station includes means to set or maintain the temperature of the device to be tested. | |
750.14 | Environmental control: |
This subclass is indented under subclass 537. Subject matter comprising means to change or maintain a characteristic, of the surroundings of the test, e.g., humidity, vibration. | |
750.15 | With identification on device under test (DUT): | ||||
This subclass is indented under subclass 537. Subject matter wherein a device under test (DUT) has
unique marks or codes that can be read to determine the identity
of the DUT.
| |||||
750.16 | Relative positioning or alignment of device under test and test structure: | ||
This subclass is indented under subclass 537. Subject matter comprising means to position, or
to assist in the position of, a testing structure, e.g., a
test head, relative to a device under test, or
vice versa.
| |||
750.17 | By capacitive means: |
This subclass is indented under subclass 750.16. Subject matter including means for sensing the capacitance between the device under test and the test structure. | |
750.18 | By information on device under test: |
This subclass is indented under subclass 750.16. Subject matter including alignment information on the device under test or test structure. | |
750.19 | Adjustable support for device under test: |
This subclass is indented under subclass 750.16. Subject matter wherein a dimension of the support for the device under test is variable. | |
750.2 | Vacuum support: |
This subclass is indented under subclass 750.19. Subject matter wherein the device under test is affixed to the support by sub-atmospheric pressure. | |
750.21 | Magnetic support: |
This subclass is indented under subclass 750.19. Subject matter wherein the device under test is affixed to the support by a magnetic attraction. | |
750.22 | Testing device mounted for multi-directional movement: |
This subclass is indented under subclass 750.16. Subject matter wherein the support for the testing permit movements relative to the device under test in two or more intersecting directions. | |
750.23 | Using optical means: |
This subclass is indented under subclass 750.16. Subject matter including means for optically sensing the alignment of the device under test and the test structure. | |
750.24 | By electrical contact means: |
This subclass is indented under subclass 750.16. Subject matter including electrical contacts on the device under test and on the test structure which are mutually engageable to indicate alignment thereof. | |
750.25 | By mechanical means: |
This subclass is indented under subclass 750.16. Subject matter including physical structures on the device under test and on the test structure which cooperate to align the two. | |
750.26 | Shielding or casing of device under test or of test structure: |
This subclass is indented under subclass 537. Subject matter comprising means surrounding the device under test or the test structure to prevent, or reduce the influence of, external effects, e.g., air current, electromagnetic fields. | |
750.27 | EMI interference: |
This subclass is indented under subclass 750.26. Subject matter wherein the external effect is electromagnetic radiation. | |
750.28 | Temperature effect: |
This subclass is indented under subclass 750.26. Subject matter wherein the external effect is heat or cold. | |
750.29 | Mechanical effect: |
This subclass is indented under subclass 750.26. Subject matter wherein the external effect is mechanical stress, shock, or vibration. | |
750.3 | Built-in test circuit: |
This subclass is indented under subclass 537. Subject matter wherein the means for testing is a circuit incorporated into the component under test. | |
754.01 | Test probe techniques: |
This subclass is indented under subclass 537. Subject matter comprising non-quantitative tests using a test structure (probe) that transmits a test signal to the device under test which is returned to and detected by the testing structure. | |
754.02 | Hand-held: |
This subclass is indented under subclass 754.01. Subject matter wherein the test structure is a hand held probe. | |
754.03 | Contact probe: |
This subclass is indented under subclass 754.01. Subject matter wherein the test signal is transmitted to and received from the device under test by direct ohmic contact between the device under test and the testing structure. | |
754.04 | Liquid state: |
This subclass is indented under subclass 754.03. Subject matter wherein the direct contact is made through a conductive fluid. | |
754.05 | Kelvin probe: |
This subclass is indented under subclass 754.03. Subject matter wherein the test structure includes two separate contact point, one for current and one for voltage. | |
754.06 | Waveguide probe: |
This subclass is indented under subclass 754.03. Subject matter wherein the contacts are mounted on a waveguide or transmission line. | |
754.07 | Probe or probe card with built-in circuit element: | ||
This subclass is indented under subclass 754.03. Subject matter wherein the contact probe or its immediate
support includes an electronic circuit component.
| |||
754.08 | In or on support for device under test: |
This subclass is indented under subclass 754.03. Subject matter wherein the transmitter/receiver contacts are built into or on means for holding the device under test. | |
754.09 | Carrier feature: |
This subclass is indented under subclass 754.08. Subject matter wherein a support for the device under test includes a built-in testing circuit. | |
754.1 | Probe contact confirmation: |
This subclass is indented under subclass 754.03. Subject matter including a feature to enable determination whether proper probe contact has been made. | |
754.11 | Probe contact enhancement or compensation: | ||
This subclass is indented under subclass 754.03. Subject matter including a feature for aiding the probe
to make proper contact.
| |||
754.12 | Biasing means: |
This subclass is indented under subclass 754.03. Subject matter including means to urge a contact on the testing structure into engagement with a contact on the device under test. | |
754.13 | Mechanical: |
This subclass is indented under subclass 754.12. Subject matter wherein the biasing means includes a mechanism to urge the contacts into engagement. | |
754.14 | Spring: |
This subclass is indented under subclass 754.12. Subject matter including a resilient member to urge the contacts into engagement. | |
754.15 | Fluid pressure: |
This subclass is indented under subclass 754.12. Subject matter wherein the contacts are urged into engagement by gas or liquid pressure. | |
754.16 | Chamber or bladder: |
This subclass is indented under subclass 754.15. Subject matter wherein the gas or liquid pressure is created or maintained by a resilient gas or liquid storage device. | |
754.17 | Magnetic means: |
This subclass is indented under subclass 754.12. Subject matter wherein the contacts are urged into engagement by magnetic force. | |
754.18 | With interpose: |
This subclass is indented under subclass 754.03. Subject matter wherein the signal is transmitted to and received from the device under test through a substrate or layer having a plurality of electrical inter-connectors. | |
754.19 | With recording of test result: |
This subclass is indented under subclass 754.03. Subject matter comprising means for capturing and storing the results of the test. | |
754.2 | Penetrative: |
This subclass is indented under subclass 754.03. Subject matter wherein the contact probe includes means to scrape away or pierce an oxidation layer on the contact point of the device under test. | |
754.21 | Non-contact probe: |
This subclass is indented under subclass 754.01. Subject matter wherein the test signal is transmitted to and received from the device under test by some means other than direct ohmic contact between the device under test and the testing structure. | |
754.22 | Electron beam: |
This subclass is indented under subclass 754.21. Subject matter wherein the test signal is transmitted to and from the device under test by a beam of electrons. | |
754.23 | Optical beam: |
This subclass is indented under subclass 754.21. Subject matter wherein the test signal is transmitted to and from the device under test by a beam of light, e.g., a laser beam. | |
754.24 | With plasma probe: |
This subclass is indented under subclass 754.21. Subject matter wherein the test signal is transmitted to and from the device under test by utilizing plasma gas directed across the surface of the device under test. | |
754.25 | Ultrasonic: |
This subclass is indented under subclass 754.21. Subject matter wherein the test signal is transmitted to and from the device under test by a beam of sound waves having a frequency above the audible range. | |
754.26 | Tunnel current probe: |
This subclass is indented under subclass 754.21. Subject matter wherein the test signal is transmitted to and from the device under test by tunnel current flowing therebetween. | |
754.27 | Electrical field: |
This subclass is indented under subclass 754.21. Subject matter wherein the test signal is transmitted to and from the device under test by an electric field. | |
754.28 | Capacitive coupling: |
This subclass is indented under subclass 754.27. This subclass is indented Subject matter wherein the signal is transmitted between an electric field emitting probe and the device under test by mutual electrostatic induction. | |
754.29 | Magnetic field: |
This subclass is indented under subclass 754.21. This subclass is indented Subject matter wherein the test signal is transmitted to and from the device under test by a magnetic field. | |
754.3 | Intermolecular: |
This subclass is indented under subclass 754.21. Subject matter wherein the test signal is transmitted to and from the device under test by intermolecular or Coulomb forces. | |
754.31 | Radio wave: |
This subclass is indented under subclass 754.21. Subject matter wherein the test signal is transmitted to and from the device under test by a modulated electromagnetic carrier wave. | |
755.01 | Probe structure: |
This subclass is indented under subclass 537. Subject matter comprising means to transmit a test signal to a device under test and to detect a returned signal. | |
755.02 | Coaxial: |
This subclass is indented under subclass 755.01. Subject matter wherein the probe consists of two electrical conductors, one inside the other and separated by a dielectric material. | |
755.03 | Rigid: |
This subclass is indented under subclass 755.01. Subject matter wherein the probe is inflexible. | |
755.04 | Force absorption: |
This subclass is indented under subclass 755.01. Subject matter comprising means to absorb forces directed longitudinally of the probe. | |
755.05 | Spring: |
This subclass is indented under subclass 755.04. Subject matter wherein the force is absorbed by a flexible member against which the probe acts. | |
755.06 | Buckling: |
This subclass is indented under subclass 755.04. Subject matter wherein the longitudinal force is absorbed by lateral deflection of a flexible probe. | |
755.07 | Cantilever: |
This subclass is indented under subclass 755.01. Subject matter comprising flexible probes which are supported generally perpendicularly with respect to the direction of their contact with the device under test. | |
755.08 | Elastomeric: |
This subclass is indented under subclass 755.01. Subject matter comprising probes made of a resilient material having suitable compressive and adhesive characteristic and containing conductive particles which produce z-axis conduction when pressed in a z-axis direction. | |
755.09 | Membrane: |
This subclass is indented under subclass 755.01. Subject matter comprising probes characterized by a flexible or semi-flexible substrate with traces and contacting portions supported together to contact the device under test. | |
755.1 | Dendritic structure: |
This subclass is indented under subclass 755.01. Subject matter wherein the contact surface of the probe includes minute finger-like or particle-like protrusions. | |
755.11 | Elongated pin or probe: |
This subclass is indented under subclass 755.01. Subject matter wherein the probe or probing structure has a slender, rod-like shape. | |
756.01 | Support for device under test or test structure: |
This subclass is indented under subclass 537. Subject comprising means to support the device under test or to support a test structure. | |
756.02 | DUT socket or carrier: |
This subclass is indented under subclass 756.01. Subject matter wherein the supporting device is socket or carrier retaining the device under test and coupled to the test structure for making electrical contact with the device under test. | |
756.03 | Probe card: |
This subclass is indented under subclass 756.01. Subject matter wherein the support is a holding device for holding plurality of probe elements and for providing a desired pressure of the probe elements against the device under test. | |
756.04 | Pin fixture: |
This subclass is indented under subclass 756.01. Subject matter for attaching a probe to a probe card or other support. | |
756.05 | With electrical connectors: |
This subclass is indented under subclass 756.01. Subject matter including means to electrically connect a probe to other electrical circuitry. | |
756.06 | With impedance matching: |
This subclass is indented under subclass 756.01. Subject matter wherein the support includes circuitry for matching or regulating the impedance characteristic between the test structure and the device under test. | |
756.07 | Board or plate: |
This subclass is indented under subclass 756.01. Subject matter wherein the support is a planar member. | |
757.01 | Transporting or conveying the device under test to the testing station: | ||||
This subclass is indented under subclass 537. Subject matter for moving the device to be tested to the
testing structure.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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757.02 | Printed circuit board: | ||
This subclass is indented under subclass 757.01. Subject matter wherein the device to be tested is an essentially
two-sided dielectric member on at least one side of which
circuit elements are mounted or deposited.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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757.03 | Wafer: | ||
This subclass is indented under subclass 757.01. Subject matter wherein the device to be tested consists
of a thin slice of semiconductor material.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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757.04 | Packaged IC or unpackaged die or dice: |
This subclass is indented under subclass 757.01. Subject matter wherein the device to be tested is an integrated circuit contained in a protective means and provided with electrical access means. | |
757.05 | Multiple chip module: |
This subclass is indented under subclass 757.01. Subject matter wherein the device to be tested is a specialized electronic package where multiple integrated circuits (ICs), semiconductor dies or other modules are packaged in such a way as to facilitate their use as a single IC. | |
758.01 | Cleaning probe or device under test: |
This subclass is indented under subclass 537. Subject matter wherein the further processing includes removing undesired material from the test probe or the device under test. | |
758.02 | By laser ablation: |
This subclass is indented under subclass 758.01. Subject matter wherein the probe is cleaned by burning off the undesired material by laser radiation. | |
758.03 | By blowing air: |
This subclass is indented under subclass 758.01. Subject matter wherein the probe is cleaned by a stream of air flowing over it. | |
758.04 | By scraping: |
This subclass is indented under subclass 758.01. Subject matter wherein the probe is cleaned mechanical abrasion. | |
758.05 | By chemical means: |
This subclass is indented under subclass 758.01. Subject matter wherein the probe is cleaned by the action of a chemical applied to the undesired material. | |
759.01 | After-test activity: |
This subclass is indented under subclass 537. Subject matter wherein the device under test or the testing equipment undergoes further processing after the test tested. | |
759.02 | Marking tested objects: |
This subclass is indented under subclass 759.01. Subject matter wherein the further processing includes marking the tested device to indicate its passed/failed status. | |
759.03 | Sorting tested objects: |
This subclass is indented under subclass 759.01. Subject matter wherein the further processing includes the separation of passed tested devices from failed ones. | |
760.01 | Test of liquid crystal device: | ||||||||||||||
This subclass is indented under subclass 537. Subject matter including test of a device whose reflectance
or transmittance properties change when an electric field is applied.
SEE OR SEARCH CLASS:
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760.02 | Thin film transistor type (TFT): |
This subclass is indented under subclass 760.01. Subject matter wherein each pixel of an LCD includes a switching transistor. | |
761.01 | Test of solar cell: |
This subclass is indented under subclass 537. Subject matter including test of a device that generates electricity when exposed to sun light or activated by heat from the sun. | |
762.01 | Test of semiconductor device: | ||
This subclass is indented under subclass 537. Subject matter including a determination of faults in an
electronic circuit or circuit component made of a material which
is a solid or liquid conductor with resistivity between that of
metals and that of insulators.
SEE OR SEARCH CLASS:
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762.02 | Packaged integrated circuits: |
This subclass is indented under subclass 762.01. Subject matter wherein the semiconductor device is contained in a protective means and provided with electrical access means. | |
762.03 | Integrated circuit die: |
This subclass is indented under subclass 762.01. Subject matter wherein the semiconductor device is one of several complete circuits formed on a slice of semiconductor material. | |
762.04 | TAB carrier: |
This subclass is indented under subclass 762.03. Subject matter wherein the die is carried on a tape, such as a TAB (tape Automated Bonding) carrier. | |
762.05 | Semiconductor wafer: |
This subclass is indented under subclass 762.01. Subject matter wherein the semiconductor device is a thin slice of semiconductive material. | |
762.06 | Multiple chip module: |
This subclass is indented under subclass 762.01. Subject matter wherein the device to be tested is a specialized electronic package where multiple integrated circuits (ICs), semiconductor dies or other modules are packaged in such a way as to facilitate their use as a single IC. | |
762.07 | Diode: |
This subclass is indented under subclass 762.01. Subject matter wherein the semiconductor device is comprised of two-electrodes (anode and cathode and a single junction (P-N). | |
762.08 | Bipolar transistor: |
This subclass is indented under subclass 762.01. Subject matter wherein the semiconductor device has at least three electrodes (emitter, base, and collector), two potential barriers and a controlled current flow of both majority and minority carriers (holes and electrons). | |
762.09 | Field effect transistor: |
This subclass is indented under subclass 762.01. Subject matter wherein the semiconductor device is a unipolar transistor in which current carriers are injected at a source terminal and pass to a drain terminal through a channel of semiconductor material whose conductivity depends largely on an electrical field applied to the semiconductor from a control electrode (gate). | |
762.1 | With barrier layer: |
This subclass is indented under subclass 762.01. Subject matter wherein the individual circuit component having a region in which the mobile carrier charge density is insufficient to neutralize the net fixed charge density of donors and acceptors. | |
763.01 | Printed circuit board: | ||||
This subclass is indented under subclass 537. Subject matter in which the tested component consists of
an essentially two-sided dielectric member on at least
one side of which circuit elements are mounted or deposited.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
763.02 | Both sides: |
This subclass is indented under subclass 763.01. Subject matter comprising printed circuit boards having circuit elements mounted or deposited on opposite sides. | |
764.01 | Power supply: | ||||
This subclass is indented under subclass 537. Subject matter wherein the electric component tested is
a source of electrical power.
SEE OR SEARCH CLASS:
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765.01 | Motor or generator fault: | ||||||||||||||
This subclass is indented under subclass 537. Subject matter wherein the electrical component tested is (a) a
prime mover rotating electrical machine, or (b) a
rotating electrical machine which changes mechanical energy into
electrical energy.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
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CROSS-REFERENCE ART COLLECTIONS
800 | Divining rods: | ||
Subject matter relating to a forked branch or stick alleged
to reveal hidden water or minerals by dipping downward.
| |||
The definitions below correspond to abolished subclasses from which these collections were formed. See the Foreign Art Collection schedule of this class for specific correspondence. [Note: The titles and definitions for indented art collections include all the details of the one(s) that are hierarchically superior.] | |||||||||||||||
FOR 100 | System sensing fields adjacent device under test (DUT): | ||||||||||||||
Foreign art collection for detecting faults by sensing an electromagnetic field produced by a device under test. | |||||||||||||||
FOR 101 | Using electron beam probe: | ||||||||||||||
Foreign art collection wherein a cathode- ray device is used to sense the fields. | |||||||||||||||
FOR 102 | Using light probe: | ||||||||||||||
Foreign art collection wherein light such as a laser beam is used to sense the fields. | |||||||||||||||
FOR 103 | Using electro-optic device: | ||||||||||||||
Foreign art collection wherein an electro-optic device such as an electroluminor is used to sense the fields. | |||||||||||||||
FOR 104 | With probe elements: | ||||||||||||||
Foreign art collection including a feature to enable contact between a device under test (DUT) and a test apparatus. | |||||||||||||||
FOR 105 | Internal of or on support for device under test (DUT): | ||||||||||||||
Foreign art collection including a support for the DUT and wherein probe elements are mounted in or on the support. | |||||||||||||||
FOR 106 | Contact confirmation: | ||||||||||||||
Foreign art collection including a feature to enable determination whether proper probe contact has been made. | |||||||||||||||
FOR 107 | Probe contact enhancement: | ||||||||||||||
Foreign art collection including a feature for aiding the probe to make proper contact. | |||||||||||||||
FOR 108 | Probe alignment or positioning: | ||||||||||||||
Foreign art collection including a feature for checking or providing for proper position of probes with respect to contact points on the DUT. | |||||||||||||||
FOR 109 | With recording of test results of DUT: | ||||||||||||||
Foreign art collection including means for receiving the results of a test on the DUT. | |||||||||||||||
FOR 110 | With temperature control: | ||||||||||||||
Foreign art collection including means to regulate temperature of the DUT or an apparatus used in testing. | |||||||||||||||
FOR 111 | Pin: | ||||||||||||||
Foreign art collection wherein the probe element is a connecting device such as a spring biased rod or a buckling beam (rod). | |||||||||||||||
FOR 112 | Cantilever: | ||||||||||||||
Foreign art collection including a probe element set at a first end of a beam wherein the beam has a first end and a second end and the second end is attached to a support. | |||||||||||||||
FOR 113 | DUT including test circuit: | ||||||||||||||
Foreign art collection wherein a device under test (DUT) has
integral elements which can be manipulated to configure the DUT
so that tests can be made.
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FOR 114 | With identification of DUT: | ||||||||||||||
Foreign art collection wherein a device under test (DUT) has
unique marks or codes that can be read to determine the identity
of the DUT.
| |||||||||||||||
FOR 115 | Test of semiconductor device: | ||||||||||||||
Foreign art collection including a determination of faults in a material which is a solid or liquid conductor with resistivity between that of metals and that of insulators. | |||||||||||||||
FOR 116 | With barrier layer: | ||||||||||||||
Foreign art collection having a region in which the mobile-carrier charge density is insufficient to neutralize the net fixed charge density of donors and acceptors. | |||||||||||||||
FOR 117 | Diode: | ||||||||||||||
Foreign art collection including a two electrode (anode and cathode), single junction (PN) semiconductor device used as an active switching element responsive to respective input logic signals to perform the logic function. | |||||||||||||||
FOR 118 | Bipolar transistor: | ||||||||||||||
Foreign art collection including a semiconductor
device of the type having at least three electrodes (emitter, base, and
collector), two potential barriers and having
a controlled current flow of both majority and minority carriers (i.e., holes
and electrons).
| |||||||||||||||
FOR 119 | Field effect transistor: | ||||||||||||||
Foreign art collection wherein a logic circuit includes
one or more unipolar transistors in which current carriers are injected
at a source terminal through a channel of semiconductor material
whose conductivity depends largely on an electrical field applied
to the semiconductor from a control electrode (gate).
| |||||||||||||||
FOR 120 | Liquid crystal device test: | ||||||||||||||
Foreign art collection including test of a device
whose reflectance or transmittance properties change when an electric
field is applied.
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FOR 121 | Power supply test: | ||||||||||||||
Foreign art collection including test of an electrical
power source wherein the electrical power source is obtained by
rectifying an AC source or using a DC source.
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FOR 122 | Motor or generator fault tests: | ||||||||||||||
Foreign art collection including fault tests of (a) prime
mover rotating electrical machinery; (b) rotating
electrical machinery which changes mechanical energy to electrical energy.
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FOR 123 | MISCELLANEOUS: | ||||||||||||||
Foreign art collection not provided for in any preceding subclass. | |||||||||||||||