SECTION I - CLASS DEFINITION
This class provides for process or apparatus for detecting
and correcting errors in electrical pulse or pulse coded data.
This class also provides for process or apparatus for detecting
and recovering from faults in electrical computers and digital data
processing systems, as well as logic level based systems.
SECTION II - REFERENCES TO OTHER CLASSES
SEE OR SEARCH CLASS:
| 324, | Electricity: Measuring and Testing, appropriate subclasses for process and apparatus
for measuring, testing or sensing of electric properties
or measuring, testing or sensing of nonelectric properties
by electric means. |
| 341, | Coded data Generation or Conversion, appropriate subclasses for process and apparatus
utilizing electrical pulse coding techniques without error correcting/detecting
functions for the generating or conversion of coded data. |
| 358, | Facsimile and Static Presentation Processing, appropriate subclasses for process and apparatus
for testing and performance monitoring of facsimile devices. |
| 365, | Static Information Storage and Retrieval,
subclass 200 and 201, for process and apparatus including
the specifics of memory devices which are tested for defects or
erroneous information. |
| 370, | Multiplex Communications, appropriate subclasses for process and apparatus
for measuring and testing part of a multiplex system. |
| 375, | Pulse or Digital Communications,
subclasses 213 and 224 - 228 for process and apparatus
for testing pulse or digital communication systems. |
| 379, | Telephonic Communications,
subclasses 1.01 through 33for process and apparatus for testing of telephone
circuits. |
| 455, | Telecommunications, appropriate subclasses for process and apparatus
for measuring, testing and monitoring of telecommunication
systems. |
| 706, | Data Processing: Artificial Intelligence,
subclasses 1+ for fuzzy logic, subclasses 15+ for neural
networks and subclasses 45+ for knowledge processing systems. |
| 707, | Data Processing: Database, Data
Mining, and File Management or Data Structures, 609 through 686 for database maintenance including synchronizing, archiving, backing
up and recovering databases,
subclasses 758 through 780for record, file and data search and comparison, and
subclasses 687 through 704 for data integrity in databases. |
| 708, | Electrical Computers: Arithmetic Processing and
Calculating, appropriate subclasses for process and apparatus
for computer arithmetic circuits. |
| 709, | Electrical Computers and Digital Processing Systems: Multicomputer
Data Transferring or Plural Processor Synchronization, appropriate subclasses for multiple computer or
computer process systems. |
| 710, | Electrical Computers and Digital Data Processing
Systems: Input/Output, appropriate subclasses for process and apparatus
for computer input or output systems. |
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclasses 133+ for entry replacement strategies and page fault
recovery, and subclasses 161+ for data archiving. |
| 712, | Electrical Computers and Digital Processing Systems: Processing
Architectures and Instruction Processing(e.g., processors), appropriate subclasses for process and apparatus
for computer structure and program execution systems. |
| 713, | Electrical Computers and Digital Processing Systems: Support, appropriate subclasses for process and apparatus
for computer cases, housing and supports. |
| 726, | Information Security,
subclasses 1 through 36for information security in computers or digital processing
system. |
SECTION III - GLOSSARY
BUS
A conductor used for transferring data, signals
or power.
COMPUTER
A machine that inputs data, processes data, stores
data, and outputs data.
DATA
Representation of information in a coded manner suitable
for communication, interpretation, or processing.
ADDRESS DATA
Data that represent or identify a source or destination.
INSTRUCTION DATA
Data that represent an operation and identify its operands, if
any.
STATUS DATA
Data that represent conditions of data, digital
data processing systems, computers, peripherals, memory, etc.
USER DATA
Data other than address data, instruction data, or
status data.
DATA PROCESSING
See PROCESSING, below.
DIGITAL DATA PROCESSING SYSTEM
An arrangement of processor(s) in combination
with either memory or peripherals, or both, performing
data processing.
ERROR
Manifestation of a fault as an undesired event that occurs
when actual behavior deviates from the behavior that is required
by initial specification. This includes a change in information
content of pulse or pulse coded data to a state or value other than
the normal state or value of a properly operating device or system.
FAULT
A flaw in a functional unit (hardware or software).
INFORMATION
Meaning that a human being assigns to data by means of the
conventions applied to that data.
MEMORY
A functional unit to which data can be stored and from which
data can be retrieved.
PERIPHERAL
A functional unit that transmits data to or receives
data from a computer to which it is coupled.
PROCESSING
Methods or apparatus performing systematic operations upon
data or information exemplified by functions such as data or information
transferring, merging, sorting, and computing (i.e., arithmetic
operations or logical operations).
| | (1)
Note. In this class, the glossary term data
is used to modify processing in the term data processing; whereas
the term digital data processing system refers to a machine performing
data processing. |
PROCESSOR
A functional unit that interprets and executes instruction data.
RECOVERY
Responding to a fault in a system by either returning
a system to a previous level of correct operation, achieving
a degraded level of correct operation, or safely shutting
down the system.
SECURITY
Extent of protection for system hardware, software, or data
from maliciously caused destruction, unauthorized modification, or
unauthorized disclosure.
SUBCLASSES
![[List of Patents for class 714 subclass 1]](../ps.gif) 1 | Reliability and availability: |
| | This subclass is indented under subclass 100. Subject matter further including means or steps for increasing
a probability of correctly performing services (e.g., data
processing) throughout a time interval, given
correct performance at the beginning of the interval, or
for increasing the probability of correctly performing services
at any given instant.
| | (1)
Note. Reliability features in a data processing
control system are classified elsewhere. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 746+, | for data error detection and correction, and
fault detection and recovery. |
SEE OR SEARCH CLASS:
| 380, | Cryptography,
subclass 4 for stored digital data access or copy prevention in
combination with data encryption; e.g., software
program protection or computer virus detection in combination
with data encryption. |
| 700, | Data Processing: Generic Control Systems
or Specific Applications,
subclasses 79 through 82for reliability features in a data processing generic
control system. |
|
| | |
| 2 | Fault recovery: |
| | This subclass is indented under subclass 1. Subject matter further including means or steps for responding
to a failure by either returning a system to a previous level of
correct operation, achieving a degraded level of correct
operation, or safely shutting down the system after detecting
the error or locating the fault.
| | (1)
Note. Classification here requires significant data
processing features claimed. For fault recovery in a system
without significant data processing method or apparatus, classification
is elsewhere. See the SEE OR SEARCH THIS CLASS, SUBCLASS
and SEE OR SEARCH CLASS notes below. |
| | (2)
Note. Classification here requires notification or
detection of the fault, its location, and a further
action. Subcombinations used in the process of fault recovery; e.g., fault
locating, are classified below. |
| | (3)
Note. "Page faults" are a species
of faults peculiar to memory accessing and are classified elsewhere
in this class. See the SEE OR SEARCH THIS CLASS, SUBCLASS
notes below. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 746+, | for data error detection and correction of general
utility. |
SEE OR SEARCH CLASS:
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclasses 133+ for entry replacement strategies and page fault
recovery. |
|
| | |
| 3 | By masking or reconfiguration: |
| | This subclass is indented under subclass 2. Subject matter further including means or steps for recovery
by selecting a correct output from a concurrently active redundant
functional unit in place of the output of the failed functional unit, or
by replacing or isolating the failed functional unit.
| | (1)
Note. This subclass is for fault recovery by masking
or reconfiguration in combination with significant data processing. Generic
fault recovery is classified elsewhere. See the SEE OR
SEARCH CLASS notes below. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 825, | for fault recovery by replacing or isolating the
failed functional unit not provided for elsewhere. |
|
| | |
| 4.1 | Of network: |
| | This subclass is indented under subclass 3. Subject matter further including means or steps for
recovery from nodal failure at a network level.
| | (1)
Note. This subclass is for the recovery and integration
of the processing within the node itself, as opposed to
the data flow/routing of the network via a communication
channel. This subclass definition specifically states that
it handles the failure of the processing aspects of the node, and
not the impact on the network itself. |
| | (2)
Note. Subject matter that involves hardware devices
such as switches to re-route communications in the multiplex
environment are classified elsewhere. |
SEE OR SEARCH CLASS:
| 340, | Communications: Electrical,
subclass 2.23 for alternate routing in a plural stage communication
system, and subclasses 286.01-333 for
residual electrical communication systems. |
| 342, | Communications: Directive Radio Wave
Systems and Devices (e.g., Radar, Radio
Navigation),
subclasses 1 through 465for alternate routing in a plural stage radar network. |
| 343, | Communications: Radio Wave Antennas,
subclasses 700 through 916for alternate routing in a plural antenna system. |
| 370, | Multiplex Communications,
subclasses 216 through 228for fault recovery, and subclasses 229-240
for data flow congestion prevention and control in a multiplex communication system, i.e., the
hardware devices (switches, etc.) to
re-route communications in the multiplex environment. |
| 375, | Pulse or Digital Communications,
subclass 356 for network synchronizing more than two stations. |
|
| | |
| 4.11 | Backup or standby (e.g., failover, etc.): |
| | This subclass is indented under subclass 4.1. Subject matter wherein the network has a spare substitute
node ready to take over in the event the main one crashes.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 13, | for prepared backup processor or updating backup
processor. |
SEE OR SEARCH CLASS:
| 370, | Multiplex Communications,
subclasses 216 through 228for fault recovery, and subclasses 229-240
for data flow congestion prevention and control in a multiplex communication system. |
| 379, | Telephonic Communications,
subclass 112.02 for call traffic recording by redundant processor
or backup processor, and subclass 221.04 for restoring
failed network routing. |
| 700, | Data Processing: Generic Control Systems
or Specific Applications,
subclass 82 for relating to the protection and reliability
of the control system. |
| 707, | Data Processing: Database and File Management
or Data Structures,
subclasses 640 through 686for archiving, backup, or recovery
under database management. |
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclasses 161 through 162for archiving and backup under memory accessing, and
subclass 165 for internally relocating data. |
| 713, | Electrical Computers and Digital Processing Systems: Support,
subclass 323 for relating to sleep/resume, suspend/resume
or standby of data processing systems. |
|
| | |
| 4.4 | Remote repair: |
| | This subclass is indented under subclass 4.1. Subject matter further comprising means or steps
to repair nodes located at a site remote from the network.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 6.31, | for repair at the plurality of memory devices. |
|
| | |
| 4.5 | Bus network (e.g., PCI, AGP, etc.): |
| | This subclass is indented under subclass 4.1. Subject matter wherein the network shares a common
path such as Peripheral Component Interconnect (PCI) or
Accelerated Graphics Port (AGP) for enabling redundancy
in the communication between a plurality of peripheral devices and
a host.
SEE OR SEARCH CLASS:
| 370, | Multiplex Communications,
subclass 258 for a bus network having a closed transmission
path. |
|
| | |
| 5.1 | Of peripheral subsystem: |
| | This subclass is indented under subclass 3. Subject matter further including means or steps for
recovery from a faulted peripheral device.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 710, | through 711, for replacement of memory spare location, portion, or
segment. |
SEE OR SEARCH CLASS:
| 710, | Electrical Computers and Digital Data Processing
Systems: Input/Output,
subclasses 1 through 74for transferring data from one or more peripherals
to one or more computers for the latter to process, store, or
further transfer or for transferring data from the computers to
the peripherals. |
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclasses 100 through 317for means (e.g., processor, controller, etc.) or steps
for governing memory in a digital data processing system or the
passage (e.g., reading or writing, etc.) of data
thereto, and subclasses 133-136 for entry replacement
strategies and page fault recovery. |
|
| | |
| 5.11 | Access processor affected (e.g., I/O
processor, MMU, or DMA processor, etc.): |
| | This subclass is indented under subclass 5.1. Subject matter further comprising means or steps
for recovery from a fault limited to a specialized processor accessing
I/O processor, Memory Management Unit (MMU), or
Direct Memory Access (DMA) processor.
SEE OR SEARCH CLASS:
| 712, | Electrical Computers and Digital Processing Systems: Processing
Architectures and Instruction Processing (e.g., Processors), appropriate subclassesfor digital data processing system architecture, per
se. |
|
| | |
| 6.1 | Of memory: |
| | This subclass is indented under subclass 3. Subject matter further including means or steps for
recovery from a fault of a memory function level.
| | (1)
Note. "Page faults" are a species
of faults peculiar to memory accessing which are classified elsewhere. See
the SEE OR SEARCH THIS CLASS, SUBCLASS notes below. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 710, | through 711, for replacement of memory spare location, portion, or
segment. |
SEE OR SEARCH CLASS:
| 710, | Electrical Computers and Digital Data Processing
Systems: Input/Output,
subclasses 1 through 74for transferring data from one or more peripherals
to one or more computers for processing or storing. |
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclasses 100 through 132for means (e.g., processor, controller, etc.) or steps
for governing memory in a digital data processing system or the
passage (e.g., reading or writing, etc.) of data
thereto, and subclasses 133-146 for entry replacement
strategies and page fault recovery. |
|
| | |
| 6.12 | Recovery partition: |
| | This subclass is indented under subclass 6.11. Subject matter further including means or steps for
recovery of a fault within a distinct portion of single memory. |
| | |
| 6.13 | Isolating failed storage location (e.g., sector remapping, etc.): |
| | This subclass is indented under subclass 6.11. Subject matter further including means or steps for
recovery by disabling or detaching access to a failed single memory
location.
| | (1)
Note. Classification herein requires more than selecting
a correct output from a concurrently active redundant functional
unit in place of the output of the failed component. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 710, | through 711, for replacement of memory spare location, portion, or
segment. |
SEE OR SEARCH CLASS:
| 365, | Static Information Storage and Retrieval,
subclasses 200 and 201 for bad bit and testing of static storage. |
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclasses 170 through 173for automatically determining memory space allocation. |
|
| | |
| 6.2 | Plurality of memory devices (e.g., array, etc.): |
| | This subclass is indented under subclass 6.1. Subject matter further including means or steps for
recovery of a fault within a plurality of memory devices, e.g., array, etc.
SEE OR SEARCH CLASS:
| 326, | Electronic Digital Logic Circuitry,
subclasses 39 through 45for programmable gate arrays. |
| 710, | Electrical Computers and Digital Data Processing
Systems: Input/Output,
subclasses 20 through 21for systems directed to parallel data transfer. |
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclasses 170 through 173for automatically determining memory space allocation. |
|
| | |
| 6.22 | RAID: |
| | This subclass is indented under subclass 6.2. Subject matter wherein the plurality of memory devices
are redundant array of inexpensive disks (RAID) for
recovery of a fault. |
| | |
| 6.23 | Mirror (i.e., level
1 RAID): |
| | This subclass is indented under subclass 6.22. Subject matter wherein the RAID has a level one
that has one disk drive and an exact backup on a second disk, i.e., all
data is redundantly recorded on a second disk for recovery of a fault. |
| | |
| 6.3 | Backup or standby (e.g., failover, etc.): |
| | This subclass is indented under subclass 6.2. Subject matter wherein the plurality of memory devices
has a spare standby memory ready to take over in the event of the
main one crashes.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 4.11, | for prepared backup or updating backup memory devices. |
|
| | |
| 6.31 | Remote repair: |
| | This subclass is indented under subclass 6.3. Subject matter further comprising means or steps
to repair a memory located at a site remote from the network.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 4.4, | for repair of a network remotely. |
|
| | |
| 10 | Of processor: |
| | This subclass is indented under subclass 3. Subject matter further including means or steps for recovery
from fault of a processor.
SEE OR SEARCH CLASS:
| 712, | Electrical Computers and Digital Processing Systems: Processing
Architectures and Instruction Processing (e.g., processors), appropriate subclasses for digital data processing
system architecture, per se. |
|
| | |
| 11 | Concurrent, redundantly operating processors: |
| | This subclass is indented under subclass 10. Subject matter further including means or steps for recovery
employing redundant processors substantially simultaneously performing
the same operation.
SEE OR SEARCH CLASS:
| 700, | Data Processing: Generic Control Systems
or Specific Applications,
subclass 3 for master/slave processors in a data
processing generic control system, and subclasses 79-82
for protection or reliability in a digital data processing control
system. |
|
| | |
| 12 | Synchronization maintenance of processors: |
| | This subclass is indented under subclass 11. Subject matter further including means or steps for maintaining
processor state synchronization to achieve redundancy of operation.
| | (1)
Note. Classification here requires a redundant processor
for the purpose of reliability, such as by consideration
of state of internal registers and the like of the redundant processors
and thus the machines themselves. Synchronization in
the form of timing and clock skew is classified elsewhere. See
the SEE OR SEARCH THIS CLASS, SUBCLASS notes below. |
| | (2)
Note. Classification here requires the existence
of a fault condition. Synchronization maintenance at
the clock level, however, is classified elsewhere. See
the search class notes below. |
SEE OR SEARCH CLASS:
| 375, | Pulse or Digital Communications,
subclasses 354+ for communications synchronizing. |
| 709, | Electrical Computers and Digital Processing Systems: Multicomputer
Data Transferring or Plural Processor Synchronization, appropriate subclasses for multicomputer and synchronizing, and
for synchronization maintenance of plural processors, per
se. |
| 712, | Electrical Computers and Digital Processing Systems: Processing
Architectures and Instruction Processing (e.g., processors), appropriate subclasses for task management, per
se. |
| 713, | Electrical Computers and Digital Processing Systems: Support,
subclasses 400+ , for clock synchronization, per se, subclasses
500+, for digital data processing system clock, pulse
and timing interval generation, per se. |
|
| | |
| 13 | Prepared backup processor (e.g., initializing
cold backup) or updating backup processor (e.g., by
checkpoint message): |
| | This subclass is indented under subclass 10. Subject matter further including means or steps for readying
a backup processor or digital data processing system to replace
a failed primary processor or digital data processing system, or to
receive recent processing result(s) from a backup
processor or digital data processing system that may be relied upon.
| | (1)
Note. Classification here allows for the backup processor
or digital data processing system to be performing operations unrelated
to backup operation before or after failure of the primary processor
or digital data processing systems. |
SEE OR SEARCH CLASS:
| 700, | Data Processing: Generic Control Systems
or Specific Applications,
subclasses 2 through 7for data processing control system applications employing
plural processors, and subclasses 79-82 for protection
or reliability in a digital data processing system based control
system. |
|
| | |
| 14 | Of power supply: |
| | This subclass is indented under subclass 3. Subject matter further including means or steps for recovery
using power supply subsystem component redundancy.
SEE OR SEARCH CLASS:
| 713, | Electrical Computers and Digital Processing Systems: Support,
subclasses 300+ , for power control in a digital data processing
system environment, and subclass 321 for electrical digital calculating
computer (i.e., calculator) with
power saving feature. |
|
| | |
| 15 | State recovery (i.e., process
or data file): |
| | This subclass is indented under subclass 2. Subject matter further including means or steps for recovery
by restoring data in a data file, or data for a process, to
data at a previous point in time.
| | (1)
Note. The species of fault recovery or avoidance
concerned with storing verbatim copies of data is classified elsewhere. See
the SEE OR SEARCH THIS CLASS, SUBCLASS notes below. |
| | (2)
Note. Parity and error-correction coded storage
of general utility in a system without data processing features
claimed is classified elsewhere. |
| | (3)
Note. This state recovery subclass provides for reliability
and availability recovery under the condition of a fault. Data
management, per se, is classified elsewhere. See
the search class notes below. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 6.1 | through 6.23 for recovery by accessing redundant stored data. |
| 763+, | for memory access block coding. |
| 805, | for storage accessing error/fault detection
techniques. |
SEE OR SEARCH CLASS:
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclasses 141+ for cache memory coherency, per se; subclasses
147+ for shared memory data processing which may employ
data management principles; and subclasses 161+ for preventing
the corruption, loss, alteration, or
disclosure of data by storing, as in making backup copies. |
| 712, | Electrical Computers and Digital Processing Systems: Processing
Architectures and Instruction Processing (e.g., processors), appropriate
subclasses for source code management and software version management. |
|
| | |
| 16 | Forward recovery (e.g., redoing
committed action): |
| | This subclass is indented under subclass 15. Subject matter further including means or steps for recovery
by re-executing an operation in response to detecting an
error in an operation.
| | (1)
Note. Recovery by operation retry or error detection
by sequential repetition in a system without data processing features
is classified elsewhere. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 822, | for sequential repetition. |
SEE OR SEARCH CLASS:
| 707, | Data Processing: Database, Data
Mining, and File Management or Data Structures,
subclasses 609 through 686for database maintenance including synchronizing, archiving, backing up
and recovering databases; subclasses 758 through 780 for
record, file and data search and comparison, and
subclasses 687 through 704 for data integrity in databases. |
|
| | |
| 17 | Reexecuting single instruction or bus cycle: |
| | This subclass is indented under subclass 16. Subject matter further including means or steps for recovery
by retrying single instruction or bus cycle.
SEE OR SEARCH CLASS:
| 710, | Electrical Computers and Digital Data Processing
Systems: Input/Output,
subclasses 100+ , for system intraconnecting and bus processing, per
se. |
|
| | |
| 18 | Transmission data record (e.g., for
retransmission): |
| | This subclass is indented under subclass 15. Subject matter further including means or steps for recovery
of a communication process (e.g., a
session) using a record.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 748+, | for retransmission in a system without data processing
features claimed. |
SEE OR SEARCH CLASS:
| 710, | Electrical Computers and Digital Data Processing
Systems: Input/Output, appropriate subclasses for I/O processing
and communication between computers and peripherals. |
|
| | |
| 19 | Undo record: |
| | This subclass is indented under subclass 15. Subject matter further including means or steps for recovery
of data in the presence of uncommitted action using a record of
the data created before the action.
SEE OR SEARCH CLASS:
| 707, | Data Processing: Database, Data
Mining, and File Management or Data Structures,
subclasses 609 through 686for database maintenance including synchronizing, archiving, backing up
and recovering databases; subclasses 758 through 780 for
record, file and data search and comparison, and
subclasses 687 through 704 for data integrity in databases. |
| 715, | Data Processing: Presentation Processing
of Document, Operator Interface Processing, and
Screen Saver Display Processing, appropriate subclasses for a word data processing application
on computer, particularly
subclasses 255 through 272for editing in a text data processing application. |
|
| | |
| 21 | State validity check: |
| | This subclass is indented under subclass 15. Subject matter further including means or steps wherein
recovery is controlled by verifying the accuracy of the state data. |
| | |
| 22 | With power supply status monitoring: |
| | This subclass is indented under subclass 15. Subject matter further including means or steps wherein
recovery is controlled by a power supply status monitor.
SEE OR SEARCH CLASS:
| 713, | Electrical Computers and Digital Processing Systems: Support,
subclass 321 for electrical digital calculating computer (i.e., calculator) with
power saving feature, and subclass 340, for generic
power control monitoring in a digital data processing system environment. |
|
| | |
| 23 | Resetting processor: |
| | This subclass is indented under subclass 2. Subject matter further including means or steps for recovery
using clearing or initializing of a processor register. |
| | |
| 24 | Safe shutdown: |
| | This subclass is indented under subclass 2. Subject matter further including means or steps for recovery
including termination of a system component to a safe condition.
| | (1)
Note. Isolating (i.e., disabling) an
output of a failed network, processor, memory, peripheral, I/O, or
power supply component is classified elsewhere. See SEE
OR SEARCH THIS CLASS, SUBCLASS notes below. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 4.1 | through 4.5, for network affected fault recovery. |
| 5.1 | through 6.23, for memory or peripheral subsystem affected. |
| 6.13, | for isolating failed storage locations. |
| 10, | for processor affected fault recovery. |
| 14, | for power supply affected fault recovery. |
SEE OR SEARCH CLASS:
| 713, | Electrical Computers and Digital Processing Systems: Support,
subclasses 300+ , for power control in a digital data processing
system environment. |
|
| | |
| 25 | Fault locating (i.e., diagnosis
or testing): |
| | This subclass is indented under subclass 1. Subject matter further including means or steps for pinpointing
a fault using either a reactive diagnosing or a proactive testing, including testing
for developmental stage fault avoidance, for assurance, or
for maintenance.
| | (1)
Note. An invention directed to locating a fault in
a digital data processing system including more than nominal data
processing, or where the fault is specific to a nongeneral
use of a digital data processing system, is classified
here. fault locating in combination with a specific art device
not of the basic subject matter of this class is classified with
the art device. |
SEE OR SEARCH CLASS:
| 324, | Electricity: Measuring and Testing,
subclass 73.1 for various electrical testing arrangements that
may include fault locating. |
| 370, | Multiplex Communications,
subclasses 241+ for diagnostic testing in multiplex communications. |
| 399, | Electrophotography,
subclasses 9+ for diagnostic testing of a photocopier, including
computer controlled malfunction warning and recovery. |
|
| | |
| 26 | Artificial intelligence (e.g., diagnostic
expert system): |
| | This subclass is indented under subclass 25. Subject matter wherein the testing is performed using an
artificial intelligence technique; e.g., fault
tree, reasoning rules, self-learning.
SEE OR SEARCH CLASS:
| 706, | Data Processing: Artificial Intelligence, appropriate subclasses, for artificial
intelligence, per se. |
|
| | |
| 27 | Particular access structure: |
| | This subclass is indented under subclass 25. Subject matter further including means or steps related
to an access structure specialized for observing or controlling
a test or diagnosis. |
| | |
| 28 | Substituted emulative component (e.g., emulator
microprocessor): |
| | This subclass is indented under subclass 27. Subject matter further including means or steps for using
a tester component that can emulate (i.e., functionally
operate as) a normal component in the tested system.
SEE OR SEARCH CLASS:
| 703, | Data Processing: Structural Design, Modeling, Simulation, and
Emulation, appropriate subclasses. |
| 716, | Computer-Aided Design and Analysis of
Circuits and Semiconductor Masks, appropriate subclasses. |
|
| | |
| 29 | Memory emulator feature: |
| | This subclass is indented under subclass 28. Subject matter further including means or steps for using
memory that can functionally replace a system component.
| | (1)
Note. For classification here the replaced component
need not be a memory. |
SEE OR SEARCH CLASS:
| 703, | Data Processing: Structural Design, Modeling, Simulation, and
Emulation, appropriate subclasses for general purpose simulation
or emulation of system components. |
|
| | |
| 32 | Particular stimulus creation: |
| | This subclass is indented under subclass 25. Subject matter further including means or steps for selection
or generation of a signal (i.e., data) for
testing or diagnosing.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 712+, | for memory testing including pattern generation. |
SEE OR SEARCH CLASS:
| 365, | Static Information Storage and Retrieval,
subclass 201 for static memory testing. |
|
| | |
| 33 | Derived from analysis (e.g., of
a specification or by simulation): |
| | This subclass is indented under subclass 32. Subject matter further including means or steps for deriving
a test or diagnosis program based on an analysis of specification, design, or
output of the system to be tested or diagnosed.
SEE OR SEARCH CLASS:
| 324, | Electricity: Measuring and Testing,
subclass 73.1 for various electrical testing arrangements
that may include fault locating. |
| 703, | Data Processing: Structural Design, Modeling, Simulation, and
Emulation,
subclasses 13 through 22for simulating electronic device and electrical
system. |
| 716, | Computer-Aided Design and Analysis of
Circuits and Semiconductor Masks, appropriate subclasses. |
|
| | |
| 34 | Halt, clock, or interrupt signal (e.g., freezing, hardware
breakpoint, single-stepping): |
| | This subclass is indented under subclass 32. Subject matter further including means or steps for controlling
a processor or digital data processing system to be tested or diagnosed
by applying an interrupt, halt, or clock signal
to a processor or digital data processing system.
SEE OR SEARCH CLASS:
| 710, | Electrical Computers and Digital Data Processing
Systems: Input/Output,
subclasses 48+ , for Input/Output device interrupt
processing. |
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclass 204 for virtual address branch or jump address predicting; and
subclasses 213 for generalized prefetch, look-ahead, jump, or
predictive address generating. |
| 712, | Electrical Computers and Digital Processing Systems:
Processing Architecture and Instruction Processing (e.g., Processors),
subclass 227 , for instruction processing in support
of testing, debugging, emulation, etc. |
| 713, | Electrical Computers and Digital Processing Systems: Support,
subclasses 500+ , for clock processing, per se. |
| 717, | Data Processing: Software Development, Installation, and
Management,
subclasses 100 through 167for software development tools. |
|
| | |
| 35 | Substituted or added instruction (e.g., code instrumenting, breakpoint
instruction): |
| | This subclass is indented under subclass 32. Subject matter further including means or steps for substituting
or adding a testing or diagnosing instruction into a program or
instruction data stream of a processor or digital data processing
system being tested or diagnosed.
SEE OR SEARCH CLASS:
| 712, | Electrical Computers and Digital Processing Systems:
Processing Architecture and Instruction Processing (e.g., Processors), appropriate subclasses for instruction processing, per se, including
instruction alignment, fetching and decoding, and
for processing control at the processor level, per se, particularly
subclass 227 , for instruction processing in support
of testing, debugging, emulation, etc. |
|
| | |
| 36 | Test sequence at power-up or initialization: |
| | This subclass is indented under subclass 32. Subject matter further including means or steps for performing
a sequence of tests automatically in response to a power-up
or initialization action.
SEE OR SEARCH CLASS:
| 710, | Electrical Computers and Digital Data Processing
Systems: Input/Output, appropriate subclasses, for assigning operating
characteristics to peripherals, particularly
subclass 104 , for utilizing a hardware structure for
providing a processor with an arrangement of the digital data processing
system including characteristics of the digital data processing
system’s components. |
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclass 170 for automatically determining and allocating memory
space or specifying an allocation. |
| 713, | Electrical Computers and Digital Processing Systems: Support,
subclasses 1 through 100,for digital data processing system initialization
and configuration at boot-time. |
|
| | |
| 37 | Analysis (e.g., of
output, state, or design): |
| | This subclass is indented under subclass 25. Subject matter further including means or steps for evaluating
the output, state, or design, of a computer
system or a processor or a program, for fault locating.
SEE OR SEARCH CLASS:
| 324, | Electricity: Measuring and Testing,
subclass 73.1 for various electrical testing arrangements that
may include fault locating. |
| 703, | Data Processing: Structural Design, Modeling, Simulation, and
Emulation,
subclasses 13 through 22for the use of database in simulating electronic
device and electrical system. |
| 716, | Computer-Aided Design and Analysis of
Circuits and Semiconductor Masks, appropriate subclasses. |
|
| | |
| 38.1 | Of computer software faults: |
| | This subclass is indented under subclass 37. Subject matter further including means or steps for
locating a fault in software or testing software for determining
the location of a fault.
| | (1)
Note. This subclass also provides for detecting an
error in instruction data in combination with a digital data processing
system. Analysis or monitoring of program code execution
is used for the purpose of fault location and recovery during actual
use of computer software, and it is used subsequent to
software development. |
| | (2)
Note. This subclass also provides for fault locating
in software analysis by mechanisms such as debugging, automatic
code generating, object oriented design, etc. |
| | (3)
Note. Generic coded information error detection for
determining efficiency of a program during execution, so
as to utilize the determination in debugging of the software during
the development process, is classified elsewhere. See
SEE OR SEARCH CLASS notes below. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 799, | through 824, for coded information error detecting. |
SEE OR SEARCH CLASS:
| 703, | Data Processing: Structural Design, Modeling, Simulation, and
Emulation,
subclass 22 for modeling (i.e., artificially
mimic) a computer software program so as to predict or
analyze its performance. |
| 717, | Data Processing: Software Development, Installation, and
Management,
subclasses 131 through 133for determining efficiency of program execution
time analysis. |
|
| | |
| 38.11 | Memory dump: |
| | This subclass is indented under subclass 38.1. Subject matter further including means or steps for
generating a memory image of the existing state of software executing
on the system at the time of a crash. |
| | |
| 38.14 | By remotely: |
| | This subclass is indented under subclass 38.1. Subject matter wherein fault location determination
during software testing or analysis is performed remotely. |
| | |
| 39 | Monitor recognizes sequence of events (e.g., protocol
or logic state analyzer): |
| | This subclass is indented under subclass 37. Subject matter further including means or steps for locating
a fault by using a monitor for classifying or otherwise recognizing
a sequence of events.
SEE OR SEARCH CLASS:
| 709, | Electrical Computers and Digital Processing Systems: Multicomputer
Data Transferring or Plural Processor Synchronization,
subclass 224 for computer network managing including monitoring. |
|
| | |
| 43 | Bus, I/O channel, or network
path component fault: |
| | This subclass is indented under subclass 40. Subject matter further including means or steps for fault
locating specific to a fault in a bus, peripheral or I/O
channel, or network path.
SEE OR SEARCH CLASS:
| 710, | Electrical Computers and Digital Data Processing
Systems: Input/Output,
subclasses 100+ , for subject matter directed to system
intraconnecting and bus access processing. |
|
| | |
| 44 | Peripheral device component fault: |
| | This subclass is indented under subclass 40. Subject matter further including means or steps for fault
locating specific to a fault in a peripheral device.
SEE OR SEARCH CLASS:
| 710, | Electrical Computers and Digital Data Processing
Systems: Input/Output, appropriate subclasses, for subject matter
directed to Input/Output processing and communication between
peripherals and computers or digital data processing systems. |
|
| | |
| 46 | Operator interface for diagnosing or testing: |
| | This subclass is indented under subclass 25. Subject matter further including means or steps for interfacing
with an operator for fault locating.
SEE OR SEARCH CLASS:
| 715, | Data Processing: Presentation Processing
of Document, Operator Interface Processing, and
Screen Saver Display Processing,
subclasses 700 through 866for computer graphics operator interface. |
|
| | |
| 47.1 | Performance monitoring for fault avoidance: |
| | This subclass is indented under subclass 1. Subject matter further including means or steps for
monitoring event duration and event counts for anticipating or recognizing
faults.
| | (1)
Note. This subclass relates to the fault avoidance
species of reliability. |
| | (2)
Note. This subclass includes event duration and counting
arrangements for statistical analysis of system operations and predictive
methods of fault avoidance. |
SEE OR SEARCH CLASS:
| 368, | Horology: Time Measuring Systems or Devices,
subclasses 1 through 327for time measurement. |
| 377, | Electrical Pulse Counters, Pulse Dividers, or
Shift Registers: Circuits and Systems,
subclasses 64 through 81for shift registers, and subclasses 107-111
for counters. |
| 702, | Data Processing: Measuring, Calibrating, or
Testing,
subclasses 182 through 186for performance or efficiency evaluation in a computer
data processing system for measuring, calibrating, or
testing purposes. |
| 705, | Data Processing: Financial, Business Practice, Management, or
Cost/Price Determination,
subclasses 7.11 through 7.42for operations research. |
| 708, | Electrical Computers: Arithmetic Processing
and Calculating,
subclasses 200 through 714for various arithmetic data processing operations
performed by digital calculating computers. |
| 709, | Electrical Computers and Digital Processing Systems: Multicomputer
Data Transferring,
subclass 224 for computer network managing including monitoring. |
|
| | |
| 47.2 | Threshold: |
| | This subclass is indented under subclass 47.1. Subject matter further including means or steps for
establishing the minimum value of a signal that can be detected
by the system for monitoring event duration and event counts for
anticipating or recognizing faults. |
| | |
| 47.3 | Trends (i.e., expectancy): |
| | This subclass is indented under subclass 47.1. Subject matter further including means or steps that
use the data from measured characteristics, events, or
conditions to calculate the length of time to a potential future
failure. |
| | |
| 48 | Error detection or notification: |
| | This subclass is indented under subclass 1. Subject matter further including means or steps for automated
on-line sensing of errors, or for storing or propagating
such error information (e.g., error
logging).
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 1+, | for fault recovery in combination with error detecting
or notifying. |
| 25+, | for fault locating combined with error detecting
or notifying. |
| 47.1 | through 47.3, for performance monitoring for fault avoidance in
combination with error detecting or notifying. |
SEE OR SEARCH CLASS:
| 707, | Data Processing: Database, Data
Mining, and File Management or Data Structures,
subclass 699 for use of CRC for data integrity in database and file
management. |
|
| | |
| 50 | State out of sequence: |
| | This subclass is indented under subclass 49. Subject matter wherein an ordering of state information
related to a succession of data, instructions etc., is
the basis for state analysis.
SEE OR SEARCH CLASS:
| 710, | Electrical Computers and Digital Data Processing
Systems: Input/Output,
subclasses 260+ for Input/Output device interrupt processing. |
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclass 204 for virtual address branch or jump address predicting; and
subclass 213 for generalized prefetch, look-ahead, jump, or
predictive address generating. |
| 712, | Electrical Computers and Digital Processing Systems:
Processing Architecture and Instruction Processing (e.g., Processors), appropriate subclasses for instruction fetching
and prefetching and for branching instruction processing and for
task management and control, per se. |
|
| | |
| 52 | Error checking code: |
| | This subclass is indented under subclass 50. Subject matter for detecting consistency of information
by using a code (e.g., parity, etc.) which
is generated from the information.
| | (1)
Note. Error checking codes are a function of the
actual data of concern, as exemplified in one simple form
by parity data. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 763+, | for memory access block coding, and subclass
805 for storage accessing. |
SEE OR SEARCH CLASS:
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclasses 161+ for preventing the corruption, loss, alteration, or
disclosure of data by storing, as in making backup copies. |
|
| | |
| 53 | Address error: |
| | This subclass is indented under subclass 49. Subject matter further including means or steps for detection
or notification of error of address state. |
| | |
| 54 | Storage content error: |
| | This subclass is indented under subclass 49. Subject matter further including means or steps for detection
or notification of error of storage state.
SEE OR SEARCH CLASS:
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclass 144 for cache status data bits (e.g., bits
indicating modified, valid, dirty data), wherein
coherency for each unit or block of data includes associated identifier
bit(s) to indicate the validity status of an
associated cached location; subclass 156 for status storage
control techniques including provisions for storing status data (e.g., control
status words, program status words, etc.) associated
with memory accessing and control; and subclass 165 for
movement/transfers of data amongst locations within a same memory
level. |
|
| | |
| 55 | Timing error (e.g., watchdog
timer time-out): |
| | This subclass is indented under subclass 48. Subject matter further including means or steps for detection
or notification of error of timing.
SEE OR SEARCH CLASS:
| 713, | Electrical Computers and Digital Processing Systems: Support,
subclass 375 for synchronization maintenance of plural processors, subclasses
400-401 for clock synchronization, per se, and
subclasses 500-503 for digital data processing system clock, pulse and
timing interval generation, per se. |
| 718, | Electrical Computers and Digital Processing Systems: Virtual
Machine Task or Process Management or Task Management/Control,
subclass 1 for virtual machine task or process management
and 100-108 for task management or control, in
general. |
|
| | |
| 56 | Bus or I/O channel device fault: |
| | This subclass is indented under subclass 55. Subject matter further including means or steps for detecting
errors related to a flaw in a bus, peripheral, or
I/O channel device.
SEE OR SEARCH CLASS:
| 710, | Electrical Computers and Digital Data Processing
Systems: Input/Output, appropriate subclasses for system intraconnecting
and bus processing, per se. |
|
| | |
| 100 | DATA PROCESSING SYSTEM ERROR OR FAULT HANDLING |
| | This subclass is indented under the class definition. Subject matter for enhancing the ability of a system, which
is programmed for organization or manipulation of data, to
respond to an unexpected hardware or software failure.
| | (1)
Note. Classification herein requires more than nominal
recitation of data processing components in combination with means
or steps for furthering correct data processing operations by mechanisms including
error detecting, performance monitoring, fault
locating, and fault recovery. |
| | (2)
Note. The species of reliability and availability
directed to memory accessing and control with data archiving, backups, device
access limiting, and security are classified elsewhere, see
the SEE OR SEARCH CLASS notes below, other species of reliability
and availability in memory accessing and control such as isolating
failed memory and storing redundant data are classified herein. |
SEE OR SEARCH CLASS:
| 380, | Cryptography,
subclasses 3+ for stored information access or copy prevention (e.g., software
program protection or computer virus protection) in combination
with data encryption, and subclasses 22 - 25 and
50 for electric signal modification and other appropriate subclasses. |
| 707, | Data Processing: Database, Data
Mining, and File Management or Data Structures,
subclass 699 for use of CRC for data integrity in database and file
management. |
| 726, | Information Security,
subclasses 1 through 36for information security in computers or digital
processing system. |
|
| | |
| 699 | PULSE OR DATA ERROR HANDLING |
| | This subclass is indented under the class definition. Subject matter further including means or steps for detecting
and/or correcting errors in electrical pulse or pulse coded
data, in addition, electrical based systems or
devices which utilize techniques for detecting an error or fault condition, without
recitation of specific data processing system components, are
classified herein, said techniques include testing and diagnosis
at the logic/component level.
| | (1)
Note. Fault detection herein excludes processes
and apparatus wherein there is no actual testing using digital data
containing intelligence. |
| | (2)
Note. This class does not include detecting the
distortion or degradation of pulse coded data per se, but
rather includes detecting and/or correcting of errors in the
information content of pulse or pulse coded data which may have
occurred due to distortion or degradation of the coded data, thereby
changing the state or value of the information content to such an
extent as to comprise an error by definition. |
| | (3)
Note. Nominally recited art devices or systems external
to this class, claimed in combination with subject matter
under the class definition, are classified in this class, for
example, static memory devices claimed in combination with error
correcting encoding/decoding apparatus are classified herein, and
a nominally recited telecommunications switching system claimed
in combination with fault diagnostic and/or recovery apparatus
would also be classified herein. |
| | (4)
Note. Significantly claimed apparatus external to
this class claimed in combination with apparatus under the class definition, which
perform fault detection/correction techniques, are
classified with the external apparatus, for example, a
significantly claimed multiplex communication apparatus that performs
general testing of its components would be found elsewhere, see
SEE OR SEARCH CLASS below. |
SEE OR SEARCH CLASS:
| 341, | Coded Data Generation or Conversion, various subclasses for systems related to generic
systems for either (a) originating or emitting
a coded set of discrete signals or (b) translating one
code into another code wherein the information signal content remains
the same but the formats may differ. |
| 358, | Facsimile and Static Presentation Processing,
subclasses 406 and 504 for systems where a facsimile apparatus is
monitored, measured, calibrated, or tested. |
| 360, | Dynamic Magnetic Information Storage or Retrieval,
subclasses 26 , 36, 38, 47, and
53 for testing dynamic magnetic memory systems. |
| 370, | Multiplex Communications,
subclasses 13+ and 100+ for subject matter wherein part
of a multiplex system is monitored and tested to evaluate its performance, including
circuit continuity checking, repeater testing, loopback
testing, and alternate routing due to failure. |
| 375, | Pulse or Digital Communications,
subclasses 213 and 224 - 228 for testing pulse or digital
communication systems. |
| 379, | Telephonic Communications,
subclasses 1 through 33for testing of telephone circuits. |
|
| | |
| 700 | SKEW DETECTION/CORRECTION: |
| | This subclass is indented under subclass 699. Subject matter in which an error caused by the time delay
between plural parallel bits forming a byte or data word is detected
or corrected.
SEE OR SEARCH CLASS:
| 360, | Dynamic Magnetic Information Storage or Retrieval,
subclass 26 for electronically correcting phasing errors between
related information signals. |
|
| | |
| 702 | Memory access (e.g., address
permutation): |
| | This subclass is indented under subclass 701. Subject matter which changes the format of digital data
by having the signal with the data written into or read out of a
storage device.
| | (1)
Note. Address permutation arrangements are included
in this subclass. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 718, | for diagnostic testing of a memory. |
|
| | |
| 704 | Error count or rate: |
| | This subclass is indented under the class definition. Subject matter which determines the number of bits in error
or the number of bits in error per unit of time.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 798, | for this subject matter combined with control of
synchronization in response to an error detection signal. |
|
| | |
| 705 | Pseudo-Error rate: |
| | This subclass is indented under subclass 704. Subject matter having a main data path and a secondary data
path having intentionally degraded performance connected in parallel, the
secondary path having a decision device to compare and evaluate
the disagreement between the paths.
| | (1)
Note. Each disagreement is called a pseudo-error. | |
| | |
| 706 | Up-down counter: |
| | This subclass is indented under subclass 704. Subject matter including an reversible accumulating register
which counts up in response to an error and counts down in response
to an error-free increment of time.
SEE OR SEARCH CLASS:
| 377, | Electrical Pulse Counters, Pulse Dividers, or
Shift Registers: Circuits and Systems, appropriate subclasses for up-down counters
per se. |
|
| | |
| 707 | Synchronization control: |
| | This subclass is indented under subclass 704. Subject matter in which a determination of the error rate
is used to control synchronization between devices.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 798+, | for error detection controlled synchronization control
other than by error rate. |
|
| | |
| 709 | DATA PULSE EVALUATION/BIT DECISION: |
| | This subclass is indented under subclass 699. Subject matter in which the information bearing parameter (amplitude, pulse
position, etc.) of a data pulse is evaluated
to determine the proper logic state or value.
| | (1)
Note. Subject matter in this subclass relates to
determining if a data pulse represents a particular given logic
state, e.g., logic one as opposed
to logic zero. |
SEE OR SEARCH CLASS:
| 327, | Miscellaneous Active Electrical Nonlinear Devices, Circuits, and
Systems,
subclasses 1+ for pulse selecting means. |
| 329, | Demodulators,
subclasses 311+ for pulse demodulation or detection, per se. |
|
| | |
| 712 | TRANSMISSION FACILITY TESTING: |
| | This subclass is indented under subclass 699. Subject matter in which the diagnostic testing is performed
upon a channel of a transmission medium with a device for supplying
digital data thereto.
| | (1)
Note. The transmission facility includes the transmission
medium and all associated equipment required to transmit a message. |
SEE OR SEARCH CLASS:
| 370, | Multiplex Communications,
subclasses 241+ for testing of multiplex communication systems. |
| 375, | Pulse or Digital Communications,
subclasses 224+ for testing of pulse or digital communications
system. |
| 379, | Telephonic Communications, 1.01-33 for diagnostic testing
of telephone equipment. |
|
| | |
| 714 | By tone signal: |
| | This subclass is indented under subclass 712. Subject matter which includes application of a test signal
composed of one or more tone signals. |
| | |
| 715 | Test pattern with comparison: |
| | This subclass is indented under subclass 712. Subject matter in which the transmission facility is tested
by applying a test pattern to the device under test and comparing
the output to a reference test pattern. |
| | |
| 716 | Loop-back: |
| | This subclass is indented under subclass 715. Subject matter in which the transmission facility is configured
so that the receiver shunts the test pattern back to transmitter
for comparison at the transmitter. |
| | |
| 718 | MEMORY TESTING: |
| | This subclass is indented under subclass 699. Subject matter in which the diagnostic testing is performed
upon an information signal storage device.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 710+, | for fault recovery of memory devices. |
SEE OR SEARCH CLASS:
| 324, | Electricity: Measuring and Testing,
subclasses 210+ for testing of magnetic memory elements, per
se. |
| 360, | Dynamic Magnetic Information Storage or Retrieval,
subclasses 26 , 47, and 53 for testing of dynamic
magnetic memory systems. |
| 365, | Static Information Storage and Retrieval,
subclass 200 a bad bit memory used to store information; and
subclass 201 for specifics of a memory which is tested but doesn’t include
data processing techniques. |
| 386, | Motion Video Signal Processing for Recording or
Reproducing,
subclasses 263 through 277for video error or fault detection and/or
correction during recording or reproduction operation. |
|
| | |
| 719 | Read-in with read-out and compare: |
| | This subclass is indented under subclass 718. Subject matter in which the testing is done by reading in
a test pattern, reading out the contents of the memory
and comparing the output with the test pattern read in. |
| | |
| 723 | Error mapping or logging: |
| | This subclass is indented under subclass 718. Subject matter in which the detected error or fault is registered
or recorded to present a history for diagnostic purposes.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 42, | for such subject matter used with data processor
testing. |
|
| | |
| 724 | DIGITAL LOGIC TESTING: |
| | This subclass is indented under subclass 699. Subject matter in which the diagnostic test is performed
upon a system or element performing a binary logic operation upon
a signal having plural distinct discrete states.
| | (1)
Note. Testing or measuring of electrical properties
are classified elsewhere unless the testing device includes analysis
of the information content of a digital signal. Control
signals are not data signals. |
SEE OR SEARCH CLASS:
| 324, | Electricity: Measuring and Testing, appropriate subclass, particularly
subclass 73 for measuring and testing of electrical device
parameters under controlled conditions. |
| 326, | Electronic Digital Logic Circuitry,
subclass 16 for electronic digital logic circuitry with test
facilitating feature and subclasses 21+ for electronic
digital logic circuitry maintaining signal integrity. |
|
| | |
| 725 | Programmable logic array (PLA) testing: |
| | This subclass is indented under subclass 724. Subject matter for testing an array of logical elements
selectively configurable to sequentially perform various binary
logic functions.
| | (1)
Note. Examples of such binary logic functions are
AND, OR, NAND, NOR, and NOT. |
SEE OR SEARCH CLASS:
| 324, | Electricity: Measuring and Testing, appropriate subclass, particularly
subclass 73.1 for measuring and testing of electrical device
parameters under controlled conditions. |
| 326, | Electronic Digital Logic Circuitry,
subclass 16 for electronic digital logic circuitry with test
facilitating feature, subclasses 21+ for electronic
digital logic circuitry maintaining signal integrity, and
subclasses 37+ for a programmable or multifunctional logic
array circuit, per se. |
|
| | |
| 726 | Scan path testing (e.g., level
sensitive scan design (LSSD)): |
| | This subclass is indented under subclass 724. Subject matter in which digital logic is designed for
improved testability by including shift register latches (SRL) to
enable the configuring of the circuitry into combinational logic
form.
| | (1)
Note. Test data is clocked (scanned) through
the combinational logic forms and then compared to a reference. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 738+, | for digital logic testing including test pattern
generation in general. |
SEE OR SEARCH CLASS:
| 326, | Electronic Digital Logic Circuitry,
subclass 16 for logic circuitry with test feature. |
| 377, | Electrical Pulse Counters, Pulse Dividers, or
Shift Registers: Circuits and Systems, appropriate subclasses for shift register latches, per
se. |
|
| | |
| 727 | Boundary scan: |
| | This subclass is indented under subclass 726. Subject matter where selected components in a circuit are
each provided with one or more cells, comprising a single-bit
register, coupled to a node of a component, such
as an input, output, input/output or
control node, and where said cells are serially coupled
in a single chain, usually referred to as a boundary-scan
chain. |
| | |
| 728 | Random pattern generation (includes pseudorandom
pattern) |
| | This subclass is indented under subclass 726. Subject matter where a series of digits is generated in
an unpredictable, incoherent, or arbitrary pattern.
| | (1)
Note. Included herein is generation of a series of
digits which simulates a random pattern. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 715, | for test pattern with comparison in testing a transmission
facility. |
| 720, | for use of special test patterns in memory testing. |
| 739, | for random test pattern generation in general. |
SEE OR SEARCH CLASS:
| 708, | Electrical Computers: Arithmetic Processing
and Calculating,
subclasses 250+ for random number generation. |
|
| | |
| 729 | Plural scan paths: |
| | This subclass is indented under subclass 726. Subject matter having more than one group of shift register
latches connected in series, and which groups form a plurality
of shift paths (scan paths) along which data can
be transmitted. |
| | |
| 730 | Addressing: |
| | This subclass is indented under subclass 726. Subject matter including data which specifies a location.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 743, | for addressing in digital logic testing using a
test pattern generator. |
SEE OR SEARCH CLASS:
| 365, | Static Information Storage and Retrieval,
subclasses 230.01+ for addressing memories. |
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclasses 200+ for address formation in data processing systems. |
|
| | |
| 731 | Clock or synchronization: |
| | This subclass is indented under subclass 726. Subject matter including a reference timing function or
a clock-pulse generator for causing the various parts of
the device to operate on a common time base.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 744, | for clock or synchronization in digital logic testing
using a test pattern generator. |
SEE OR SEARCH CLASS:
| 326, | Electronic Digital Logic Circuitry,
subclasses 93+ for clocking or synchronization of logic stages
or gates. |
| 327, | Miscellaneous Active Electrical Nonlinear Devices, Circuits, and
Systems,
subclasses 141+ for synchronizing electrical nonlinear devices. |
| 713, | Electrical Computers and Digital Processing Systems: Support,
subclasses 400 through 503for synchronization in computer systems. |
|
| | |
| 732 | Signature analysis: |
| | This subclass is indented under subclass 724. Subject matter controlled including monitoring of controlled
conditions of execution test points or nodes within the digital
logic device and the measured output (signature) is
compared to a known good signature. |
| | |
| 733 | Built-in test circuit (BILBO): |
| | This subclass is indented under subclass 724. Subject matter in which the digital logic testing equipment
includes a selectively configurable shift register, structurally
a part of the device being tested.
| | (1)
Note. Some selective configurations of the shift
register include a latch, linear shift register, multiple
input signature register, and a forced reset. |
| | (2)
Note. Included herein are built-in logic block
observation (BILBO) devices. |
SEE OR SEARCH CLASS:
| 324, | Electricity: Measuring and Testing, appropriate subclass, particularly
subclass 73.1 for measuring and testing of electrical device
parameters under controlled conditions. |
| 377, | Electrical Pulse Counters, Pulse Dividers, or
Shift Registers: Circuits and Systems,
subclasses 19+ for a shift register used for measuring or testing; and
subclass 28 for error checking or correction in a shift register
system. |
|
| | |
| 734 | Structural (in-circuit test): |
| | This subclass is indented under subclass 724. Subject matter in which each component of the logic circuit
is tested individually while physically connected to the circuit.
| | (1)
Note. Generally, the test instrument is connected
to nodes of the logic circuit under test in a unique way for each
component. |
SEE OR SEARCH CLASS:
| 324, | Electricity: Measuring and Testing, appropriate subclass, particularly
subclass 73.1 for measuring and testing of electrical device
parameters (other than by information signal content) under
controlled conditions. |
|
| | |
| 738 | Including test pattern generator: |
| | This subclass is indented under subclass 724. Subject matter in which the specific means or method of
generating a test pattern for a digital logic testing system is
claimed.
SEE OR SEARCH CLASS:
| 327, | Miscellaneous Active Electrical Nonlinear Devices, Circuits, and
Systems,
subclasses 100+ for miscellaneous waveform generation or conversion. |
| 345, | Computer Graphics Processing and Selective Visual
Display Systems,
subclass 26 , 345, 551 for character generator
in a visual display system with selective electrical control. |
| 708, | Electrical Computers: Arithmetic Processing
and Calculating,
subclasses 250+ for random number generators, and subclasses
270+ for digital function generators. |
|
| | |
| 739 | Random pattern generation (includes pseudorandom
pattern): |
| | This subclass is indented under subclass 738. Subject matter where a series of digits is generated in
an unpredictable, incoherent or arbitrary pattern.
| | (1)
Note. Included herein is generation of a series of
digits which simulates a random pattern. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 715, | for testing a transmission facility using a test
pattern with comparison |
| 720, | for use of special test patterns in memory testing. |
| 728, | for random test pattern generation in boundary scanning. |
SEE OR SEARCH CLASS:
| 708, | Electrical Computers: Arithmetic Processing
and Calculating,
subclasses 250+ for random number generation. |
|
| | |
| 740 | Having analog signal: |
| | This subclass is indented under subclass 738. Subject matter including an electrical signal, the
amplitude or frequency of which varies continuously in value over
time. |
| | |
| 741 | Simulation: |
| | This subclass is indented under subclass 738. Subject matter having an electrical model or a computer
program which imitates the operation of a device under test.
SEE OR SEARCH CLASS:
| 703, | Data Processing: Structural Design, Modeling, Simulation, and
Emulation,
subclasses 3 through 5for electrical analog simulator, subclasses
6-12 for simulating nonelectrical device or system, and
subclasses 13-22 for simulating electronic device and electrical
system. |
|
| | |
| 742 | Testing specific device: |
| | This subclass is indented under subclass 738. Subject matter where the test pattern is applied to a distinctive
named means to carry out a special function.
| | (1)
Note. Examples of things that are not specific devices
include "logic device," "circuit," "device
under test," etc. |
| | (2)
Note. See sections D and E of the class definition
for the distinction between this class and classes having the
specific device. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 718+, | for testing an information signal storage device. |
|
| | |
| 743 | Addressing: |
| | This subclass is indented under subclass 738. Subject matter including data which specifies a location.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 730, | for scan path testing with addressing. |
SEE OR SEARCH CLASS:
| 365, | Static Information Storage and Retrieval,
subclasses 230.01+ for addressing memories. |
| 711, | Electrical Computers and Digital Processing Systems: Memory,
subclasses 1+ and 200+ for memory address formation
in data processing systems. |
|
| | |
| 744 | Clock or synchronization: |
| | This subclass is indented under subclass 738. Subject matter including a reference timing function or
a clock pulse generator for causing the various parts of the device
to operate on a common time base.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 731, | for clocking or synchronizing in scan path testing. |
SEE OR SEARCH CLASS:
| 326, | Electronic Digital Logic Circuitry,
subclasses 93+ for clocking or synchronizing of logic stages or
gates. |
| 327, | Miscellaneous Active Electrical Nonlinear Devices, Circuits, and
Systems,
subclasses 141+ for synchronizing nonlinear devices, circuits, or
systems. |
| 713, | Electrical Computers and Digital Processing Systems: Support,
subclasses 400 through 503for synchronization in computer systems. |
|
| | |
| 745 | Determination of marginal operation limits: |
| | This subclass is indented under subclass 724. Subject matter in which the device or system is tested under
controlled and varying circuit parameters, such as input
voltage, to determine the range of circuit parameter values
within which the device or system operates without error or malfunction. |
| | |
| 746 | DIGITAL DATA ERROR CORRECTION: |
| | This subclass is indented under the class definition. Subject matter in which the error in information content
of pulse or pulse coded data is corrected.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 799, | for error detection which does not include correction
of the error signal. |
|
| | |
| 752 | Forward correction by block code: |
| | This subclass is indented under subclass 746. Subject matter in which a grouping of symbols (i.e., a
block of data or a data word) is transformed into a code
word having an increased number of symbols in order to provide an increased
minimum distance between code words relative to the minimum distance
of the corresponding data words in order to provide for forward
correction of the encoded data in the event that an error or erasure
is subsequently imposed on the encoded data.
| | (1)
Note. This subclass includes both forward error correction, per
se, (i.e., the receiver
corrects the error without requiring any further information from the
sender, which requires a minimum amount of redundancy in
the transmission since not only must an error be detected, but
its location must be determined) and forward error correction
with the assistance of symbol reliability information. |
| | (2)
Note. Forward error correction (FEC) is an
error-correcting technique that avoids the need for any
reverse channel by enabling self-correction of errors at
the receiver by adding information (at the expense of throughput) to
enable the receiver to determine what the error was and the correct
information to substitute for said error. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 786, | for convolutional codes in which each check bit
is generated as a function of a different plurality of information bits
and is interspersed among the information bits at predetermined intervals
with no natural beginning point or ending point. |
|
| | |
| 754 | Error correction during refresh cycle: |
| | This subclass is indented under subclass 752. Subject matter including a digital data storage device having
a refresh cycle in which decaying information is read before it
becomes unrecognizable, and rewritten in original form, and
decoding a stored block data code signal for error correction during
the refresh cycle. |
| | |
| 759 | Look-up table encoding or decoding: |
| | This subclass is indented under subclass 752. Subject matter having an encoder or decoder which contains
a table of all possible error patterns in a corrupted received code
word and compares the computed syndrome to these patterns to determine
the position of erroneous bits. |
| | |
| 760 | Threshold decoding (e.g., majority
logic): |
| | This subclass is indented under subclass 752. Subject matter the decoder operates upon a corrupted received
code word to compute the parity check sums which are applied to
a threshold or majority gate and an error indicated if the sums
exceed a certain value. |
| | |
| 761 | Random and burst error correction: |
| | This subclass is indented under subclass 752. Subject matter in which the block code is capable of correcting
both random and burst errors.
| | (1)
Note. Random errors are of the type where each data
bit is affected independently by noise. Burst errors are
of the type where disturbances introduce errors of unspecified time
duration and thus cause a cluster of multiple consecutive data
bits in error. |
| | (2)
Note. Interlacing or interleaving techniques may
be used to give a random error correcting code the capability of correcting
both random and burst errors. A product code or concatenated
code may be formed from two codes to provide both random and burst
error correction capability. | |
| | |
| 762 | Burst error correction: |
| | This subclass is indented under subclass 752. Subject matter in which the block code is derived to be
most effective in correcting burst errors.
| | (1)
Note. An example of a block code with good burst-correcting
capability is the Reed-Solomon code. Interleaving
techniques are also utilized to improve the burst-correcting
capability of a code. | |
| | |
| 763 | Memory access: |
| | This subclass is indented under subclass 752. Subject matter in which digital data being written into
or read out of a storage device is encoded in a block code format.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 710+, | for memory fault recovery systems. |
| 718+, | for diagnostic testing of a memory. |
SEE OR SEARCH CLASS:
| 360, | Dynamic Magnetic Information Storage or Retrieval,
subclasses 26 , 36.1+, 47, and
53 for error detection combined with a magnetic, dynamic memory
system. |
| 365, | Static Information Storage and Retrieval,
subclasses 200 and 201 for bad bit and testing read/write
circuits, respectively. |
| 369, | Dynamic Information Storage or Retrieval, appropriate subclasses for a dynamic, nonmagnetic
memory device. |
|
| | |
| 764 | Error correct and restore: |
| | This subclass is indented under subclass 763. Subject matter which corrects the errors upon readout of
the data and the corrected data in written into memory as a substitute
for the erroneous data. |
| | |
| 765 | Error pointer: |
| | This subclass is indented under subclass 763. Subject matter which generates a signal (pointer) upon
the occurrence of a particular type of error or failure.
| | (1)
Note. In many error correcting systems accessing
data from a memory or storage device, the error pointer
identifies the track or channel with which the error or failure
is associated. | |
| | |
| 769 | Dynamic data storage: |
| | This subclass is indented under subclass 763. Subject matter where there is relative motion between a
transducer and an information storage medium.
SEE OR SEARCH CLASS:
| 360, | Dynamic Magnetic Information Storage or Retrieval, for dynamic magnetic data storage and retrieval. |
| 369, | Dynamic Information Storage or Retrieval, for dynamic data storage and retrieval. |
|
| | |
| 770 | Disk array: |
| | This subclass is indented under subclass 769. Subject matter where the storage medium is a plurality of
interconnected disks. |
| | |
| 771 | Tape: |
| | This subclass is indented under subclass 769. Subject matter where the storage medium is essentially of
a two dimensional shape with one dimension being very long in relation
to the other. |
| | |
| 773 | Solid state memory: |
| | This subclass is indented under subclass 763. Subject matter where the storage device is or contains a
solid state device (e.g., an
integrated circuit or transistor).
SEE OR SEARCH THIS CLASS, SUBCLASS:
SEE OR SEARCH CLASS:
| 65, | Glass Manufacturing,
subclasses 174+ for solid state memories. |
|
| | |
| 775 | Synchronization: |
| | This subclass is indented under subclass 752. Subject matter in which a lack of synchronization between
encoder and decoder is detected and/or corrected. |
| | |
| 776 | For packet or frame multiplexed data: |
| | This subclass is indented under subclass 752. Subject matter where plural encoded data streams are simultaneously
transmitted over a common transmission medium in such a manner that
the information signals may be discretely recovered, wherein
each data stream contains one or more bytes preceded by an address
header or where the simultaneously transmitted plurality of data
streams include synchronization or other control information.
SEE OR SEARCH CLASS:
| 370, | Multiplex Communications,
subclasses 351+ for multiplex switching such as packet or frame
switching. |
|
| | |
| 777 | Hamming code: |
| | This subclass is indented under subclass 752. Subject matter where there are m information code elements
and k error check code elements such that there are sufficient check
elements to correct a single error and the k check elements are
determined by even parity checks in conjunction with element values
appearing in certain selected information positions where each of
the elements of the code group must be in a parity check subgroup
with one or more of the check elements and no two different code
elements having exactly the same set of check elements associated
with it.
| | (1)
Note. See U.S. Patent RE23601, columns
5-9, for a more rigorous definition. | |
| | |
| 778 | Nonbinary data (e.g., ternary): |
| | This subclass is indented under subclass 752. Subject matter where each bit of a data word can assume
more than two values.
SEE OR SEARCH CLASS:
| 326, | Electronic Digital Logic Circuitry,
subclasses 59+ for nonbinary logic circuits. |
|
| | |
| 781 | Code based on generator polynomial: |
| | This subclass is indented under subclass 752. Subject matter where a code word c(x), where x
is a unit delay operator, is generated by dividing a delayed
version of the data polynomial d(x), i.e.,. xnd(x), by
a generator polynomial, g(x), and
subtracting the remainder from the delayed version of the data polynomial, thereby
producing a code word that is a multiple of the generator polynomial, and
where the data polynomial d(x) is such that positions within
the block correspond to powers of x and data values at the positions
correspond to polynomial coefficient values. |
| | |
| 782 | Bose-Chaudhuri-Hocquenghem code: |
| | This subclass is indented under subclass 781. Subject matter where the block code is a t error correcting
code which is the set of all polynomials [a(c)] over
the Galois field GF( 2m) of degree n-1
or less, such that a(ai)=0, for i=1,3,5,..., 2t-1
where a is a primitive element of the finite field GF( 2m), and
where c is the radix 2 for binary data, a(c)=a0+a1c+a2c2+...+an-1cn - 1, and
aj=0,1 (j=0,1,2,..., n-1 ). |
| | |
| 783 | Golay code: |
| | This subclass is indented under subclass 781. Subject matter where the block code is an (n, k, t) type
polynomial code in which each code word is n=23 bits long, contains
k=13 data or information bits, corrects up to
t=3 errors, and the code word also contains (n-k)=10
redundant check bits. |
| | |
| 784 | Reed-Solomon code: |
| | This subclass is indented under subclass 781. Subject matter where the block code consists of K data and
N-K check symbols, where N is an arbitrary number
and K is less than N, and where each symbol is made of
J binary bits encoded with a generator polynomial g(x) for the
code and a field generating polynomial M(x) which
defines the Galois field.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 756, | for cross-interleave Reed-Solomon codes. |
| 762, | for burst error correction using Reed-Solomon
codes. |
|
| | |
| 785 | Syndrome computed: |
| | This subclass is indented under subclass 781. Subject matter where decoded data is divided by an inverse
of the generator polynomial to obtain a data word of 1 bit which
indicate which bits of the decoded data are in error. |
| | |
| 786 | Forward error correction by tree code (e.g., convolutional): |
| | This subclass is indented under subclass 746. Subject matter in which information bits are encoded to
generate a plurality of check bits, each check bit is generated
as a function of a different plurality of information bits and is interspersed
among the information bits at predetermined intervals with no natural
beginning point or ending point (i.e., there
is no length restriction for the encoded data).
| | (1)
Note. Convolutional coding means adding to the information
a repeating sequence that is known to the receiver. By
subtracting this repeating sequence and performing other tests, the
receiver can determine what should have been received with a high
degree of accuracy. |
| | (2)
Note. This subclass includes forward error correction, per
se, (i.e., the receiver corrects
the error without requiring any further information from the sender, which
requires a minimum amount of redundancy in the transmission since
not only must an error be detected, but its location must
be determined) and forward error correction with the assistance of
symbol reliability information. |
| | (3)
Note. This subclass does not include demodulation
decisions based upon oversampling or on intersymbol interference
alone. |
| | (4)
Note. This subclass does not include channel equalization
or predistortion control based on correction results (e.g., decision
feedback equalization). |
| | (5)
Note. This subclass does not include detection or
correction of errors produced by trial values, perturbations, predictions, quantizations, estimations
or approximations, which errors are used as feedback for
control of signal generation or coding (e.g., PID
controlling, source calibration, successive approximation
A/D conversion, DSV constrained encoding, predictive
encoding). |
| | (6)
Note. Forward error correction (FEC) is an
error-correcting technique that avoids the need for any
reverse channel by enabling self-correction of errors at
the receiver by adding information (at the expense of throughput) to
enable the receiver to determine what the error was and the correct
information to substitute for said error. |
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 746, | and 797, for various types of data correction
such as trial values, perturbations, predictions, quantizations, estimations
or approximations, which errors are used as feedback for
control of signal generation or coding. |
| 752+, | for block codes wherein the information bits and
associated bits form independent and distinct blocks of data bits. |
| 799+, | for various error/fault detection techniques
such as those based on oversampling or intersymbol interference. |
SEE OR SEARCH CLASS:
| 341, | Coded Data Generation or Conversion,
subclasses 50+ for digital data conversion and subclasses 126+ for analog
to or from digital conversion. |
| 375, | Pulse or Digital Communications,
subclasses 229+ for pulse or digital equalizers. |
|
| | |
| 787 | Random and burst errors: |
| | This subclass is indented under subclass 786. Subject matter in which the convolutional code is capable
of correcting both random and burst errors.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 761, | for block code correction of both random and burst
errors. |
|
| | |
| 788 | Burst error: |
| | This subclass is indented under subclass 786. Subject matter in which the convolutional code corrects
for burst error.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 762, | for block code correcting of burst errors. |
|
| | |
| 789 | Synchronization: |
| | This subclass is indented under subclass 786. Subject matter in which a lack of synchronization between
the encoder and decoder is detected and/or corrected. |
| | |
| 790 | Puncturing: |
| | This subclass is indented under subclass 786. Subject matter where single bits are periodically deleted
at intervals from a low-rate convolutional code. |
| | |
| 791 | Sequential decoder (e.g., Fano
or stack algorithm): |
| | This subclass is indented under subclass 786. Subject matter where a tree structure of the convolutional
code is used for searching locally a path which is considered to
be the most likely to produce a correct data sequence.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 794, | for maximum likelihood decoding in general. |
| 796, | for branch metric calculation in general. |
|
| | |
| 792 | Trellis code: |
| | This subclass is indented under subclass 786. Subject matter where, for a convolutional code of
k bits length, an inverse coding operation is performed
in which 2k-1 decision bits are used to select an output
bit and where after many branches, the most probable path
will be selected with a high degree of certainty, and where
the branches form a mesh pattern (i.e., branches
start at a plurality of points and intersect other branches).
SEE OR SEARCH CLASS:
| 375, | Pulse or Digital Communications,
subclass 265 for trellis coders and decoders in pulse or digital
communication. |
| 704, | Data Processing: Speech Signal Processing, Linguistics, Language
Translation, and Audio Compression/Decompression,
subclass 242 for Viterbi trellis speech recognition. |
|
| | |
| 793 | Syndrome decodable (e.g., self
orthogonal): |
| | This subclass is indented under subclass 786. Subject matter where decoded data is divided by an inverse
of the generator polynomial to obtain a data word of 1 bit which
indicate which bits of the decoded data are in error.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 785, | for syndrome decodable block codes. |
|
| | |
| 794 | Maximum likelihood: |
| | This subclass is indented under subclass 786. Subject matter where a decoder selects the sequence out
of all the possible transmitted sequences which is most likely to
match the received data sequence and determines corresponding digital (data) information.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 791, | for a sequential decoder. |
| 795, | for Viterbi decoding. |
SEE OR SEARCH CLASS:
| 375, | Pulse or Digital Communications,
subclasses 262 and 341 for maximum likelihood decoding (other
than for error correction) in pulse or digital communication. |
|
| | |
| 795 | Viterbi decoding: |
| | This subclass is indented under subclass 786. Subject matter where data is not decoded as soon as it is
received, instead, a sequence of data, having
a predetermined decoding depth, following the digit to
be decoded is first collected, then, by computing
what are known as path metrics, a limited number of possible
messages are selected, each extending throughout the decoding
depth far beyond the digit presently to be decoded, with
one such survivor sequence ending in each of the data states.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 794, | for maximum likelihood decoding. |
| 796, | for branch metric calculation decoding. |
SEE OR SEARCH CLASS:
| 375, | Pulse or Digital Communications,
subclasses 262 and 341 for Viterbi decoding (other than
for error correction) in pulse or digital communication. |
| 704, | Data Processing: Speech Signal Processing, Linguistics, Language
Translation, and Audio Compression/Decompression,
subclass 242 for Viterbi trellis speech recognition. |
|
| | |
| 796 | Branch metric calculation: |
| | This subclass is indented under subclass 786. Subject matter where a tree of possible data sequences is
constructed identifying the possible data sequences in terms of
data states, and from which correlations are computed for selecting
the paths which are to survive to the next stage of decoding received
data.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 791, | for sequential decoding. |
| 795, | for Viterbi decoding. |
|
| | |
| 797 | Majority decision/voter circuit: |
| | This subclass is indented under subclass 746. Subject matter in which error correction is effectively
achieved by error masking (making error invisible at output) through
majority logic or voting techniques.
SEE OR SEARCH CLASS:
| 326, | Electronic Digital Logic Circuitry,
subclasses 35+ for threshold (e.g., majority) logic. |
|
| | |
| 798 | ERROR DETECTION FOR SYNCHRONIZATION CONTROL: |
| | This subclass is indented under the class definition. Subject matter in which error detecting techniques are utilized
to detect an out-of-synch condition or to control
synchronization between devices.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 775, | for block code synchronization error correction. |
| 789, | for convolutional code synchronization error correction. |
SEE OR SEARCH CLASS:
| 370, | Multiplex Communications,
subclasses 503+ for synchronization of time multiplex information
which may include error detecting techniques. |
| 375, | Pulse or Digital Communications,
subclass 357 for synchronization failure prevention in pulse
or digital communication. |
|
| | |
| 799 | ERROR/FAULT DETECTION TECHNIQUE: |
| | This subclass is indented under the class definition. Subject matter in which a specific technique is recited
for detecting an error or fault condition.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 100+, | for reliability and availability, fault recovery, locating, and
avoidance in digital data processing systems. |
| 746+, | for digital data error correction which include
error/fault detection techniques. |
|
| | |
| 800 | Parity bit: |
| | This subclass is indented under subclass 799. Subject matter in which a redundant bit is added to a block
of data bits.
| | (1)
Note. This redundant bit or parity bit is of a logic
state to make the total number of bits having a predetermined
logic state within the block odd or even. | |
| | |
| 802 | Even and odd parity: |
| | This subclass is indented under subclass 800. Subject matter wherein the parity scheme in the system includes
the generation of parity bits on both an even and odd basis. |
| | |
| 803 | Parity prediction: |
| | This subclass is indented under subclass 800. Subject matter which calculates an expected parity value
prior to execution of an operation and is subsequently compared
to the actual parity value to detect an error. |
| | |
| 804 | Plural dimension parity check: |
| | This subclass is indented under subclass 800. Subject matter in which a single parity bit is derived from
data bits taken over each of two or more dimensions, such
as horizontal and vertical parity. |
| | |
| 806 | Constant-ratio code (m/n): |
| | This subclass is indented under subclass 799. Subject matter in which a code constraint of a constant-ratio
between bits of a first logic state and a second logic state is
utilized to enable error/fault detection. |
| | |
| 807 | Check character: |
| | This subclass is indented under subclass 799. Subject matter in which a check character, derived
as a predetermined function of a group of data bits, is
associated with the group of data bits for error detection purposes. |
| | |
| 808 | Modulo-n residue check character: |
| | This subclass is indented under subclass 807. Subject matter in which a check character, calculated
as the remainder after the value of the digital data is divided
by a modulus-n, is associated with the digital
data to enable error/fault detection.
SEE OR SEARCH CLASS:
| 708, | Electrical Computers: Arithmetic Processing
and Calculating,
subclass 532 for residue code checking in arithmetic operations. |
|
| | |
| 809 | Code constraint monitored: |
| | This subclass is indented under subclass 799. Subject matter in which the digital data encoding scheme
provides inherent constrained conditions which are monitored to
enable error/fault detection. |
| | |
| 810 | Multilevel coding (n>2): |
| | This subclass is indented under subclass 809. Subject matter in which the digital data is encoded in a
multilevel or multistate format where the number of levels or states
is greater than 2.
SEE OR SEARCH CLASS:
| 375, | Pulse or Digital Communications,
subclass 292 for disparity reduction in multilevel digital communications. |
|
| | |
| 813 | Two key-down detector: |
| | This subclass is indented under subclass 811. Subject matter in which the improper condition is the simultaneous
activation of two or more keys on a data input device. |
| | |
| 814 | Data timing/clocking: |
| | This subclass is indented under subclass 811. Subject matter in which the timing or clocking of digital
data is monitored to detect a predetermined forbidden combination
or condition. |
| | |
| 816 | Two-rail logic: |
| | This subclass is indented under subclass 811. Subject matter in which both the true and complement state
of each logic function is provided and the simultaneous occurrence
of both states indicates a forbidden combination. |
| | |
| 817 | Noise level: |
| | This subclass is indented under subclass 811. Subject matter in which the forbidden condition is the presence
of noise exceeding a predetermined level. |
| | |
| 818 | Missing-bit/drop-out detection: |
| | This subclass is indented under subclass 811. Subject matter in which the improper combination is a missing
bit or dropout of a bit within a data character.
SEE OR SEARCH CLASS:
| 327, | Miscellaneous Active Electrical Nonlinear Devices, Circuits, and
Systems,
subclasses 18+ for missing pulse detecting means. |
| 386, | Motion Video Signal Processing for Recording or
Reproducing,
subclasses 270 through 271for video drop-out detection and/or
correction during recording or reproduction operation. |
|
| | |
| 819 | Comparison of data: |
| | This subclass is indented under subclass 799. Subject matter in which an error or fault is detected by
the comparison of data.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 735, | for diagnostic apparatus testing which include error
detection by comparison of data. |
SEE OR SEARCH CLASS:
| 340, | Communications: Electrical,
subclass 146.2 for digital comparator devices, per se. |
|
| | |
| 821 | Transmission facility: |
| | This subclass is indented under subclass 820. Subject matter which detects an error or fault in a device
including a channel of a transmission medium with a device for supplying
a digital signal thereto. |
| | |
| 822 | Sequential repetition: |
| | This subclass is indented under subclass 819. Subject matter in which an error or fault is detected by
comparison of repetitive data.
| | (1)
Note. Included herein is majority logic or voter
circuitry in which the most frequently occurring data is presumed
to be correct. | |
| | |
| 823 | True and complement data: |
| | This subclass is indented under subclass 822. Subject matter in which the data being transferred and compared
comprises both the true and complement bit states of the data. |
| | |
| 824 | Device output compared to input: |
| | This subclass is indented under subclass 819. Subject matter in which the error/fault detection
is enabled by comparing the device output with the device input.
SEE OR SEARCH THIS CLASS, SUBCLASS:
| 735, | for diagnostic apparatus testing which includes
comparison of the device output with the device input. |
|
| | |
E-SUBCLASSES
The E-subclasses in U. S. Class
714 provide f or processes and apparatus for detecting errors in
data-processing including processes and apparatus for monitoring
and evaluating data-processing equipment; processes
and apparatus for correcting data-processing errors or
for responding to faults in data-processing equipment; and
processes and apparatus for avoiding data-processing errors
and faults in data-processing equipment.
| E11.001 | ERROR DETECTION; ERROR CORRECTION; MONITORING
(EPO): |
| | This main group provides for processes and apparatus for
the detection or correction of data-processing errors including
the monitoring and evaluation of data-processing equipment. This
subclass is substantially the same in scope as ECLA classification G06F11/00. |
| | |
FOREIGN ART COLLECTIONS
| FOR 100 | Scan path testing (LSSD): |
| | Foreign art collections including subject matter
in which digital logic is designed for improved test ability by
including shift register latches (SRL) to enable
the configuring of the circuitry in combinational logic form. |
| | |
| FOR 101 | Including test pattern generator: |
| | Foreign art collections including subject matter
in which the specific means or method of generating a test pattern
for an error checking system is claimed. |
| | |
| FOR 102 | Block code: |
| | Foreign art collections including subject matter
in which a plurality of information bits are encoded to generate
a plurality of check bits as a function of the information bits
with the information bits and check bits being associated together
to form a block code. |
| | |
| FOR 103 | Memory access: |
| | Foreign art collections including subject matter
in which digital data being written into or read out of a storage
device is encoded in a block code format. |
| | |
| FOR 104 | Convolutional code: |
| | Foreign art collections including subject matter
in which the information bits are encoded to generate a plurality
of check bits, each check bit is generated as a function
of a different plurality of information bits and is interspersed
among the information bits at predetermined intervals with no natural beginning
point or ending point as in block codes. |
| | |
| FOR 288 | ERROR/FAULT ANTICIPATION: |
| | Foreign art collection for subject matter in which
a signal or circuit parameter is monitored to provide an indication
of an imminent error or fault condition prior to its actual occurrence. |
| | |
| FOR 289 | Transmission facility or channel: |
| | Foreign art collection for subject matter in which
the spare apparatus includes a channel of a transmission medium
with a device for supplying digital data thereto. |
| | |
| FOR 290 | Memory: |
| | Foreign art collection for subject matter wherein
the spare apparatus comprises an information signal storage unit. |
| | |
| FOR 291 | Transmission facility: |
| | Foreign art collection for subject matter in which
the faulty apparatus is a signal transmission facility. |
| | |
| FOR 292 | Data processor or computer: |
| | Foreign art collection for subject matter in which
the faulty apparatus includes a device for performing a calculation
or arithmetic operation on the data signal. |
| | |
| FOR 293 | Programmable processor testing: |
| | Foreign art collection for subject matter in which
the diagnostic testing is performed upon a program controlled device
for performing a calculation or arithmetic operation on the data
signal. |
| | |
| FOR 294 | Emulator device: |
| | Foreign art collection for subject matter which
tests a system by substituting a microprocessor, to simulate
the operation of the system microprocessor to control diagnostic testing
of the system. |
| | |
| FOR 295 | Watchdog timer (e.g., time-out): |
| | Foreign art collection for subject matter which
tests the processor by requiring periodic updating of a time monitoring
device within a preset time interval known as a window. |
| | |
| FOR 296 | Processor within diverse device (microwave, photocopier): |
| | Foreign art collection for subject matter in which
the processor or computer being tested is located within a diverse
device (e.g., a microwave oven
or photocopier) machine. |
| | |
| FOR 297 | Error or fault, logging or tracking: |
| | Foreign art collection for subject matter in which
the errors or faults detected are registered or recorded to present
a history for diagnostic purposes. |
| | |
| FOR 298 | Dedicated maintenance subsystem: |
| | Foreign art collection for subject matter in which
the testing is performed under control of a maintenance module or
subsystem which independently monitors and performs fault diagnosis
of a programmable digital computer. |
| | |
| FOR 299 | Testing of external device by programmable digital computer: |
| | Foreign art collection for subject matter in which
a programmable digital computer controls the testing of a device
external to the computer. |
| | |
| FOR 300 | ERROR DETECTION FOR SYNCHRONIZATION CONTROL: |
| | Foreign art collection for subject matter in which
error detecting techniques are utilized to detect an out-of-sync
condition or to control synchronization between devices. |
| | |
| FOR 306 | Of network (714/4): |
| | This foreign art collection is indented under unnumbered
placeholder 714/3. Foreign art collection further
including means or steps for recovery at a network level (e.g., recovery
from nodal failures). |
| | |
| FOR 307 | Of memory or peripheral subsystem (714/5): |
| | This foreign art collection is indented unnumbered
placeholder 714/3. Foreign art collection further
including means or steps for recovery from a fault of a memory function
level or the peripheral function level, or for recovery
limited to a specialized processor accessing either memory, peripheral, or other
I/O device.
| | (1)
Note. "Page faults" are a species
of faults peculiar to memory accessing and are classified elsewhere. | |
| | |
| FOR 308 | Redundant stored data accessed (e.g., duplicated
data, error correction coded data, or other parity-type
data) (714/6): |
| | This foreign art collection is indented under FOR
307. Foreign art collection further including means or
steps for recovery by accessing redundant stored data.
| | (1)
Note. This and indented subclasses rely on information
which is a function of the actual data of concern as exemplified
in one simple form by parity data. The species of fault
recovery or avoidance concerned with storing archival verbatim copies
of data is classified elsewhere. |
| | (2)
Note. Parity and error-correction coded storage
of general utility in a system without data processing features
claimed are classified elsewhere in this class. | |
| | |
| FOR 309 | Reconfiguration (e.g., adding
a replacement storage component) (714/7): |
| | This foreign art collection is indented under FOR
308. Foreign art collection further including means or
steps for statically replacing a failed memory component.
| | (1)
Note. Classification here requires more than selecting
a correct output from a concurrently active redundant functional
unit in place of the output of the failed component. | |
| | |
| FOR 310 | Isolating failed storage location (e.g., sector
remapping) (714/8): |
| | This foreign art collection is indented under FOR
307. Foreign art collection further including means or
steps for recovery by disabling access to a failed memory location.
| | (1)
Note. Classification here requires more than selecting
a correct output from a concurrently active redundant functional
unit in place of the output of the failed component. | |
| | |
| FOR 311 | Access processor affected (e.g., I/O
processor, MMU, DMA processor) (714/9): |
| | This foreign art collection is indented under FOR
307. Foreign art collection further including means or
steps for recovery from fault of an access processor (e.g., memory management
unit (MMU), direct memory access (DMA) processor, I/O
processor, etc.). |
| | |
| FOR 312 | Of computer software (714/38): |
| | This foreign art collection is indented unnumbered
placeholder 714/37. Subject matter further including
means or steps for locating a fault in software or testing software.
| | (1)
Note. This subclass also provides for detecting an
error in instruction data in combination with a digital data processing
system. Generic coded information error detection is classified
elsewhere. |
| | (2)
Note. This subclass also provides for fault locating
in software analysis by mechanisms such as debugging, automatic
code generating, object oriented design, etc. | |
| | |
| FOR 313 | Performance monitoring for fault avoidance (714/47): |
| | This foreign art collection is indented unnumbered
placeholder 714/1. Foreign art collection further
including means or steps for monitoring event duration and event counts
for anticipating or recognizing faults.
| | (1)
Note. This subclass relates to the fault avoidance
species of reliability. |
| | (2)
Note. This subclass includes event duration and counting
arrangements for statistical analysis of system operations and predictive
methods of fault avoidance. | |
| | |
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CLASS 714,