| Class 702 | DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING |
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![[List of Pre Grant Publications for class 702 subclass 1]](../as.gif) | ![[List of Patents for class 702 subclass 1]](../ps.gif) | 1 | MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT |
| | 2 |  Earth science |
| | 3 |  Weather |
| | 5 | Topography (e.g., land mapping) |
| | 6 | Well logging or borehole study |
| | 7 |  By induction or resistivity logging tool |
| | 8 | By radiation (e.g., nuclear, gamma, X-ray) |
| | 9 | Drilling |
| | 10 | Dipmeter |
| | 11 | Formation characteristic |
| | 14 | Seismology |
| | 19 | Biological or biochemical |
| | 22 | Chemical analysis |
| | 23 | Quantitative determination (e.g., mass, concentration, density) |
| | 24 | Gaseous mixture (e.g., solid-gas, liquid-gas, gas-gas) |
| | 25 | Liquid mixture (e.g., solid-liquid, liquid-liquid) |
| | 26 | By particle count |
| | 27 | Molecular structure or composition determination |
| | 29 | Particle size determination |
| | 30 | Chemical property analysis |
| | 31 | Specific operation control system |
| | 32 | Specific signal data processing |
| | 33 | Mechanical measurement system |
| | 34 | Wear or deterioration evaluation |
| | 35 | Flaw or defect detection |
| | 36 | Location |
| | 38 | Electromagnetic (e.g., eddy current) |
| | 39 | Sound energy (e.g., ultrasonic) |
| | 40 | Radiant energy (e.g., X-ray, infrared, laser) |
| | 41 | Force or torque measurement |
| | 45 | Flow metering |
| | 50 | Fluid measurement (e.g., mass, pressure, viscosity) |
| | 51 | Leak detecting |
| | 52 | Capacitive sensor |
| | 53 | Resistive sensor |
| | 54 | Acoustic or vibration sensor |
| | 55 | Liquid level or volume determination |
| | 56 | Vibration detection |
| | 57 | Electrical signal parameter measurement system |
| | 58 | For electrical fault detection |
| | 60 | Power parameter |
| | 64 | Voltage or current |
| | 66 | Waveform analysis |
| | 67 | Display of waveform |
| | 69 | Signal quality (e.g., timing jitter, distortion, signal-to-noise ratio) |
| | 70 | Waveform extraction |
| | 71 | Waveform-to-waveform comparison |
| | 75 | Frequency |
| | 79 | Time-related parameter (e.g., pulse-width, period, delay, etc.) |
| | 80 | Specified memory location generation for storage |
| | 81 | Quality evaluation |
| | 85 | CALIBRATION OR CORRECTION SYSTEM |
| | 86 | Linearization of measurement |
| | 87 | Zeroing (e.g., null) |
| | 88 | Zero-full scaling |
| | 89 | Timing (e.g., delay, synchronization) |
| | 90 | Error due to component compatibility |
| | 92 | Direction (e.g., compass) |
| | 94 | Position measurement |
| | 96 | Speed |
| | 97 | Length, distance, or thickness |
| | 98 | Pressure |
| | 99 | Temperature |
| | 100 | Fluid or fluid flow measurement |
| | 101 | Weight |
| | 103 | Acoustic |
| | 104 | Sensor or transducer |
| | 105 | For mechanical system |
| | 106 | Signal frequency or phase correction |
| | 107 | Circuit tuning (e.g., potentiometer, amplifier) |
| | 108 | TESTING SYSTEM |
| | 109 | For transfer function determination |
| | 110 | Binary signal stimulus (e.g., pulse) |
| | 111 | Noise signal stimulus (e.g., white noise) |
| | 112 | Sinusoidal signal stimulus |
| | 113 | Of mechanical system |
| | 116 | Of sensing device |
| | 117 | Of circuit |
| | 118 | Testing multiple circuits |
| | 119 | Including program initialization (e.g., program loading) or code selection (e.g., program creation) |
| | 120 | Including input/output or test mode selection means |
| | 121 | Including multiple test instruments |
| | 122 | Including specific communication means |
| | 123 | Including program set up |
| | 124 | Signal generation or waveform shaping |
| | 127 | MEASUREMENT SYSTEM |
| | 128 | Article count or size distribution |
| | 130 | Temperature measuring system |
| | 131 | Body temperature |
| | 132 | Thermal protection |
| | 133 | By resistive means |
| | 134 | By radiant energy |
| | 136 | Thermal related property |
| | 137 | Density |
| | 138 | Pressure |
| | 141 | Accelerometer |
| | 142 | Speed |
| | 150 | Orientation or position |
| | 155 | Dimensional determination |
| | 156 | Area or volume |
| | 157 | Radius or diameter |
| | 158 | Linear distance or length |
| | 159 | By reflected signal (e.g., ultrasonic, light, laser) |
| | 160 | Pedometer |
| | 161 | Electronic ruler |
| | 162 | Micrometer |
| | 163 | By rotary encoding means |
| | 166 | Height or depth |
| | 167 | Contouring |
| | 170 | Thickness or width |
| | 173 | Weight |
| | 176 | Time duration or rate |
| | 177 | Due time monitoring (e.g., medication clock, maintenance interval) |
| | 178 | Timekeeping (e.g., clock, calendar, stopwatch) |
| | 179 | Statistical measurement |
| | 182 | Performance or efficiency evaluation |
| | 187 | History logging or time stamping |
| | 188 | Remote supervisory monitoring |
| | 189 | Measured signal processing |
| FOREIGN ART COLLECTIONS | ||
| FOR000 | CLASS-RELATED FOREIGN DOCUMENTS |
| Any foreign patents or non-patent literature from subclasses that have been reclassified have been transferred directly to FOR Collections listed below. These Collections contain ONLY foreign patents or non-patent literature. The parenthetical references in the Collection titles refer to the abolished subclasses from which these Collections were derived. | ||
| APPLICATIONS (364/400) |
| FOR100 | Earth sciences (e.g., weather) (364/420) |
| FOR103 | Electrical/electronic engineering (364/480) |
| Electrical/electronic engineering (364/480) |
| FOR115 | Chemical and engineering sciences (364/496) |
| FOR116 | Chemical analysis (364/497) |
| FOR119 | Chemical process control (364/500) |
| FOR123 | Mechanical and civil engineering (364/505) |
| FOR130 | Physics (364/524) |
| FOR134 | MEASURING, TESTING, OR MONITORING (364/550) |
| FOR135 | Measuring and evaluating (e.g., performance) (364/551.01) |
| FOR136 | Of machine tool (364/551.02) |
| FOR137 | Quality control determinations (364/552) |
| FOR138 | Transfer function evaluation (364/553) |
| FOR139 | Statistical data (e.g., stochastic variable) (364/554) |
| FOR140 | Particle count, distribution, size (364/555) |
| FOR141 | For basic measurements (364/556) |
| FOR142 | Temperature (364/557) |
| FOR143 | Pressure or density (364/558) |
| FOR144 | Orientation (364/559) |
| FOR145 | Dimension (364/560) |
| FOR150 | Rate of change of dimension (e.g., speed) (364/565) |
| FOR151 | Acceleration and further derivatives (364/566) |
| FOR152 | Weight (364/567) |
| FOR154 | Time or time intervals (364/569) |
| FOR155 | Operations performed (364/570) |
| FOR156 | Calibration or compensation |
| FOR157 | Having mathematical operation on initial measurement data (364/571.02) |
| FOR158 |  Including environmental factors (e.g., temperature) (364/571.03) |
| FOR159 | Including predetermined stored data (364/571.04) |
| FOR160 | Using difference involving initial measurement data (364/571.05) |
| FOR161 | Using analog calculating elements (364/571.06) |
| FOR162 | By table look-up (364/571.07) |
| FOR163 | Using operator provided data (364/571.08) |
| FOR164 | Filtering (364/572) |
| FOR165 | Linearization (364/573) |
| FOR166 | Noise reduction (364/574) |
| FOR167 | Averaging (364/575) |
| FOR168 | Fourier analysis (364/576) |
| FOR169 | Interpolation/extrapolation (364/577) |
| FOR170 | With control of testing or measuring apparatus (364/579) |
| FOR171 | Programmed testing conditions (364/580) |
| FOR172 | Weighting (364/581) |
| FOR173 | Normalization (364/582) |