![[Search a list of Patent Appplications for class 702]](../as.gif) CLASS 702, | DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING |
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SECTION I - CLASS DEFINITION
This class provides for apparatus and corresponding methods wherein the data processing system or calculating computer is designed for or utilized in an environment relating to a specific or generic measurement system, a calibration or correction system, or a testing system.
This class is structured into four main parts:
1. Data processing for a measurement system in a specific environment.
2. Data processing for a calibration or correction system.
3. Data processing for a testing system.
4. Data processing for a generic measurement system.
See Subclass References to the Current Class for these specific subclasses.
Scope of the class:
A. MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT
This class is limited to data processing and calculating computer apparatus and corresponding methods for measuring in a specific environment. There must be significant claim recitation of the data processing system, process or calculating computer and nominal recitation of the specific environment. When significant structure of the device or process pertinent to the specific environment is claimed, classification is in the appropriate device or process class. Control system for specific application adapted for a sole purpose of measuring is classified in this class. This class does not includes data processing in combination with a specific application control system for controlling a device or apparatus (see References To Other Classes below for a generic or specific electrical computers and data processing control systems).
B. CALIBRATION OR CORRECTION SYSTEM
This class includes subject matter directed to data processing for calibration or correction system disclosed or claimed in plural art devices such as geometrical instrument, mechanical system, timing apparatus, fluid flow or fluid measurement, etc. (see References To Other Classes below).
C. TESTING SYSTEM
This class includes subject matter directed to data processing for testing system disclosed in plural art devices such as electrical circuit and components testing, sensing apparatus testing, signal converting, shaping or generating (see References To Other Classes below).
This outdent excludes a mere monitoring system for determining performance of a device or process under normal operation without subjecting the device or process to a specific testing procedure or signal.
D. GENERIC MEASUREMENT SYSTEM
This class is limited to data processing and calculating computer apparatus and corresponding methods for measuring that are not strictly adapted to one particular environment. Such apparatus and corresponding methods for measuring could extend to several different applications. There must be significant claim recitation of the data processing system, process or calculating computer. A generic control system adapted for a sole purpose of measuring is classified in this class. This class does not includes data processing in combination with a generic control system for controlling a device or apparatus (see References To Other Classes below for a generic or specific electrical computers and data processing control systems).
SECTION II - SUBCLASS REFERENCES TO THE CURRENT CLASS
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 1, | through 84, for data processing for a measurement system in a specific environment. |
| 85, | through 107, for a calibration or correction system. |
| 108, | through 126, for data processing for a testing system. |
| 127, | through 199, for data processing for a generic measurement system. |
SECTION III - REFERENCES TO OTHER CLASSES
SEE OR SEARCH CLASS:
| 29, | Metal Working, subclass 25.35 for the electrical measuring, testing or sensing of piezoelectric crystals combined with the manufacture thereof, and subclasses 25.41+ for the electrical measuring, testing or sensing of condensers combined with the manufacture thereof. |
| 33, | Geometrical Instruments, appropriate subclasses for geometrical instrument or calibration/correction thereof, subclasses 300+ for magnetic field direction sensing and indicating, and subclasses 700+ for the determination of distance. |
| 73, | Measuring and Testing, appropriate subclasses for nonelectrical measuring and testing, instrument calibrating, and for electrical measuring and testing of the following types: gas analysis by electrical thermal determination, subclasses 23.2+ ; moisture determination by conductivity, subclass 75; stress and strain gauge, subclass 760; surface and cutting edge determination by sliding pick-up subclasses 104+; subclasses 112.01 - 112.06 for turbine engine testing, 114.01 - 116.81 for internal combustion engine measuring and testing; liquid level gauge(immersible electrode type, subclass 304, float type, subclasses 305+); fluid pressure (e.g., Pirani type), subclass 755; and speed, subclasses 488+. |
| 100, | Presses, subclass 99 for presses having electrical measuring, testing, or sensing means. |
| 166, | Wells, appropriate subclasses for well processes or apparatus including measuring or testing means. |
| 177, | Weighing Scales, appropriate subclasses, particularly subclasses 25.11+ for weighing apparatus in combination with computer means. |
| 178, | Telegraphy, appropriate subclasses, particularly subclass 69 for telegraphy combined with electrical measuring, testing, or sensing. |
| 181, | Acoustics, appropriate subclasses for sound wave measurement. |
| 198, | Conveyors, subclasses 502.1+ for conveyor combined with alarm or indicator. |
| 205, | Electrolysis: Processes, Compositions Used Therein, and Methods of Preparing the Compositions, appropriate subclasses for electrolysis utilized for electrochemistry and especially subclasses 775+ as the residual home for a process of electrolytic analysis or testing, per se. |
| 209, | Classifying, Separating, and Assorting Solids, appropriate subclasses. |
| 250, | Radiant Energy, subclass 250 for wave meters for measuring the wavelength of radio or microwaves, subclass 281 for methods and apparatus for ionic separation or analysis, subclasses 302+ for fluorescent and radioactive tracer methods, subclasses 336.1+ for the detection of invisible radiation or the examination of material by invisible radiation using radiant energy responsive electric signalling means, subclasses 428+ for fluent material containing, support, or transfer means with or without an irradiating source or radiating fluent material, subclasses 453.11+ for supports for objects of irradiation, subclasses 458.1+ for luminophor irradiation, subclasses 472.1+ for nonelectric invisible radiation detectors, and subclasses 493.1+ for radiant energy generation and sources. |
| 314, | Electric Lamp and Discharge Devices: Consumable Electrodes, appropriate subclasses, particularly subclass 9 for the subject matter of that class combined with measuring, testing, or sensing. |
| 320, | Electricity: Battery or Capacitor Charging and Discharging, subclass 48 for battery charging and discharging systems having indicating, signaling, or testing means. |
| 324, | Electricity: Measuring and Testing, appropriate subclasses for testing to determine electrical properties by electrical means, or for determination of non-electrical properties by measuring electric properties, or for the measurement of electricity, per se, particularly subclasses 74+ for calibration of electric meters, subclass 130 for self-calibration, subclasses 200+ for magnetic measuring and testing, subclasses 500+ for fault testing in electrical circuits and components, and subclass 601 for calibration of impedance, admittance, or other quantities representative of electrical stimulus/response relationships. |
| 327, | Miscellaneous Active Electrical Nonlinear Devices, Circuits, and Systems, appropriate subclasses, particularly subclasses 100+ for signal converting, shaping, or generating, and subclasses 291+ for clock or pulse waveform generating. |
| 330, | Amplifiers, appropriate subclasses, for amplifiers, generally, which may be used in electrical measuring and testing circuits, particularly subclass 2 for amplifier condition testing or measuring. |
| 331, | Oscillators, subclass 44 for oscillator systems provided with frequency calibrating or testing means. |
| 340, | Communications: Electrical, appropriate subclasses for testing associated with a communication system. |
| 342, | Communications: Directive Radio Wave Systems and Devices (e.g., Radar, Radio Navigation), appropriate subclasses for reflected or otherwise returned radio wave energy measuring, testing, and sensing systems, such as radar and transponder systems. |
| 348, | Television, subclasses 180+ for monitoring, testing, or measuring television signals or apparatus. |
| 356, | Optics: Measuring and Testing, for measuring and testing light. |
| 368, | Horology: Time Measuring Systems or Devices, subclasses 155+ for time measuring by clocks having electrical features. |
| 374, | Thermal Measuring and Testing, appropriate subclasses for a measurement or test of a thermal quantity. |
| 376, | Induced Nuclear Reactions: Processes, Systems, and Elements, subclasses 245+ for processes or device for testing, measuring, etc., of a condition of a nuclear reactor during its operation. |
| 378, | X-Ray or Gamma Ray System or Devices, appropriate subclasses, particularly subclasses 44+ , 51+, or 70+ for X-ray systems used in testing. |
| 379, | Telephonic Communications, appropriate subclasses, particularly subclasses 1.01 through 35for telephone combined with electrical measuring, testing, or sensing. |
| 429, | Chemistry: Electrical Current Producing Apparatus, Product and Process, subclasses 90+ for battery having measuring, testing, and indicating means. |
| 434, | Education and Demonstration, appropriate subclasses, for electrical measuring, testing, or sensing in combination with education. |
| 455, | Telecommunication, appropriate subclasses for radio systems having electrical measuring, testing, or sensing means for indicating the operative condition of the radio system. |
| 505, | Superconductor Technology: Apparatus, Material, Process, subclasses 160+ for measuring or testing a system or device, and subclass 310 for a process of measuring or testing a superconductive property. |
| 506, | Combinatorial Chemistry Technology: Method, Library, Apparatus, for in silico screening of a chemical or biological library. |
| 700, | Data Processing: Generic Control Systems or Specific Applications, subclasses 1 through 89for a data processing generic control system, apparatus, or process; and subclasses 90-306 for a data processing specific application, apparatus, or process. |
| 714, | Error Detection/Correction and Fault Detection/Recovery, appropriate subclasses for error detection, correction, recovery or prevention in pulse code data or computers. |
SECTION IV - GLOSSARY
CALCULATING OPERATIONS
Arithmetic or some limited logic operations performed upon or with signals representing numbers or values.
DATA PROCESSING
For the purpose of this class, data processing is defined as a systematic operation on data in accordance with a set of rules which results in a significant change in the data.
SUBCLASSES
![[List of Patents for class 702 subclass 1]](../ps.gif) 1 | MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT | ||||||||||||||||||||
| This subclass is indented under the class definition. Subject matter wherein the data processing system or calculating
computer includes a measurement system or process designed for or utilized
in a particular art device or application.
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| 2 | Earth science: | ||||||
| This subclass is indented under subclass 1. Subject matter wherein the measurement system or process
is designed for or utilized in an area directed to the earth or
its related sciences.
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| 3 | Weather: | ||||
This subclass is indented under subclass 2. Subject matter including the study of an atmospheric phenomenon
of a region (e.g., rain, storm, snow, wind, etc.).
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| 4 | Lightning: | ||||
| This subclass is indented under subclass 3. Subject matter wherein the atmospheric phenomenon is the
flashing of light produced by electricity discharged in the air.
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| 5 | Topography (e.g., land mapping): | ||
| This subclass is indented under subclass 2. Subject matter wherein the related sciences including the
study of set of data related to natural or man-made features of
an area (e.g., gravity data, terrain data, sea floor, etc.) to present,
usually on maps or charts, their relative positions and elevations.
SEE OR SEARCH CLASS:
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| 6 | Well logging or borehole study: | ||||||||||||||||
| This subclass is indented under subclass 2. Subject matter including a drill rigging apparatus or measuring
tool for penetrating an earth formation to form a well bore or for
investigating physical condition or a parameter related to the apparatus,
the tool, the well bore or the earth formation.
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| 7 | By induction or resistivity logging tool: | ||
| This subclass is indented under subclass 6. Subject matter comprising means having transmitter and receiver
coils or electrodes arranged for taking measurements, at various
depth of the borehole, representing electrical characteristic of
the earth formations or planar layers surrounding the borehole
(e.g., conductivity, resistivity, dielectric constant).
SEE OR SEARCH CLASS:
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| 8 | By radiation (e.g., nuclear, gamma, X-ray): | ||||||||||||||
| This subclass is indented under subclass 6. Subject matter comprising (a) means for irradiating the
earth formation with rays containing radiation particles (i.e.,
alpha, beta, gamma, neutrons, photon, etc.) such as those in nuclear, gamma,
X-ray, etc. and (b) means for detecting and processing resultant
signals for logging measurements.
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| 9 | Drilling: | ||||||||
This subclass is indented under subclass 6. Subject matter including borehole equipment having a movable
tool for penetrating through the subterranean formations of the
earth to make a long cylindrical hollow to obtain particular parameters
of interest.
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| 10 | Dipmeter: | ||
| This subclass is indented under subclass 6. Subject matter comprising means for determining a dip angle
or dip direction of subsurface formations intercepted by a well
borehole.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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| 11 | Formation characteristic: | ||||||||
| This subclass is indented under subclass 6. Subject matter comprising detail of means for determining
physical properties (temperature, pressure, fracture, etc.) related
to the earth formations.
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| 12 | Fluid flow investigation: | ||||||||||||||||
| This subclass is indented under subclass 11. Subject matter comprising means for evaluating fluid flow
controlling parameters or properties (e.g., porosity, permeability,
etc.) related to the nature and movement of a flowing fluid in the
well bore or from a potential producing zone in the earth formations.
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| 13 | Hydrocarbon prospecting: |
| This subclass is indented under subclass 12. Subject matter wherein means for evaluating includes means for determining the location or volume of an accumulation of hydrocarbon deposits within the potential producing zone. | |
| 14 | Seismology: | ||||||||||
| This subclass is indented under subclass 2. Subject matter comprising means for detecting and recording
a seismic reflected or refracted signal representative of earth
vibrations.
SEE OR SEARCH CLASS:
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| 15 | Earthquake or volcanic activity: | ||
| This subclass is indented under subclass 14. Subject matter including a seismic strong-motion recording
means for monitoring or exploring shaking of the earth or a volcanic phenomenon.
SEE OR SEARCH CLASS:
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| 16 | Specific display (e.g., mapping, profiling): | ||||||||
| This subclass is indented under subclass 14. Subject matter including (a) means for carrying out a series
of steps in a sequence (e.g., mapping, profiling, etc.) to generate
a visual presentation of data or (b) structural details of means
for displaying data.
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| 17 | Filtering or noise reduction/removal: | ||||||||
| This subclass is indented under subclass 14. Subject matter comprising means for removing certain frequency
components of the seismic signal or means for lessening or eliminating disturbance
in the seismic signal.
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| 18 | Velocity of seismic wave: |
| This subclass is indented under subclass 14. Subject matter comprising means for measuring seismic wave parameter over time to compute speed of propagation of seismic wave. | |
| 19 | Biological or biochemical: | ||||||||||
| This subclass is indented under subclass 1. Subject matter wherein the data processing system or calculating
computer is designed for or utilized in a measurement system directed
to an environment of life or chemical compound or process in a living
system.
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| 20 | Gene sequence determination: | ||
| This subclass is indented under subclass 19. Subject matter including a chemical process which determines
genetic information including the chains of a set of sequencing
fragments (e.g., DNA sequence information) used to define identity
of biological species.
SEE OR SEARCH CLASS:
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| 21 | Cell count or shape or size analysis (e.g., blood cell): | ||
| This subclass is indented under subclass 19. Subject matter comprising a measuring means for determining
quantity, geometric, or proportional dimensions of a particular
biological particle.
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| 22 | Chemical analysis: | ||||||||||||||||
| This subclass is indented under subclass 1. Subject matter including means for analyzing a sample through
study of its chemical aspect.
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| 23 | Quantitative determination (e.g., mass, concentration, density): |
| This subclass is indented under subclass 22. Subject matter comprising means to determine an amount or proportion of a component in the sample. | |
| 24 | Gaseous mixture (e.g., solid-gas, gas-liquid, gas-gas): | ||||
This subclass is indented under subclass 23. Subject matter wherein the component is a constituent in
a solid-gas, gas-liquid, or gas-gas mixture.
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| 25 | Liquid mixture (e.g., solid-liquid, liquid-liquid): | ||||
This subclass is indented under subclass 23. Subject matter wherein the component is a constituent that
a solid-liquid or a liquid-liquid mixture.
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| 26 | By particle count: | ||
| This subclass is indented under subclass 23. Subject matter wherein the amount or proportion of the component
is determined by totalizing quantity of particles in the component.
SEE OR SEARCH CLASS:
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| 27 | Molecular structure or composition determination: |
| This subclass is indented under subclass 22. Subject matter comprising means to determine structure of a sample on the molecular level or means to identify different components making up an unknown sample. | |
| 28 | Using radiant energy: | ||||||||||||
| This subclass is indented under subclass 27. Subject matter comprising a radiation source (e.g., X-ray,
infrared light source, spectrophotometer) for irradiating the sample
with a beam to determine its structure or composition.
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| 29 | Particle size determination: | ||
| This subclass is indented under subclass 22. Subject matter wherein means for analyzing the sample includes
means for generating signals having amplitude proportional to the
size of respective particles of the sample.
SEE OR SEARCH CLASS:
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| 30 | Chemical property analysis: |
| This subclass is indented under subclass 22. Subject matter comprising means for determining a chemical characteristic (e.g., specific gravity, conductivity, specific enthalpy, yield, phase, diffusion, etc.) of the sample. | |
| 31 | Specific operation control system: | ||
| This subclass is indented under subclass 22. Subject matter comprising means for controlling internal
operation (e.g., memory access, interrupt processing, etc.) or input
or output operation of the data processing system or calculating
computer.
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| 32 | Specific signal data processing: | ||
| This subclass is indented under subclass 22. Subject matter including a signal transforming unit for
converting initial measured signal into specified data suitable
for displaying or further processing.
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| 33 | Mechanical measurement system | ||||||
| This subclass is indented under subclass 1. Subject matter wherein the measurement system or process
is applicable in the science concerning motion or action of force
on body, or the design, construction, operation, and care of mechanical
process or structure, or for a solution of a problem in these areas.
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| 34 | Wear or deterioration evaluation: | ||
| This subclass is indented under subclass 33. Subject matter wherein the data processing system or calculating
computer is designed for or utilized in the study of an object to
measure the impairment of the object due to use, or to estimate
life expectancy of the object.
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| 35 | Flaw or defect detection: | ||||||||
| This subclass is indented under subclass 33. Subject matter wherein the data processing system or calculating
computer is designed for or utilized in the study of an object to
identify the existence or amount of a fault (e.g., crack or break)
of the object.
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| 36 | Location: | ||
| This subclass is indented under subclass 35. Subject matter comprising means for determining position
or site of the fault.
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| 38 | Electromagnetic (e.g., eddy current): | ||
| This subclass is indented under subclass 35. Subject matter wherein a voltage or current is induced to
the device or object to identify the fault.
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| 39 | Sound energy (e.g., ultrasonic): | ||||||||
| This subclass is indented under subclass 35. Subject matter wherein signal within audible frequency or
above that of audible frequency (i.e. between sonic and hypersonic)
is used to identify the fault.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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| 40 | Radiant energy (e.g., X-ray, infrared, laser): | ||||||||||||||
| This subclass is indented under subclass 35. Subject matter comprising means for receiving a detected
radiation signal (e.g., X-ray, infrared, laser, etc.) transmitted
through or reflected from the object.
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| 41 | Force or torque measurement: | ||
| This subclass is indented under subclass 33. Subject matter comprising means to measuring a strength
or energy exerted upon a body linearly or angularly.
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| 42 | Stress or strain measurement: | ||||
| This subclass is indented under subclass 41. Subject matter wherein the strength or energy causes or
tends to cause deformation of the body.
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| 43 | Torsional, shear, tensile, or compression: | ||
| This subclass is indented under subclass 42. Subject matter where the strength or energy that causes
or tends to cause the deformation of the body includes (1) two opposite
angular or linear forces opposing each other at different points
in the body for twisting parts of the body or for sliding two contiguous
parts of the body relative to each other in the direction parallel
to their plane of contact or (2) pressing or pulling forces for
reducing or stretching object in size or volume.
SEE OR SEARCH CLASS:
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| 44 | Mechanical work or power measurement: |
| This subclass is indented under subclass 41. Subject matter comprising means for determining the mechanical work or power resulting from the exerted strength or energy. | |
| 45 | Flow metering: | ||||||||||||
| This subclass is indented under subclass 33. Subject matter wherein the data processing system or calculating
computer is designed for or utilized to determine the amount of
a fluid mass or volume passing through a structure (e.g., conduit,
pipe) per unit area or time.
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| 46 | Count or pulse: | ||
| This subclass is indented under subclass 45. Subject matter comprising a pulse generating means for generating
a series of pulses or a counter for totalizing a quantity representing the
amount of fluid mass or volume flow.
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| 47 | Pressure, resistive or capacitive sensor: | ||||||
| This subclass is indented under subclass 45. Subject matter comprising a transducer means for (1) measuring
a pressure (e.g., differential pressure) representing flow at different
times or (2) a change in resistance or capacitance representing
flow.
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| 48 | Acoustic: | ||||||||
| This subclass is indented under subclass 45. Subject matter wherein the amount of fluid mass or volume
flow is determined by sound energy.
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| 49 | Radiant energy: | ||||||||||
| This subclass is indented under subclass 45. Subject matter wherein the amount of fluid mass or volume
flow is determined by transmitted beam or light.
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| 50 | Fluid measurement (e.g., mass, pressure, viscosity): | ||||||||||||
| This subclass is indented under subclass 33. Subject matter wherein the measurement system or process
is designed for or utilized to determine a physical property or
characteristic of a fluid.
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| 51 | Leak detecting: | ||||||
| This subclass is indented under subclass 50. Subject matter comprising means for determining the existence
of an opening of a conduit or a container, by fault or mistake,
through which the fluid escapes or enters the conduit or the container.
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| 52 | Capacitive sensor: | ||
| This subclass is indented under subclass 50. Subject matter wherein the physical property or characteristic
of the fluid is determined by measuring capacitance variances of
a probe.
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| 53 | Resistive sensor: | ||
| This subclass is indented under subclass 50. Subject matter wherein the physical property or characteristic
of the fluid is determined by measuring change in resistance of
a probe.
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| 54 | Acoustic or vibration sensor: | ||||||
| This subclass is indented under subclass 50. Subject matter wherein the physical property or characteristic
of the fluid is determined using a probe having an acoustic impedance
or a vibratable structure.
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| 55 | Liquid level or volume determination: | ||||||
| This subclass is indented under subclass 50. Subject matter comprising means for determining a height
of a fluid column or a cubic units of a fluid space in a container.
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| 56 | Vibration detection: | ||||
| This subclass is indented under subclass 33. Subject matter including a transducer means for detecting
vibrational signal of a structure in response to an excitation test
performed on the structure.
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| 57 | Electrical signal parameter measurement system: | ||||||
| This subclass is indented under subclass 1. Subject matter wherein the measurement system or process
is designed for or utilized to measure an electrical parameter.
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| 58 | For electrical fault detection: | ||||||||||||||||
| This subclass is indented under subclass 57. Subject matter including means for determining the presence
of a defect or disturbance in an electrical component, equipment,
or line.
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| 59 | Fault location: | ||||
| This subclass is indented under subclass 58. Subject matter having means to identify an address or orientation
of the defect or disturbance.
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| 60 | Power parameter: | ||||||
| This subclass is indented under subclass 57. Subject matter wherein the measured electrical parameter
comprises a dissipated or developed electrical energy expressible
in a unit of watt or watt-hour.
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| 61 | Power logging (e.g., metering): | ||||||||||
| This subclass is indented under subclass 60. Subject matter having means for recording the dissipated
or developed electrical energy over a continuous interval.
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| 62 | Including communication means: | ||||||
| This subclass is indented under subclass 61. Subject matter including transmitting or receiving means
connecting the means for recording with an external or remote location
for transmitting or receiving information or data.
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| 63 | Battery monitoring: | ||||||||||||
This subclass is indented under subclass 60. Subject matter wherein the measured electrical parameter
is related to a condition or a state of charge (e.g., temperature,
life-state, voltage, charging, or discharging current) of a battery
or a series of batteries.
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| 64 | Voltage or current: | ||||||
This subclass is indented under subclass 57. Subject matter wherein the measured electrical parameter
comprises voltage or current.
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| 65 | Including related electrical parameter: | ||
| This subclass is indented under subclass 64. Subject matter including means for measuring electrical
parameter theoretically related to voltage or current by formulae
(e.g., impedance, resistance, capacitance, inductance, etc.).
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| 66 | Waveform analysis: | ||||||
| This subclass is indented under subclass 57. Subject matter including means for determining value or
parameter of a shape of an electrical wave.
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| 67 | Display of waveform: | ||||
| This subclass is indented under subclass 66. Subject matter including (a) means for carrying out a series
of steps to generate a visual presentation of the electrical wave
or (b) structural details of means for displaying the electrical wave.
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| 68 | Having specified user interface (e.g., marker, menu): | ||||
| This subclass is indented under subclass 67. Subject matter comprising operator input control means (e.g.,
marker on waveform, menu driven interface, specific keyboard configuration,
etc.) for allowing an interaction between an operator and means
for displaying the electrical wave.
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| 69 | Signal quality (e.g., timing jitter, distortion, signal-to-noise ratio): | ||||||||||
This subclass is indented under subclass 66. Subject matter comprising means for determining or estimating
an impairment in the electrical wave (e.g., timing jitter, distortion,
signal to noise ratio, etc.).
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| 70 | Waveform extraction: | ||||||
This subclass is indented under subclass 66. Subject matter comprising means for withdrawing a particular
waveform from an incoming electrical wave by subjecting the incoming electrical
wave to a specific separating technique (e.g., filtering).
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| 71 | Waveform-to-waveform comparison: | ||||
This subclass is indented under subclass 66. Subject matter including means for distinguishing or matching
a first waveform to a second waveform.
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| 72 | Phase comparison: | ||
| This subclass is indented under subclass 71. Subject matter comprising means for comparing a phase of
the first waveform to that of the second waveform, or to a reference
phase of a reference signal.
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| 73 | Identification of waveform: | ||
This subclass is indented under subclass 71. Subject matter comprising means for classifying an acquired
input waveform which is unknown by correlating or comparing its
characteristics with those of at least one known or reference waveform.
| |||
| 74 | Signal-in-signal determination: | ||||||
| This subclass is indented under subclass 71. Subject matter comprising means for detecting the presence
or absence of at least one specified signal contained within other
signal (e.g., noise superimposed on an information signal, burst
signal, tone signal, or certain frequencies within a pulse code
modulated signal).
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
| 75 | Frequency: | ||||||||||
| This subclass is indented under subclass 66. Subject matter having means for determining or analyzing
frequency of the electromagnetic wave.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
| 76 | Frequency spectrum: | ||
| This subclass is indented under subclass 75. Subject matter wherein frequencies of interest of a complex
waveform having multi-frequency components are determined or analyzed.
SEE OR SEARCH CLASS:
| |||
| 77 | Using Fourier method: | ||
| This subclass is indented under subclass 76. Subject matter wherein the frequency spectrum is analyzed
or determined using Fourier analysis or Fourier transform technique.
SEE OR SEARCH CLASS:
| |||
| 78 | By count (e.g., pulse): | ||
| This subclass is indented under subclass 75. Subject matter including a counter means for counting pulses,
zero-crossing, etc. to determine the frequency of the electromagnetic wave.
SEE OR SEARCH CLASS:
| |||
| 79 | Time-related parameter (e.g., pulse width, period, delay, etc.): | ||||||||||
| This subclass is indented under subclass 57. Subject matter including means for generating time-related
measurement (e.g., pulse width, period, delay) of at least one electrical
signal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
| 80 | Specified memory location generation for storage: | ||
| This subclass is indented under subclass 57. Subject matter including means for generating address of
storage for the measured electrical parameter.
SEE OR SEARCH CLASS:
| |||
| 81 | Quality evaluation: | ||||
| This subclass is indented under subclass 1. Subject matter comprising means for gathering data, usually
on a manufacturing or assembly line, to determine the quality of
a product.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
| 82 | Having judging means (e.g., accept/reject): |
| This subclass is indented under subclass 81. Subject matter including a judging means responsive to the gathered data to make a decision on the status of the product (e.g., accept/reject; pass/fail; in/out of tolerance; good/bad). | |
| 83 | Sampling Inspection Plan: |
| This subclass is indented under subclass 81. Subject matter wherein means for gathering data comprises details of a specifically defined plan created for the gathering of data related to the product. | |
| 84 | Quality control: | ||
| This subclass is indented under subclass 81. Subject matter wherein the gathered data is evaluated and
fed back to regulate (e.g., adjust, maintain, etc.) the manufacturing
or assembly line to ensure a desired quality.
SEE OR SEARCH CLASS:
| |||
| 85 | CALIBRATION OR CORRECTION SYSTEM: | ||||||||||||||||||
| This subclass is indented under the class definition. Subject matter wherein the data processing or calculating
means includes a system or process for adjusting a measuring instrument
or for revising measurement data to obtain more accurate or concise
measurement.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||||
| 86 | Linearization of measurement: | ||
| This subclass is indented under subclass 85. Subject matter comprising means for reforming non-linear
measurement signal to conform to a desired linear characteristic.
SEE OR SEARCH CLASS:
| |||
| 87 | Zeroing (e.g., null): | ||||||||
| This subclass is indented under subclass 85. Subject matter comprising means correcting a drift or an
offset error from a null point or a baseline.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
| 88 | Zero-full scaling: | ||||||
| This subclass is indented under subclass 85. Subject matter comprising means for correcting a range (e.g.,
from a minimum to a maximum value) of magnitudes of the measurement.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
| 89 | Timing (e.g., delay, synchronization): | ||||||||||||||
| This subclass is indented under subclass 85. Subject matter comprising means for adjusting a timer or
for correcting a timing-related error in the measurement data.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||
| 90 | Error due to component compatibility: |
| This subclass is indented under subclass 85. Subject matter comprising means for correcting errors that arise from components having different performance characteristics in a single measuring system. | |
| 91 | Having interchangeable sensors or probes: | ||||||||||||||
| This subclass is indented under subclass 90. Subject matter wherein errors that arise from using different
sensors or probes are corrected by using stored calibration information
corresponding to respective plug-in sensors or probes.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||||||
| 92 | Direction (e.g., compass): | ||||||
| This subclass is indented under subclass 85. Subject matter including means to calibrate or correct components
or output measurement data of a direction indicating system comprising
at least a sensing means (e.g., gyro, geomagnetic field sensor,
cross coil type indicator, etc.).
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
| 93 | By another sensor: | ||||||||||||||
| This subclass is indented under subclass 92. Subject matter wherein the calibration or correction is
performed based on measurements of a secondary sensor.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||||||
| 94 | Position measurement: | ||||
| This subclass is indented under subclass 85. Subject matter comprising means to calibrate or correct
components or output displacement data of a position measuring instrument.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
| 95 | Coordinate positioning: |
| This subclass is indented under subclass 94. Subject matter comprising means for determining or correcting coordinates identifying the position. | |
| 96 | Speed: | ||||||||
| This subclass is indented under subclass 85. Subject matter comprising means to calibrate or correct
components or output speed data of a speed measuring instrument.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
| 97 | Length, distance, or thickness: | ||||||||||||
| This subclass is indented under subclass 85. Subject matter comprising means to calibrate or correct
length, distance, or thickness gauge or signal representing such
measurement.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
| 98 | Pressure: | ||||||||||
| This subclass is indented under subclass 85. Subject matter comprising means to calibrate or correct
force per unit area measurement instrument or signal representing
such measurement.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
| 99 | Temperature: | ||||||||
| This subclass is indented under subclass 85. Subject matter comprising means to calibrate or correct
temperature sensors or gauges or signal representing such measurement.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
| 100 | Fluid or fluid flow measurement: | ||||||||||||
| This subclass is indented under subclass 85. Subject matter comprising means to calibrate or correct
fluid or fluid flow measuring instrument or signal representing
such measurement.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
| 101 | Weight: | ||||||||||
| This subclass is indented under subclass 85. Subject matter comprising means to calibrate or correct
weight scale or weight measurement.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
| 102 | Tare weight adjusted: | ||||
| This subclass is indented under subclass 101. Subject matter comprising an operation for obtaining a net
weight.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
| 103 | Acoustic: | ||||||||
| This subclass is indented under subclass 85. Subject matter comprising means to calibrate or correct
sound wave measuring instrument or signal representing such measurement.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
| 104 | Sensor or transducer: | ||||||||||||||||
| This subclass is indented under subclass 85. Subject matter wherein a sensing element that usually converts
some physical parameter into an electrical signal or a sensed physical
quantity is calibrated or corrected.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||
| 105 | For mechanical system: | ||||||
| This subclass is indented under subclass 85. Subject matter including means for compensating error in
a machine or a mechanical body.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
| 106 | Signal frequency or phase correction: | ||||||
| This subclass is indented under subclass 85. Subject matter comprising means to calibrate or correct
a frequency or phase measuring system or signal representing such
measurement.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
| 107 | Circuit tuning (e.g., potentiometer, amplifier): | ||||
| This subclass is indented under subclass 85. Subject matter including means for calibrating an electronic
circuit device or component (e.g., amplifier, counter, potentiometer,
converter, transformer, etc.).
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
| 108 | TESTING SYSTEM: | ||||||||||||||||||
This subclass is indented under the class definition. Subject matter wherein the data processing or calculating
means includes a test means for determining a response of a device
or a process to an external stimulus.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||||
| 109 | For transfer function determination: | ||
| This subclass is indented under subclass 108. Subject matter comprising means for determining a relationship
between a stimulus and response of an element or a network to the stimulus.
SEE OR SEARCH CLASS:
| |||
| 110 | Binary signal stimulus (e.g., pulse): |
| This subclass is indented under subclass 109. Subject matter wherein the stimulus is a two-level test signal. | |
| 111 | Noise signal stimulus (e.g., white noise): | ||||
| This subclass is indented under subclass 109. Subject matter wherein the stimulus is a noise signal (e.g.,
random noise).
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
| 112 | Sinusoidal signal stimulus: | ||||
| This subclass is indented under subclass 109. Subject matter wherein the stimulus is a sine or cosine
waveform.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
| 113 | Of mechanical system: | ||||||||
| This subclass is indented under subclass 108. Subject matter wherein the test means is applied to a device
or process in the science concerning design, construction, operation,
or care of a mechanical process or structure, or for a solution
of a problem in these areas.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
| 114 | Pneumatic or hydraulic system: | ||||||||||||
| This subclass is indented under subclass 113. Subject matter wherein the mechanical process or structure
is in the science that deals with mechanical properties of gas or
practical application of liquid in motion.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
| 115 | Electromechanical or magnetic system: | ||
| This subclass is indented under subclass 114. Subject matter wherein the mechanical process or structure
is controlled or actuated electrically or magnetically.
SEE OR SEARCH CLASS:
| |||
| 116 | Of sensing device: | ||||||||||||||||
| This subclass is indented under subclass 108. Subject matter wherein the test signal or procedure is applied
to a sensor means which produces an electrical output signal proportional
to a time varying quantity.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||
| 117 | Of circuit: | ||||
| This subclass is indented under subclass 108. Subject matter wherein the test means is applied to the
interconnection of electronic components in a closed path.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
| 118 | Testing multiple circuits: | ||||||
This subclass is indented under subclass 117. Subject matter wherein a plurality of circuits are tested
simultaneously or selectively.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
| 119 | Including program initialization (e.g., program loading) or code selection (e.g., program creation): | ||
| This subclass is indented under subclass 117. Subject matter including initialization means for executing
a program or preparing code selection.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
| 120 | Including input means: | ||
| This subclass is indented under subclass 117. Subject matter comprising an input device for designating
a test mode, or an input or output selection (e.g., switchboard
with multiple input selection).
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
| 121 | Including multiple test instruments: | ||||||
This subclass is indented under subclass 108. Subject matter including a plurality of test instruments.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
| 122 | Including specific communication means: | ||||||
| This subclass is indented under subclass 108. Subject matter including details of data transmission or
exchange.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
| 123 | Including program set up: | ||
| This subclass is indented under subclass 108. Subject matter including means for selecting or specifying
an executable program of system software to configure a testing
system or to produce desired output of the testing system.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
| 124 | Signal generation or waveform shaping: | ||||||
| This subclass is indented under subclass 108. Subject matter wherein the test means includes means for
generating a specific type of signal or signal having a specific
waveform.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
| 125 | Timing signal: | ||||||||||||||
| This subclass is indented under subclass 124. Subject matter wherein the signal is generated for system
timing purposes (e.g., trigger pulses, synchronizing signal, system
clock pulses).
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||
| 126 | Signal conversion: | ||||
| This subclass is indented under subclass 124. Subject matter comprising means for converting an input
signal having a certain characteristic to another signal having
a different characteristic.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
| 127 | MEASUREMENT SYSTEM: | ||||||||||||||||||
| This subclass is indented under the class definition. Subject matter wherein data processing and calculating computer
includes a generic measurement system or process.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||||
| 128 | Article count or size distribution: | ||||
| This subclass is indented under subclass 127. Subject matter comprising means for grouping items based
on determined quantity or proportionate dimensions of the items.
SEE OR SEARCH CLASS:
| |||||
| 129 | Quantitative determination by weight: | ||||||||
| This subclass is indented under subclass 128. Subject matter wherein the quantity of the items in a group
is determined by correlating individual weight of the item and gross
weight of the group.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
| 130 | Temperature measuring system: | ||||||
| This subclass is indented under subclass 127. Subject matter comprising means for measuring a thermal
quantity.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
| 131 | Body temperature: | ||
| This subclass is indented under subclass 130. Subject matter wherein the thermal quantity is the temperature
of a body of an animal or a human.
SEE OR SEARCH CLASS:
| |||
| 132 | Thermal protection: | ||||
This subclass is indented under subclass 130. Subject matter comprising means for preventing a device
(e.g., engine, machine, heating element, electronic device etc.)
from an overheating or over-temperature condition.
SEE OR SEARCH CLASS:
| |||||
| 133 | By resistive means | ||||||
| This subclass is indented under subclass 130. Subject matter wherein means for measuring thermal quantity
comprises an electrical resistance which varies as a function of
the measured thermal quantities.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
| 134 | By radiant energy: | ||||||||||||
| This subclass is indented under subclass 130. Subject matter comprising means for measuring emitted or
reflected radiation of a substance or an object for conversion to
indication of its temperature.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
| 135 | Infrared: |
| This subclass is indented under subclass 134. Subject matter wherein the radiation is in a wavelength region of infrared. | |
| 136 | Thermal related property: | ||
| This subclass is indented under subclass 130. Subject matter comprising means for determining a parameter
that is mathematically related to temperature (e.g., thermal conductivity,
heat capacity).
SEE OR SEARCH CLASS:
| |||
| 137 | Density: | ||
| This subclass is indented under subclass 127. Subject matter comprising means for determining density
of an object or substance.
SEE OR SEARCH CLASS:
| |||
| 138 | Pressure: | ||||||
| This subclass is indented under subclass 127. Subject matter comprising means for measuring force per
unit area.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
| 139 | Exerted on or by a living body: | ||||
| This subclass is indented under subclass 138. Subject matter wherein the force per unit area applied to
or by a living body is measured.
SEE OR SEARCH CLASS:
| |||||
| 140 | Within an enclosure: |
| This subclass is indented under subclass 138. Subject matter wherein pressure within a closed container is measured. | |
| 141 | Accelerometer: | ||||||||
| This subclass is indented under subclass 127. Subject matter comprising means for determining a signal
representative of a rate of change of velocity of an object with
respect to time.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
| 142 | Speed: | ||||||||
| This subclass is indented under subclass 127. Subject matter comprising means for determining a change
in a rate of motion of an object with respect to time.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
| 143 | By radar or sonar: | ||||||||||||
| This subclass is indented under subclass 142. Subject matter comprising means for transmitting a signal
within radar frequency bands or sound waves and means for determining
speed using a reflected signal or waves.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
| 144 | Of aircraft: | ||||
| This subclass is indented under subclass 142. Subject matter wherein speed (e.g., longitudinal, lateral,
vertical speed, etc.) of an aircraft is determined.
SEE OR SEARCH CLASS:
| |||||
| 145 | Rotational speed: |
| This subclass is indented under subclass 142. Subject matter wherein speed of a rotating member (wheel, shaft, disk, etc.) is determined. | |
| 146 | Averaging performed: | ||||
| This subclass is indented under subclass 145. Subject matter wherein a mathematical operation is performed
to obtain an average speed or associated time signal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
| 147 | Specific mathematical operation performed: | ||||||||||||
| This subclass is indented under subclass 145. Subject matter including details of an algorithm having
a sequence of calculating steps to be carried out for determining
rotational speed or related parameter.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
| 148 | For wheel speed: | ||||
This subclass is indented under subclass 147. Subject matter wherein the algorithm includes processing
of a wheel speed signal.
SEE OR SEARCH CLASS:
| |||||
| 149 | By distance and time measurement: | ||||||||||||
| This subclass is indented under subclass 142. Subject matter including means for timing a moving object
which travels a measured or predetermined distance to determine
a speed signal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||||||||
| 150 | Orientation or position: | ||||||||||||
| This subclass is indented under subclass 127. Subject matter comprising means for measuring a spatial
relationship of an object with respect to a reference axis.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
| 151 | Angular position: | ||
| This subclass is indented under subclass 150. Subject matter wherein the object resides along the arc
of a circle.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
| 152 | 3D position: |
| This subclass is indented under subclass 150. Subject matter comprising means for determining X-Y-Z coordinates of an object. | |
| 153 | 3D orientation: |
| This subclass is indented under subclass 152. Subject matter comprising means for determining the movement of the object in a three-dimensional space. | |
| 154 | Inclinometer: | ||
| This subclass is indented under subclass 150. Subject matter comprising means for determining an inclination
of a surface from horizontal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
| 155 | Dimensional determination: | ||||||||
| This subclass is indented under subclass 127. Subject matter comprising means for determining or calculating
a geometrical measurement representing a relationship between points, angles,
surfaces, or solids.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
| 156 | Area or volume: | ||||||
| This subclass is indented under subclass 155. Subject matter comprising means for determining a total
surface measurement enclosed within a set of lines or a cubic capacity
of a three dimensional figure.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
| 157 | Radius or diameter: |
| This subclass is indented under subclass 155. Subject matter comprising means for determining radius or diameter of a circular object or sphere. | |
| 158 | Linear distance or length: | ||||||||||||
| This subclass is indented under subclass 155. Subject matter wherein the geometrical measurement is a
displacement or a distance between two points or two planes.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
| 159 | By reflected signal (i.e., ultrasonic, light, laser): | ||||||
| This subclass is indented under subclass 158. Subject matter wherein the displacement or distance is measured
from a returned wave of a target signal.
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| |||||||
| 160 | Pedometer: | ||
| This subclass is indented under subclass 158. Subject matter comprising means for recording distance travelled
by a walker by responding to the movement of the walker at each
step.
SEE OR SEARCH CLASS:
| |||
| 161 | Electronic ruler: |
| This subclass is indented under subclass 158. Subject matter comprising a scale marked off in units (e.g., inches) and slider assembly for measuring the linear distance or length. | |
| 162 | Micrometer | ||
| This subclass is indented under subclass 158. Subject matter comprising an instrument adapted for measuring
minute distances with high accuracy.
SEE OR SEARCH CLASS:
| |||
| 163 | Rotary distance or length: | ||||||||||
| This subclass is indented under subclass 158. Subject matter of ... comprising a rotary encoding means
for generating pulses representing a measured distance or length.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
| 164 | Electronic tape measure: |
| This subclass is indented under subclass 163. Subject matter wherein the rotary encoding means comprises an extensible tape member electrically operated to indicate the measured distance or length. | |
| 165 | Odometer: | ||||
| This subclass is indented under subclass 163. Subject matter wherein the measured distance or length represents
an odometer reading on a vehicle.
SEE OR SEARCH CLASS:
| |||||
| 166 | Height or depth: | ||||||||||
| This subclass is indented under subclass 155. Subject matter wherein the geometrical measurement is a
vertically measured distance between a reference base and something
above or below it.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
| 167 | Contouring: | ||
This subclass is indented under subclass 155. Subject matter wherein the geometrical measurement includes
profile information representing structure or shape or outline of
a surface or body or figure.
| |||
| 168 | By probe (e.g., contact): |
| This subclass is indented under subclass 167. Subject matter wherein the profile information is measured by a probe which makes contact with the surface, body, or figure. | |
| 169 | Center of gravity: | ||||
| This subclass is indented under subclass 167. Subject matter including means for determining a position
of center of gravity of the surface, body, or figure.
SEE OR SEARCH CLASS:
| |||||
| 170 | Thickness or width: | ||||||||||
| This subclass is indented under subclass 155. Subject matter wherein the geometrical measurement is thickness
or width.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
| 171 | By ultrasonic: | ||||||
| This subclass is indented under subclass 170. Subject matter wherein the thickness or width is determined
by detected ultrasonic waves.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
| 172 | By radiant energy (e.g., X-ray, light): | ||||||||||||
| This subclass is indented under subclass 170. Subject matter wherein the thickness or width is determined
by detecting an incident or reflected radiation beam (e.g., X-ray,
light etc.).
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
| 173 | Weight: | ||||||
| This subclass is indented under subclass 127. Subject matter comprising means for measuring the force
an object exerts due to gravity.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
| 174 | Payload: |
| This subclass is indented under subclass 173. Subject matter wherein the object is a carried article. | |
| 175 | Of moving article: |
| This subclass is indented under subclass 173. Subject matter wherein the object is in motion. | |
| 176 | Time duration or rate: | ||||||||||
| Subject matter under 127 comprising means for measuring
and evaluating time information of a period during which an event
occurs, or a quantity of counted events per unit time.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||
| 177 | Due time monitoring (e.g., medication clock, maintenance interval): |
| This subclass is indented under subclass 176. Subject matter comprising a schedule maintaining means for reminding a user of a due time of a specific operation. | |
| 178 | Timekeeping (clock, calendar, stopwatch): | ||
| This subclass is indented under subclass 176. Subject matter comprising a time information keeping means
for denoting time information such as hour, date, start, or stop
instances of an event.
SEE OR SEARCH CLASS:
| |||
| 179 | Statistical measurement: | ||||||
| This subclass is indented under subclass 127. Subject matter including means for gathering or measuring
or calculating parameters (e.g., mean, deviation, variance, range
etc.) using principles of statistics.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
| 180 | Histogram distribution: | ||
| This subclass is indented under subclass 179. Subject matter comprising means for providing a profile
representing a set-of-occurrences of the parameters in a space,
time, or frequency domain.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
| 181 | Probability determination: |
| This subclass is indented under subclass 179. Subject matter comprising a percentile estimating means for determining a chance that a given event is likely to occur. | |
| 182 | Performance or efficiency evaluation: | ||||
| This subclass is indented under subclass 127. Subject matter including means for monitoring or determining
an ability to perform or a degree of effective operation of a device
or process.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
| 183 | Diagnostic analysis: | ||||||||||||
This subclass is indented under subclass 182. Subject matter including means for monitoring or determining
operation parameter to perform diagnosis of an abnormal operational
condition or fault on the device or the process.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||
| 184 | Maintenance: |
| This subclass is indented under subclass 183. Subject matter comprising means for preserving or sustaining the process or device from the abnormal operation condition or fault (e.g., repairing, adjusting, etc.). | |
| 185 | Cause or fault identification: | ||
Subject matter under 183 including means to determine a
possible source or a specific fault statement of the abnormal operation
condition or fault.
| |||
| 186 | Computer or peripheral benchmarking: | ||
| This subclass is indented under subclass 182. Subject matter including means for determining performance
or efficiency of computer or its peripheral.
SEE OR SEARCH CLASS:
| |||
| 187 | History logging or time stamping: | ||||||||||||||||
This subclass is indented under subclass 127. Subject matter including means for gathering and recording
successive data associated with an event with or without correlating
time-tags.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||||||||||
| 188 | Remote supervisory monitoring: | ||||||||
| This subclass is indented under subclass 127. Subject matter including gathering and transferring means
for measuring or sensing data from a remote site and for transmitting
the data to a central supervisory facility for further analysis.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
| 189 | Measured signal processing: | ||
| This subclass is indented under subclass 127. Subject matter comprising means for post-processing a measured
signal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||
| 190 | Signal extraction or separation (e.g., filtering): | ||||||||||||||
| This subclass is indented under subclass 189. Subject matter comprising means for obtaining a particular
signal of interest from an incoming input signal by subjecting the
incoming input signal to a specific separating technique (e.g., filtering)
or means for dividing an incoming input signal into at least two
signals of interest.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
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| 191 | For noise removal or suppression: | ||||||
| This subclass is indented under subclass 190. Subject matter comprising means for eliminating or reducing
a distortion signal contained in the incoming input signal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||||
| 192 | In video or image signal: | ||||||||
| This subclass is indented under subclass 191. Subject matter wherein the incoming signal contains picture
information.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
| 193 | By threshold comparison: | ||
| This subclass is indented under subclass 191. Subject matter wherein means for eliminating or reducing
the distortion signal includes means for comparing the incoming
signal with a reference limit set value.
SEE OR SEARCH CLASS:
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| 194 | By mathematical attenuation (e.g., weighting, averaging): | ||||||||
| This subclass is indented under subclass 191. Subject matter wherein means for eliminating or reducing
the distortion signal includes means for performing at least one
algebraic mathematical operation (adding, multiplying, subtracting,
interpolation, weighting, averaging etc.) on the incoming signal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||||
| 195 | Subtracting noise component: | ||||
| This subclass is indented under subclass 194. Subject matter comprising at least a subtracter for eliminating
or reducing a noise component in the incoming signal.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| |||||
| 196 | Using matrix operation: | ||
| This subclass is indented under subclass 190. Subject matter comprising means for performing a mathematical
operation on a rectangular array representing values associated
with the incoming signal for extracting or separating the signal
of interest.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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| 197 | Having multiple filtering stages: | ||||||||
| This subclass is indented under subclass 196. Subject matter including a cascaded filtering means.
SEE OR SEARCH THIS CLASS, SUBCLASS:
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| 198 | Measurement conversion processing (e.g., true-to-RMS value): | ||||
| This subclass is indented under subclass 189. Subject matter comprising means for converting measurement
value from one measuring unit to another measuring unit.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||
| 199 | Averaging: | ||||||
| This subclass is indented under subclass 189. Subject matter comprising means for determining a mean value
of measured quantities.
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| |||||||
The definitions for FOR 100-FOR 173 below correspond to the definitions of the abolished subclasses under Class 364 from which these collections were formed. See the Foreign Art Collection schedule for specific correspondences. [Note: The titles and definitions for indented art collections include all the details of the one(s) that are hierarchically superior.] | |
| FOR 100 | Earth sciences (e.g., weather): |
| Foreign art collections wherein the data processing system or calculating computer is designed for or utilized in the study of the earth and/or its related sciences. | |
| FOR 101 | Seismology: |
| Foreign art collections wherein a vibrational signal from the earth is detected. | |
| FOR 102 | Well logging: |
| Foreign art collections wherein a signal is emitted by a transducer in a bore hole. | |
| FOR 103 | Electrical/electronic engineering: |
| Foreign art collections wherein the data processing system or calculating computer is designed for use in the fields of electricity and electronics or for the solution of a problem in this area. | |
| FOR 104 | Measuring and testing: |
| Foreign art collections wherein the area of electrical/electronic engineering is measuring or testing of for an electrical circuit, component, parameter, or value. | |
| FOR 105 | Impedance: |
| Foreign art collections wherein the area includes the measuring or testing of or for the opposition a circuit offers to the flow of current. | |
| FOR 106 | Voltage, current, or power: |
| Foreign art collections wherein the area includes the measuring or testing of or for voltage, current, or power. | |
| FOR 107 | Frequency: |
| Foreign art collections wherein the area includes the measuring or testing of at least one frequency of a waveform. | |
| FOR 108 | Frequency spectrum: |
| Foreign art collections wherein the waveform is complex and the frequency spectrum is determined or analyzed. | |
| FOR 109 | Pulse: |
| Foreign art collections wherein the area includes measuring and testing of or for a value or parameter of the variation of a quantity characterized by a rise and decay of a finite duration. | |
| FOR 110 | Waveform: |
| Foreign art collections wherein the area includes measuring and testing of or for a value or parameter of the shape of an electromagnetic wave. | |
| FOR 111 | Power generation or distribution: |
| Foreign art collections wherein the area of electrical/electronic engineering is the generation of electrical power or the distribution of electrical power through networks. | |
| FOR 112 | Economic dispatching: |
| Foreign art collections wherein the area of power generation or distribution is the most economic manner of generating or distributing. | |
| FOR 113 | Turbine or generator control: |
| Foreign art collections including the control of either a prime mover or a generator. | |
| FOR 114 | With model: |
| Foreign art collections including the use of an electrical or mathematical model of the system. | |
| FOR 115 | Chemical and engineering sciences: |
| Foreign art collections wherein the data processing system or calculating computer is designed for use in chemistry, chemical engineering, or other areas of engineering not provided elsewhere or for the solution of problems in these areas. | |
| FOR 116 | Chemical analysis: |
| Foreign art collections wherein the area is the chemical analysis of a product or substance or element. | |
| FOR 117 | Spectrum analysis (composition): |
| Foreign art collections wherein the chemical analysis is the analysis of substances or bodies through study of their spectra. | |
| FOR 118 | Chemical property: |
| Foreign art collections wherein the chemical analysis is the analysis of substances or bodies through study of their chemical composition. | |
| FOR 119 | Chemical process control: |
| Foreign art collections wherein the area is the control of a process of or having to do with manufacturing compositions of matter or elements. | |
| FOR 120 | Distillation: |
| Foreign art collections wherein the chemical process includes the process of first heating a mixture to separate more volatile from the less volatile parts, and the cooling and condensing the resulting vapor so as to produce a more nearly pure or refined substance. | |
| FOR 121 | Physical mixing or separation: |
| Foreign art collections wherein the chemical process includes the process of mixing two or more substances or the separation of one or more substance. | |
| FOR 122 | Kilns: |
| Foreign art collections wherein the chemical process includes a furnace or oven for drying, burning, or baking a substance or body. | |
| FOR 123 | Mechanical and civil engineering: |
| Foreign art collections wherein the data processing system or calculating computer is designed for use in the science concerning the motion of and action of forces on bodies and the design, construction, operation, and care of mechanical processes or items or highways, bridges, tunnels, waterworks, harbors, etc., or for the solution of a problem in these areas. | |
| FOR 124 | Measuring or testing: |
| Foreign art collections wherein the area of mechanical and civil engineering is measuring or testing of or for a process, device, or object. | |
| FOR 125 | Flaw or defect: |
| Foreign art collections for determining the existence or amount of flaw or defect. | |
| FOR 126 | Stress, strain, or vibration: |
| Foreign art collections wherein the measuring or testing is to determine the existence or amount of stress, strain, or vibration. | |
| FOR 127 | Fluid: |
| Foreign art collections wherein the measuring or testing is done on a fluid. | |
| FOR 128 | Fluid flow: |
| Foreign art collections wherein the quantity tested or measured is flow of a fluid. | |
| FOR 129 | Power: |
| Foreign art collections wherein the measuring or testing is to determine existence or amount of power other than electrical power, e.g., mechanical horse power. | |
| FOR 130 | Physics: |
| Foreign art collections wherein the data processing system or calculating computer is designed for or utilized in the science dealing with the properties, changes, interactions, etc., of matter and energy or for the solution of a problem in this area. | |
| FOR 131 | Optics or photography: |
| Foreign art collections wherein the area of physics is that concerned with the nature and properties of light, vision, or producing images upon a photosensitive surface by the chemical action of light or other radiant energy. | |
| FOR 132 | Color analysis: |
| Foreign art collections wherein the area is the analysis of light spectra. | |
| FOR 133 | Atomic or nuclear physics: |
| Foreign art collections wherein a data processing system or a calculating computer is utilized in the study of subatomic particles. | |
| FOR 134 | MEASURING, TESTING, OR MONITORING: |
| Foreign art collections wherein the data processing system or calculating computer is designed for or utilized in the indication of a condition relating to a measurement, analysis, or continuous detection. | |
| FOR 135 | Measuring and evaluating (e.g., performance): |
| Foreign art collections wherein there is a detection of a quantity over a period and assessment of the quantity detected. | |
| FOR 136 | Of machine tool: |
| Foreign art collections including subject matter which measures and evaluates a machine-driven implement, per se. | |
| FOR 137 | Quality control determinations: |
| Foreign art collections related to procedures, inspections, examinations, and tests required during procurement, production, receipt, storage, and issue that are necessary to provide the user with an item of the required quality. | |
| FOR 138 | Transfer function evaluation: |
| Foreign art collections including subject matter for assessment of the relationship between physical conditions at two different points in time or space in a given system which may also describe the role played by the intervening time or space. | |
| FOR 139 | Statistical data (e.g., stochastic variable): |
| Foreign art collections including subject matter for assessment of events, occurring randomly or by chance. | |
| FOR 140 | Particle count, distribution, size: |
| Foreign art collections including subject matter for the enumeration of particles and the evaluation of the properties of particles such as size, spatial dispersion, etc. | |
| FOR 141 | For basic measurements: |
| Foreign art collections including subject matter for fundamental measurements. | |
| FOR 142 | Temperature: |
| Foreign art collections including subject matter for measuring thermal quantities. | |
| FOR 143 | Pressure or density: |
| Foreign art collections including subject matter for measuring the force per unit area or mass per unit volume of a substance. | |
| FOR 144 | Orientation: |
| Foreign art collections including subject matter for measuring the spatial relationship of an object with respect to a reference axis. | |
| FOR 145 | Dimension: |
| Foreign art collections including subject matter for evaluating a measurement. | |
| FOR 146 | Distance: |
| Foreign art collections wherein the measurement is the distance between two or more points. | |
| FOR 147 | Length or height: |
| Foreign art collections wherein the measurement is made along a straight line which contains the points. | |
| FOR 148 | Width or thickness: |
| Foreign art collections wherein the points lie in a line generally perpendicular to a reference surface. | |
| FOR 149 | Area or volume: |
| Foreign art collections wherein the linear measurement is the product of a plurality of dimensions. | |
| FOR 150 | Rate of change of dimension (e.g., speed): |
| Foreign art collections for evaluating the rate of change per unit of time of a given dimension. | |
| FOR 151 | Acceleration and further derivatives: |
| Foreign art collections for evaluating the second or higher order derivatives of the function of dimension with respect to time. | |
| FOR 152 | Weight: |
| Foreign art collections for measuring the force an object exerts due to gravity. | |
| FOR 153 | Basis weight: |
| Foreign art collections for evaluating the weight per unit area. | |
| FOR 154 | Time or time intervals: |
| Foreign art collections for evaluating one or more periods of duration or the duration between given events. | |
| FOR 155 | Operations performed: |
| Foreign art collections where there is significant recitation of the particular manner in which the measuring, testing, or monitoring is accomplished. | |
| FOR 156 | Calibration or compensation: |
| Foreign art collections for determining the accuracy or operating characteristics of a measuring device or producing true measurement data from initial measurement data. | |
| FOR 157 | Having mathematical operation on initial measurement data: |
| Foreign art collections in which the true measurement data is derived from a mathematical function on the initial measurement data. | |
| FOR 158 | Including environmental factors (e.g., temperature): |
| Foreign art collections where ambient data is utilized to compensate initial data. | |
| FOR 159 | Including predetermined stored data: |
| Foreign art collections where data previously stored in a memory is included. | |
| FOR 160 | Using difference involving initial measurement data: |
| Foreign art collections where the offset between two successive initial measurements or an initial measurement and a standard is utilized to a compensate initial data. | |
| FOR 161 | Using analog calculating elements: |
| Foreign art collections where the true measurement data is generated by elements having nondiscrete input and output values. | |
| FOR 162 | By table look-up: |
| Foreign art collections in which the initial measurement data is used in a specified manner to obtain the true measurement data previously stored in a memory. | |
| FOR 163 | Using operator provided data: |
| Foreign art collections where manually provided data is used in generating or deriving the true measurement data. | |
| FOR 164 | Filtering: |
| Foreign art collections wherein the operation performed is the selection or removal of signal or data components in accordance with specified criteria. | |
| FOR 165 | Linearization: |
| Foreign art collections wherein the operation performed is establishing a first degree relationship between two variables. | |
| FOR 166 | Noise reduction: |
| Foreign art collections wherein the operation performed is the lessening of the effects of any disturbance tending to interfere with the normal operation of the system. | |
| FOR 167 | Averaging: |
| Foreign art collections wherein the operation performed is determining a single value (mean, mode, median) that summarizes or represents the general significance of a set of unequal values. | |
| FOR 168 | Fourier analysis: |
| Foreign art collections wherein there is a transformation of data between the time domain or space domain and the frequency domain. | |
| FOR 169 | Interpolation/extrapolation: |
| Foreign art collections wherein there is an estimation of a value of a variable between or beyond two known values. | |
| FOR 170 | With control of testing or measuring apparatus: |
| Foreign art collections including subject matter with control of the testing, measuring, or monitoring apparatus. | |
| FOR 171 | Programmed testing conditions: |
| Foreign art collections wherein the testing, measuring, or monitoring is done under the control of a sequence of instructions. | |
| FOR 172 | Weighting: |
| Foreign art collections wherein the operation performed is the artificial adjustment of measurements in order to account for factors which would differ during normal use of a device from the conditions during measurement. | |
| FOR 173 | Normalization: |
| Foreign art collections wherein the operation performed is the transforming of signals to a common basis. | |